DE3801220C2 - - Google Patents

Info

Publication number
DE3801220C2
DE3801220C2 DE19883801220 DE3801220A DE3801220C2 DE 3801220 C2 DE3801220 C2 DE 3801220C2 DE 19883801220 DE19883801220 DE 19883801220 DE 3801220 A DE3801220 A DE 3801220A DE 3801220 C2 DE3801220 C2 DE 3801220C2
Authority
DE
Germany
Prior art keywords
counter
stages
group
input
subsequent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19883801220
Other languages
German (de)
English (en)
Other versions
DE3801220A1 (de
Inventor
Bernd Dipl.-Ing. 8044 Unterschleissheim De Kossack
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE19883801220 priority Critical patent/DE3801220A1/de
Publication of DE3801220A1 publication Critical patent/DE3801220A1/de
Application granted granted Critical
Publication of DE3801220C2 publication Critical patent/DE3801220C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522—Test of Sequential circuits
    • G01R31/318527—Test of counters

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE19883801220 1988-01-18 1988-01-18 Vielstufiger binaerzaehler mit einer ausstattung zur durchfuehrung von testlaeufen Granted DE3801220A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19883801220 DE3801220A1 (de) 1988-01-18 1988-01-18 Vielstufiger binaerzaehler mit einer ausstattung zur durchfuehrung von testlaeufen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19883801220 DE3801220A1 (de) 1988-01-18 1988-01-18 Vielstufiger binaerzaehler mit einer ausstattung zur durchfuehrung von testlaeufen

Publications (2)

Publication Number Publication Date
DE3801220A1 DE3801220A1 (de) 1989-07-27
DE3801220C2 true DE3801220C2 (fi) 1991-10-17

Family

ID=6345447

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19883801220 Granted DE3801220A1 (de) 1988-01-18 1988-01-18 Vielstufiger binaerzaehler mit einer ausstattung zur durchfuehrung von testlaeufen

Country Status (1)

Country Link
DE (1) DE3801220A1 (fi)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4214841A1 (de) * 1992-05-05 1993-11-11 Telefunken Microelectron Integrierter Schaltkreis mit einem Zeitglied

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4979193A (en) * 1989-04-26 1990-12-18 Advanced Micro Devices, Inc. Method and apparatus for testing a binary counter
US5381453A (en) * 1994-02-09 1995-01-10 Zilog, Inc. Efficient functional test scheme incorporated in a programmable duration binary counter
DE19522839C2 (de) * 1995-06-23 2003-12-18 Atmel Germany Gmbh Verfahren zum Testen von Impulszählern

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2330014A1 (fr) * 1973-05-11 1977-05-27 Ibm France Procede de test de bloc de circuits logiques integres et blocs en faisant application
JPS62252214A (ja) * 1986-04-25 1987-11-04 Hitachi Ltd 診断回路付非同期式カウンタ回路

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4214841A1 (de) * 1992-05-05 1993-11-11 Telefunken Microelectron Integrierter Schaltkreis mit einem Zeitglied

Also Published As

Publication number Publication date
DE3801220A1 (de) 1989-07-27

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee