DE602006005628D1 - Verfahren und Vorrichtung zur Erkennung von sich wiederholenden Mustern - Google Patents

Verfahren und Vorrichtung zur Erkennung von sich wiederholenden Mustern

Info

Publication number
DE602006005628D1
DE602006005628D1 DE602006005628T DE602006005628T DE602006005628D1 DE 602006005628 D1 DE602006005628 D1 DE 602006005628D1 DE 602006005628 T DE602006005628 T DE 602006005628T DE 602006005628 T DE602006005628 T DE 602006005628T DE 602006005628 D1 DE602006005628 D1 DE 602006005628D1
Authority
DE
Germany
Prior art keywords
image signal
image
search
repetitive patterns
examined
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006005628T
Other languages
English (en)
Inventor
Juha Reunanen
Antti Saarela
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ABB Oy
Original Assignee
ABB Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ABB Oy filed Critical ABB Oy
Publication of DE602006005628D1 publication Critical patent/DE602006005628D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8922—Periodic flaws
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Inspection Of Paper Currency And Valuable Securities (AREA)
  • Holo Graphy (AREA)
DE602006005628T 2006-06-13 2006-06-13 Verfahren und Vorrichtung zur Erkennung von sich wiederholenden Mustern Active DE602006005628D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP06012084A EP1867979B1 (de) 2006-06-13 2006-06-13 Verfahren und Vorrichtung zur Erkennung von sich wiederholenden Mustern

Publications (1)

Publication Number Publication Date
DE602006005628D1 true DE602006005628D1 (de) 2009-04-23

Family

ID=37459412

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006005628T Active DE602006005628D1 (de) 2006-06-13 2006-06-13 Verfahren und Vorrichtung zur Erkennung von sich wiederholenden Mustern

Country Status (5)

Country Link
US (1) US8023720B2 (de)
EP (1) EP1867979B1 (de)
CN (1) CN101173905B (de)
AT (1) ATE425452T1 (de)
DE (1) DE602006005628D1 (de)

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EP1867979B1 (de) * 2006-06-13 2009-03-11 ABB Oy Verfahren und Vorrichtung zur Erkennung von sich wiederholenden Mustern
WO2011112427A1 (en) * 2010-03-10 2011-09-15 3M Innovative Properties Company Application-specific repeat defect detection in web manufacturing processes
JP6413243B2 (ja) * 2014-01-22 2018-10-31 大日本印刷株式会社 品質管理システム、品質管理方法、及び、プログラム
US9951472B2 (en) 2014-04-15 2018-04-24 Gpcp Ip Holdings Llc Methods and apparatuses for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web
KR101733017B1 (ko) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 광학 필름의 불량 검출 장치 및 방법
US10043259B2 (en) 2016-07-25 2018-08-07 PT Papertech Inc. Facilitating anomaly detection for a product having a pattern
JP6568664B2 (ja) * 2017-06-29 2019-08-28 住友化学株式会社 特異部検知システム及び特異部検知方法
DE102017128258A1 (de) * 2017-09-14 2019-03-14 Schattdecor Ag Verfahren zum Herstellen und Schützen gegen unzulässige Vervielfältigung von Dekorpapier oder -folien
FR3074295B1 (fr) * 2017-11-30 2019-11-15 Saint-Gobain Glass France Procede de detection de defauts de laminage dans un verre imprime
JP7531823B2 (ja) 2020-02-17 2024-08-13 株式会社マイクロ・テクニカ 検査装置および検査方法
JP7496702B2 (ja) * 2020-03-27 2024-06-07 日鉄ステンレス株式会社 疵検査装置及び疵検査方法
EP4101647A1 (de) * 2021-06-11 2022-12-14 BST GmbH Verfahren zum digitaldruck auf einer laufenden bedruckstoffbahn
WO2024161619A1 (ja) * 2023-02-03 2024-08-08 Ｐｒｉｍｅｔａｌｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｊａｐａｎ株式会社 疵検出装置、圧延装置、疵検出方法及び圧延方法
CN118521584A (zh) * 2024-07-23 2024-08-20 惠州艺都宇正数码科技有限公司 一种光学薄膜的微观质量高精度检测方法

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JPS6083328A (ja) * 1983-10-13 1985-05-11 Fujitsu Ltd フオトマスクの検査方法
US5068799A (en) * 1985-04-24 1991-11-26 Jarrett Jr Harold M System and method for detecting flaws in continuous web materials
US4675730A (en) * 1985-09-06 1987-06-23 Aluminum Company Of America Video surface inspection system
US5046109A (en) * 1986-03-12 1991-09-03 Nikon Corporation Pattern inspection apparatus
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US4958307A (en) * 1987-11-20 1990-09-18 Kabushiki Kaisha Toshiba Roll mark inspection apparatus
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US5774177A (en) * 1996-09-11 1998-06-30 Milliken Research Corporation Textile fabric inspection system
WO1998015919A1 (fr) * 1996-10-09 1998-04-16 Dai Nippon Printing Co., Ltd. Procede et appareil de detection de defauts de raies sur des documents imprimes
US5859698A (en) * 1997-05-07 1999-01-12 Nikon Corporation Method and apparatus for macro defect detection using scattered light
US6236429B1 (en) * 1998-01-23 2001-05-22 Webview, Inc. Visualization system and method for a web inspection assembly
US5985497A (en) * 1998-02-03 1999-11-16 Advanced Micro Devices, Inc. Method for reducing defects in a semiconductor lithographic process
US6266437B1 (en) * 1998-09-04 2001-07-24 Sandia Corporation Sequential detection of web defects
US6539106B1 (en) * 1999-01-08 2003-03-25 Applied Materials, Inc. Feature-based defect detection
US6407373B1 (en) * 1999-06-15 2002-06-18 Applied Materials, Inc. Apparatus and method for reviewing defects on an object
JP3907874B2 (ja) * 1999-08-02 2007-04-18 松下電器産業株式会社 欠陥検査方法
US20020105618A1 (en) * 1999-12-30 2002-08-08 Edgar Albert D. Sprocket-hole banding filter and method of removing the sprocket-hole banding
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US6750466B2 (en) * 2001-02-09 2004-06-15 Wintriss Engineering Corporation Web inspection system
US6950547B2 (en) * 2001-02-12 2005-09-27 3M Innovative Properties Company Web inspection method and device
US6542240B2 (en) * 2001-03-30 2003-04-01 Alcan International Limited Method of identifying defective roll on a strip processing line
JP4711570B2 (ja) * 2001-09-14 2011-06-29 株式会社東京精密 パターン検査方法及び検査装置
US7065239B2 (en) * 2001-10-24 2006-06-20 Applied Materials, Inc. Automated repetitive array microstructure defect inspection
US7155052B2 (en) * 2002-06-10 2006-12-26 Tokyo Seimitsu (Israel) Ltd Method for pattern inspection
JP4169573B2 (ja) * 2002-10-23 2008-10-22 株式会社東京精密 パターン検査方法及び検査装置
CN1499439A (zh) * 2002-11-08 2004-05-26 力捷电脑股份有限公司 影像处理的方法
JP3993817B2 (ja) * 2002-12-11 2007-10-17 株式会社日立製作所 欠陥組成分析方法及び装置
JP4056412B2 (ja) * 2003-03-10 2008-03-05 株式会社東京精密 パターン検査方法及び装置
US7297969B1 (en) * 2003-06-09 2007-11-20 Cognex Technology And Investment Corporation Web marking and inspection system
JPWO2005001456A1 (ja) * 2003-06-30 2006-08-10 株式会社東京精密 パターン比較検査方法およびパターン比較検査装置
US7027934B2 (en) * 2003-09-24 2006-04-11 3M Innovative Properties Company Apparatus and method for automated web inspection
EP1867979B1 (de) * 2006-06-13 2009-03-11 ABB Oy Verfahren und Vorrichtung zur Erkennung von sich wiederholenden Mustern
US7797133B2 (en) * 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line

Also Published As

Publication number Publication date
CN101173905B (zh) 2011-10-05
US8023720B2 (en) 2011-09-20
ATE425452T1 (de) 2009-03-15
CN101173905A (zh) 2008-05-07
EP1867979B1 (de) 2009-03-11
US20070286472A1 (en) 2007-12-13
EP1867979A1 (de) 2007-12-19

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