DE602004029378D1 - Vorrichtung und verfahren zur automatischen inspektion von materialbahnen - Google Patents

Vorrichtung und verfahren zur automatischen inspektion von materialbahnen

Info

Publication number
DE602004029378D1
DE602004029378D1 DE602004029378T DE602004029378T DE602004029378D1 DE 602004029378 D1 DE602004029378 D1 DE 602004029378D1 DE 602004029378 T DE602004029378 T DE 602004029378T DE 602004029378 T DE602004029378 T DE 602004029378T DE 602004029378 D1 DE602004029378 D1 DE 602004029378D1
Authority
DE
Germany
Prior art keywords
digital information
materials
automatic inspection
anomalies
image information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602004029378T
Other languages
English (en)
Inventor
Carl J Skeps
James A Masterman
Steven P Floeder
Brandon T Berg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Innovative Properties Co
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of DE602004029378D1 publication Critical patent/DE602004029378D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/14—Picture signal circuitry for video frequency region
    • H04N5/21—Circuitry for suppressing or minimising disturbance, e.g. moiré or halo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE602004029378T 2003-09-24 2004-08-27 Vorrichtung und verfahren zur automatischen inspektion von materialbahnen Active DE602004029378D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/669,197 US7027934B2 (en) 2003-09-24 2003-09-24 Apparatus and method for automated web inspection
PCT/US2004/027821 WO2005036146A1 (en) 2003-09-24 2004-08-27 Apparatus and method for automated web inspection

Publications (1)

Publication Number Publication Date
DE602004029378D1 true DE602004029378D1 (de) 2010-11-11

Family

ID=34393428

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004029378T Active DE602004029378D1 (de) 2003-09-24 2004-08-27 Vorrichtung und verfahren zur automatischen inspektion von materialbahnen

Country Status (9)

Country Link
US (1) US7027934B2 (de)
EP (1) EP1664749B1 (de)
JP (1) JP5043430B2 (de)
KR (1) KR20060060742A (de)
AT (1) ATE483157T1 (de)
BR (1) BRPI0414557B1 (de)
DE (1) DE602004029378D1 (de)
MX (1) MXPA06003027A (de)
WO (1) WO2005036146A1 (de)

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US20060090319A1 (en) * 2004-11-01 2006-05-04 Howe Major K Defect locating system for moving web
US7545971B2 (en) * 2005-08-22 2009-06-09 Honeywell International Inc. Method and apparatus for measuring the crepe of a moving sheet
KR100991796B1 (ko) 2006-01-13 2010-11-03 엘지전자 주식회사 피드백 정보 기반 안테나 선택을 사용하여 전송 다이버시티및 공간 다중화를 성취하기 위한 방법 및 장치
ATE425452T1 (de) * 2006-06-13 2009-03-15 Abb Oy Verfahren und vorrichtung zur erkennung von sich wiederholenden mustern
DE102006033663B4 (de) * 2006-07-20 2012-01-26 Airbus Operations Gmbh Verfahren zur Ermittlung eines charakteristischen Parameters einer Probe aus CFK
WO2008100683A1 (en) * 2007-02-16 2008-08-21 3M Innovative Properties Company Method and apparatus for illuminating material for automated inspection
KR100916615B1 (ko) * 2007-06-20 2009-09-14 건국대학교 산학협력단 롤투롤 공정에서의 웹 주름 측정 시스템
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
CN101815665B (zh) * 2007-09-27 2012-10-10 Abb有限公司 对通过加工工艺的幅材特征的准确跟踪
US7937233B2 (en) * 2008-04-17 2011-05-03 3M Innovative Properties Company Preferential defect marking on a web
US7797133B2 (en) * 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
US8270701B2 (en) 2010-01-08 2012-09-18 3M Innovative Properties Company Optical web-based defect detection using intrasensor uniformity correction
WO2011112427A1 (en) * 2010-03-10 2011-09-15 3M Innovative Properties Company Application-specific repeat defect detection in web manufacturing processes
FR2958431B1 (fr) * 2010-03-30 2012-08-17 Solystic Dispositif de traitement d'objets avec un systeme pour surveiller en temps reel la qualite des images des objets
US9031312B2 (en) * 2010-11-12 2015-05-12 3M Innovative Properties Company Rapid processing and detection of non-uniformities in web-based materials
JP2014511530A (ja) * 2011-02-24 2014-05-15 スリーエム イノベイティブ プロパティズ カンパニー ウェブベース材料内の不均一性の検出システム
JP5637014B2 (ja) * 2011-03-03 2014-12-10 セントラル硝子株式会社 ガラス繊維物品の表面欠陥検出装置
WO2013032919A1 (en) * 2011-08-26 2013-03-07 Engagement Media Technologies, Inc. Systems and methods for automatic content communication
US20130091197A1 (en) 2011-10-11 2013-04-11 Microsoft Corporation Mobile device as a local server
US8958898B2 (en) * 2011-11-07 2015-02-17 Nalco Company Method and apparatus to monitor and control sheet characteristics on a creping process
JP2013123812A (ja) * 2011-12-13 2013-06-24 Canon Inc 検査装置、検査方法、コンピュータプログラム
US20130159969A1 (en) * 2011-12-16 2013-06-20 Microsoft Corporation Digital signal processing with language integrated monads
US9721377B2 (en) 2012-01-06 2017-08-01 Kemira Oyj Method of characterizing creped materials
US8983168B2 (en) * 2012-04-30 2015-03-17 Ncr Corporation System and method of categorising defects in a media item
FI128403B (en) * 2013-07-05 2020-04-30 Procemex Oy Ltd Synchronizing image capture
US9047723B2 (en) * 2013-10-31 2015-06-02 Ncr Corporation Defect categorization
US10119225B2 (en) 2014-04-15 2018-11-06 Gpcp Ip Holdings Llc Systems for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web
CN105136733A (zh) * 2015-08-27 2015-12-09 李学新 胶囊近红外瑕疵分析系统
DE102016213111B4 (de) * 2016-07-19 2018-08-09 Koenig & Bauer Ag Inspektionssystem mit mehreren Erfassungsbereichen
US10043259B2 (en) 2016-07-25 2018-08-07 PT Papertech Inc. Facilitating anomaly detection for a product having a pattern
US10501274B2 (en) * 2017-07-06 2019-12-10 Honeywell International Inc. Continuous web sheet defect analytics, classification and remediation for enhancing equipment efficiency and throughput
US11906445B2 (en) * 2018-10-10 2024-02-20 Goodrich Corporation Automated defect detection for wire rope using image processing techniques
EP3867180A1 (de) 2018-10-15 2021-08-25 3M Innovative Properties Company Verfahren und system zur automatischen steuerung eines schneidwerkzeugs
WO2020079567A1 (en) 2018-10-15 2020-04-23 3M Innovative Properties Company Automated inspection for sheet parts of arbitrary shape from manufactured film
CN109613008B (zh) * 2018-12-26 2021-10-22 武汉科技大学 一种利用机器视觉实现白酒微孔膜滤片质量检测的仪器
WO2023102657A1 (en) * 2021-12-09 2023-06-15 PT Papertech Inc. Web position tracking

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US4173441A (en) * 1977-03-28 1979-11-06 E. I. Du Pont De Nemours And Company Web inspection system and method therefor
JPS59138904A (ja) * 1983-01-28 1984-08-09 Nippon Steel Corp 走行中板状体の表面欠陥検査方法
JPS6293637A (ja) 1985-10-21 1987-04-30 Hitachi Ltd 自動検反システム
IL99823A0 (en) 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
US5544256A (en) 1993-10-22 1996-08-06 International Business Machines Corporation Automated defect classification system
WO1998008080A1 (de) 1996-08-20 1998-02-26 Zellweger Luwa Ag Verfahren und vorrichtung zur erkennung von fehlern in textilen flächengebilden
US6092059A (en) 1996-12-27 2000-07-18 Cognex Corporation Automatic classifier for real time inspection and classification
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KR100303608B1 (ko) 1997-05-22 2001-11-22 박호군 혈구세포자동인식방법및장치
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JP2000009447A (ja) 1998-06-25 2000-01-14 Nippon Inter Connection Systems Kk テープキャリアの欠陥検出装置および欠陥検出方法
US6266437B1 (en) * 1998-09-04 2001-07-24 Sandia Corporation Sequential detection of web defects
US6266436B1 (en) 1999-04-09 2001-07-24 Kimberly-Clark Worldwide, Inc. Process control using multiple detections
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US6407373B1 (en) 1999-06-15 2002-06-18 Applied Materials, Inc. Apparatus and method for reviewing defects on an object
US6484306B1 (en) 1999-12-17 2002-11-19 The Regents Of The University Of California Multi-level scanning method for defect inspection
JP2004509325A (ja) 2000-09-10 2004-03-25 オルボテック　リミテッド Ｐｃｂ検査における誤った警報の低減
US6750466B2 (en) 2001-02-09 2004-06-15 Wintriss Engineering Corporation Web inspection system
US6950547B2 (en) * 2001-02-12 2005-09-27 3M Innovative Properties Company Web inspection method and device

Also Published As

Publication number Publication date
JP2007506973A (ja) 2007-03-22
US20050075801A1 (en) 2005-04-07
KR20060060742A (ko) 2006-06-05
US7027934B2 (en) 2006-04-11
EP1664749B1 (de) 2010-09-29
MXPA06003027A (es) 2006-06-23
WO2005036146A1 (en) 2005-04-21
BRPI0414557B1 (pt) 2017-04-18
BRPI0414557A (pt) 2006-11-07
JP5043430B2 (ja) 2012-10-10
ATE483157T1 (de) 2010-10-15
EP1664749A1 (de) 2006-06-07

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