DE3687760D1 - Vorrichtung und verfahren zur koordinatenmessung. - Google Patents

Vorrichtung und verfahren zur koordinatenmessung.

Info

Publication number
DE3687760D1
DE3687760D1 DE8686103221T DE3687760T DE3687760D1 DE 3687760 D1 DE3687760 D1 DE 3687760D1 DE 8686103221 T DE8686103221 T DE 8686103221T DE 3687760 T DE3687760 T DE 3687760T DE 3687760 D1 DE3687760 D1 DE 3687760D1
Authority
DE
Germany
Prior art keywords
measuring coordinates
coordinates
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686103221T
Other languages
English (en)
Other versions
DE3687760T2 (de
Inventor
Shunji Murai
Fumio Ohtomo
Hitoshi Ohtani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=26390351&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE3687760(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from JP60049908A external-priority patent/JPH0658209B2/ja
Priority claimed from JP60049907A external-priority patent/JPS61209314A/ja
Application filed by Topcon Corp filed Critical Topcon Corp
Application granted granted Critical
Publication of DE3687760D1 publication Critical patent/DE3687760D1/de
Publication of DE3687760T2 publication Critical patent/DE3687760T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04—Interpretation of pictures
    • G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
DE8686103221T 1985-03-13 1986-03-11 Vorrichtung und verfahren zur koordinatenmessung. Expired - Fee Related DE3687760T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP60049908A JPH0658209B2 (ja) 1985-03-13 1985-03-13 座標測定方法及び装置
JP60049907A JPS61209314A (ja) 1985-03-13 1985-03-13 座標デ−タ検出装置

Publications (2)

Publication Number Publication Date
DE3687760D1 true DE3687760D1 (de) 1993-03-25
DE3687760T2 DE3687760T2 (de) 1993-06-09

Family

ID=26390351

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686103221T Expired - Fee Related DE3687760T2 (de) 1985-03-13 1986-03-11 Vorrichtung und verfahren zur koordinatenmessung.

Country Status (3)

