DE3772490D1 - Halbleiteranordnung sowie verfahren zum herstellen und testen derselben. - Google Patents

Halbleiteranordnung sowie verfahren zum herstellen und testen derselben.

Info

Publication number
DE3772490D1
DE3772490D1 DE8787306951T DE3772490T DE3772490D1 DE 3772490 D1 DE3772490 D1 DE 3772490D1 DE 8787306951 T DE8787306951 T DE 8787306951T DE 3772490 T DE3772490 T DE 3772490T DE 3772490 D1 DE3772490 D1 DE 3772490D1
Authority
DE
Germany
Prior art keywords
testing
producing
same
semiconductor arrangement
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787306951T
Other languages
English (en)
Inventor
Takayuki Katoh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of DE3772490D1 publication Critical patent/DE3772490D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/64—Impedance arrangements
    • H01L23/66—High-frequency adaptations
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
DE8787306951T 1986-08-06 1987-08-05 Halbleiteranordnung sowie verfahren zum herstellen und testen derselben. Expired - Lifetime DE3772490D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61185715A JPS6341041A (ja) 1986-08-06 1986-08-06 半導体装置

Publications (1)

Publication Number Publication Date
DE3772490D1 true DE3772490D1 (de) 1991-10-02

Family

ID=16175583

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787306951T Expired - Lifetime DE3772490D1 (de) 1986-08-06 1987-08-05 Halbleiteranordnung sowie verfahren zum herstellen und testen derselben.

Country Status (4)

Country Link
US (3) US4926234A (de)
EP (1) EP0257870B1 (de)
JP (1) JPS6341041A (de)
DE (1) DE3772490D1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6341041A (ja) * 1986-08-06 1988-02-22 Mitsubishi Electric Corp 半導体装置
US5008727A (en) * 1988-01-22 1991-04-16 Matsushita Electric Industrial Co., Ltd. Standard cell having test pad for probing and semiconductor integrated circuit device containing the standard cells
US5252507A (en) * 1990-03-30 1993-10-12 Tactical Fabs, Inc. Very high density wafer scale device architecture
US5315130A (en) * 1990-03-30 1994-05-24 Tactical Fabs, Inc. Very high density wafer scale device architecture
JPH0434950A (ja) * 1990-05-30 1992-02-05 Nec Corp 半導体集積回路装置
JPH04256909A (ja) * 1991-02-12 1992-09-11 Matsushita Electric Ind Co Ltd ビデオカメラ用ズームレンズのフォーカス機構
JP3124085B2 (ja) * 1991-12-02 2001-01-15 沖電気工業株式会社 半導体装置
US5268636A (en) * 1992-03-10 1993-12-07 The United States Of America As Represented By The Secretary Of Commerce MMIC package and interconnect test fixture
US5286656A (en) * 1992-11-02 1994-02-15 National Semiconductor Corporation Individualized prepackage AC performance testing of IC dies on a wafer using DC parametric test patterns
US5457399A (en) * 1992-12-14 1995-10-10 Hughes Aircraft Company Microwave monolithic integrated circuit fabrication, test method and test probes
JPH07221223A (ja) * 1994-02-03 1995-08-18 Mitsubishi Electric Corp 半導体装置，及び混成集積回路装置
US5650666A (en) * 1995-11-22 1997-07-22 Cypress Semiconductor Corp. Method and apparatus for preventing cracks in semiconductor die
FR2790096B1 (fr) * 1999-02-18 2001-04-13 St Microelectronics Sa Structure etalon elementaire a faibles pertes pour l'etalonnage d'une sonde de circuit integre
JP4536942B2 (ja) 2001-02-09 2010-09-01 三菱電機株式会社 高周波用集積回路及びこれを用いた高周波回路装置
JP4804643B2 (ja) * 2001-05-08 2011-11-02 三菱電機株式会社 高周波回路装置とその製造方法
JP2005331298A (ja) * 2004-05-18 2005-12-02 Mitsubishi Electric Corp 高周波回路の特性測定方法及び校正用パターンならびに校正用治具
JP4612431B2 (ja) * 2005-02-24 2011-01-12 三菱電機株式会社 高周波半導体装置
KR100819561B1 (ko) * 2007-01-12 2008-04-08 삼성전자주식회사 반도체 장치 및 이 장치의 신호 종단 방법
JP6544160B2 (ja) * 2015-09-09 2019-07-17 三菱電機株式会社 半導体装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3679941A (en) * 1969-09-22 1972-07-25 Gen Electric Composite integrated circuits including semiconductor chips mounted on a common substrate with connections made through a dielectric encapsulator
US3691628A (en) * 1969-10-31 1972-09-19 Gen Electric Method of fabricating composite integrated circuits
JPS5268376A (en) * 1975-12-05 1977-06-07 Nec Corp Semiconductor device
JPS5698875A (en) * 1980-01-07 1981-08-08 Nippon Telegr & Teleph Corp <Ntt> Field effect transistor device
US4566184A (en) * 1981-08-24 1986-01-28 Rockwell International Corporation Process for making a probe for high speed integrated circuits
JPS58157151A (ja) * 1982-03-15 1983-09-19 Mitsubishi Electric Corp 半導体集積回路装置
DE3382183D1 (de) * 1982-12-23 1991-04-04 Sumitomo Electric Industries Monolithische integrierte mikrowellenschaltung und verfahren zum auswaehlen derselben.
FR2565030B1 (fr) * 1984-05-25 1986-08-22 Thomson Csf Structure de metallisations de reprise de contacts d'un dispositif semi-conducteur et dispositif dote d'une telle structure
JP2568495B2 (ja) * 1985-10-21 1997-01-08 三菱電機株式会社 半導体装置
JPS6341041A (ja) * 1986-08-06 1988-02-22 Mitsubishi Electric Corp 半導体装置

Also Published As

Publication number Publication date
US5051810A (en) 1991-09-24
EP0257870B1 (de) 1991-08-28
US4926234A (en) 1990-05-15
EP0257870A3 (en) 1988-11-30
US5010019A (en) 1991-04-23
JPH0528903B2 (de) 1993-04-27
EP0257870A2 (de) 1988-03-02
JPS6341041A (ja) 1988-02-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8328 Change in the person/name/address of the agent

Representative=s name: PRUFER & PARTNER GBR, 81545 MUENCHEN