Country Link
US (1) US4858157A (de)
EP (1) EP0197341B1 (de)
DE (1) DE3687760T2 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63300367A (ja) * 1987-05-30 1988-12-07 Toshiba Corp 画像処理装置
JPH0749937B2 (ja) * 1988-03-22 1995-05-31 工業技術院長 形状測定方法
US5142642A (en) * 1988-08-24 1992-08-25 Kabushiki Kaisha Toshiba Stereoscopic television system
US5104216A (en) * 1988-12-05 1992-04-14 Igm Industriegerate- Und Maschinenfabriksgesellschaft Mbh Process for determining the position and the geometry of workpiece surfaces
US5005147A (en) * 1988-12-30 1991-04-02 The United States Of America As Represented By The Administrator, The National Aeronautics And Space Administration Method and apparatus for sensor fusion
SE468462B (sv) * 1989-05-31 1993-01-25 Berit Lindqvist Metod foer stereofotografisk dokumentation och fotogrammetrisk maetning inom tandvaarden samt anordning foer genomfoerande av metoden
US5231678A (en) * 1989-11-15 1993-07-27 Ezel, Inc. Configuration recognition system calculating a three-dimensional distance to an object by detecting cross points projected on the object
US5129054A (en) * 1990-03-12 1992-07-07 International Business Machines Corporation Specifying 3d reference points in 2d graphic displays
US5251156A (en) * 1990-08-25 1993-10-05 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method and apparatus for non-contact measurement of object surfaces
DE4026942A1 (de) * 1990-08-25 1992-02-27 Zeiss Carl Fa Verfahren zur beruehrungslosen vermessung von objektoberflaechen
US5063441A (en) * 1990-10-11 1991-11-05 Stereographics Corporation Stereoscopic video cameras with image sensors having variable effective position
US5287293A (en) * 1990-12-31 1994-02-15 Industrial Technology Research Institute Method and apparatus for inspecting the contours of a gear
US5210799A (en) * 1991-03-28 1993-05-11 Texas Instruments Incorporated System and method for ranking and extracting salient contours for target recognition
JP3110095B2 (ja) * 1991-09-20 2000-11-20 富士通株式会社 測距方法及び測距装置
US5414474A (en) * 1992-03-04 1995-05-09 Fujitsu Limited Moving body recognition apparatus
JP3486461B2 (ja) * 1994-06-24 2004-01-13 キヤノン株式会社 画像処理装置及び方法
US5852672A (en) * 1995-07-10 1998-12-22 The Regents Of The University Of California Image system for three dimensional, 360 DEGREE, time sequence surface mapping of moving objects
US6081273A (en) * 1996-01-31 2000-06-27 Michigan State University Method and system for building three-dimensional object models
US6445814B2 (en) 1996-07-01 2002-09-03 Canon Kabushiki Kaisha Three-dimensional information processing apparatus and method
JP3008875B2 (ja) * 1997-02-25 2000-02-14 日本電気株式会社 被写体抽出装置
DE69829091T2 (de) * 1997-05-22 2006-02-09 Kabushiki Kaisha Topcon Messungsgerät
US6532300B1 (en) * 1997-09-25 2003-03-11 Jeol Ltd. Method of automatically analyzing patterns
US6094269A (en) * 1997-12-31 2000-07-25 Metroptic Technologies, Ltd. Apparatus and method for optically measuring an object surface contour
JP2000164658A (ja) * 1998-11-26 2000-06-16 Tokyo Seimitsu Co Ltd 半導体ウェハのレビューステーション及び外観検査装置
JP4025442B2 (ja) * 1998-12-01 2007-12-19 富士通株式会社 三次元モデル変換装置及び方法
US6556704B1 (en) * 1999-08-25 2003-04-29 Eastman Kodak Company Method for forming a depth image from digital image data
DE10020842A1 (de) * 2000-04-28 2001-10-31 Zeiss Carl Koordinatenmeßgerät oder Werkzeugmaschine
GB2374266A (en) * 2001-04-04 2002-10-09 Matsushita Comm Ind Uk Ltd Virtual user interface device
JP4115801B2 (ja) * 2002-10-10 2008-07-09 オリンパス株式会社 ３次元撮影装置
EP1650704A4 (de) * 2003-07-24 2010-07-14 Olympus Corp Bildverarbeitungseinrichtung
US20050283062A1 (en) * 2004-06-22 2005-12-22 Cerner Innovation, Inc. Computerized method and system for associating a portion of a diagnostic image with an electronic record
JP4488804B2 (ja) * 2004-06-23 2010-06-23 株式会社トプコン ステレオ画像の関連付け方法及び３次元データ作成装置
JP4630149B2 (ja) * 2005-07-26 2011-02-09 シャープ株式会社 画像処理装置
JP5690539B2 (ja) 2010-09-28 2015-03-25 株式会社トプコン 自動離着陸システム
JP5618840B2 (ja) 2011-01-04 2014-11-05 株式会社トプコン 飛行体の飛行制御システム
JP5775354B2 (ja) 2011-04-28 2015-09-09 株式会社トプコン 離着陸ターゲット装置及び自動離着陸システム
JP5787695B2 (ja) 2011-09-28 2015-09-30 株式会社トプコン 画像取得装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3678582A (en) * 1971-03-17 1972-07-25 Bendix Corp Photogrammetric apparatus
US3726591A (en) * 1971-12-08 1973-04-10 Bendix Corp Stereoplotting apparatus for correlating image points disposed along epipolar lines
JPS5418892B2 (de) * 1973-06-30 1979-07-11
US4200861A (en) * 1978-09-01 1980-04-29 View Engineering, Inc. Pattern recognition apparatus and method
US4343553A (en) * 1979-09-03 1982-08-10 Hitachi, Ltd. Shape testing apparatus
US4313678A (en) * 1979-09-24 1982-02-02 The United States Of America As Represented By The Secretary Of The Interior Automated satellite mapping system (MAPSAT)
DE3009534A1 (de) * 1980-03-12 1981-09-17 Siemens AG, 1000 Berlin und 8000 München Anordnung zur optoelektronischen entfernungsmessung
JPS59137942A (ja) * 1983-01-28 1984-08-08 Hitachi Ltd 画像位置合わせ方式
JPS59182688A (ja) * 1983-03-31 1984-10-17 Toshiba Corp ステレオ視処理装置
US4654872A (en) * 1983-07-25 1987-03-31 Omron Tateisi Electronics Co. System for recognizing three-dimensional objects
JPS60132722A (ja) * 1983-12-22 1985-07-15 Fanuc Ltd 射出成形機における射出機構
US4630203A (en) * 1983-12-27 1986-12-16 Thomas Szirtes Contour radiography: a system for determining 3-dimensional contours of an object from its 2-dimensional images
JPS60217470A (ja) * 1984-04-13 1985-10-31 Hitachi Ltd 撮影対象画像からの立体形状推定方式
US4583117A (en) * 1984-07-17 1986-04-15 Stereographics Corporation Stereoscopic video camera
US4724526A (en) * 1984-09-11 1988-02-09 Bausch & Lomb Incorporated Apparatus and method for determining object elevation and height from images thereof
GB2179155B (en) * 1985-08-13 1989-08-16 English Electric Valve Co Ltd Spatial characteristic determination
JPS6282314A (ja) * 1985-10-08 1987-04-15 Hitachi Ltd 光度差ステレオ計測方式

Also Published As

Publication number Publication date
US4858157A (en) 1989-08-15
DE3687760T2 (de) 1993-06-09
EP0197341B1 (de) 1993-02-17
EP0197341A2 (de) 1986-10-15
EP0197341A3 (en) 1989-09-13

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8365 Fully valid after opposition proceedings
8339 Ceased/non-payment of the annual fee