DE3752014D1 - Verfahren und Anordnung zur laufenden Kennzeichnung einer Blatt Bildung. - Google Patents

Verfahren und Anordnung zur laufenden Kennzeichnung einer Blatt Bildung.

Info

Publication number
DE3752014D1
DE3752014D1 DE3752014T DE3752014T DE3752014D1 DE 3752014 D1 DE3752014 D1 DE 3752014D1 DE 3752014 T DE3752014 T DE 3752014T DE 3752014 T DE3752014 T DE 3752014T DE 3752014 D1 DE3752014 D1 DE 3752014D1
Authority
DE
Germany
Prior art keywords
arrangement
sheet formation
continuously marking
marking
continuously
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3752014T
Other languages
English (en)
Other versions
DE3752014T2 (de
Inventor
Lee Macarthur Chase
Jorma Juhani Orkosalo
Michael Kent Norton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell Measurex Corp
Original Assignee
Measurex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Measurex Corp filed Critical Measurex Corp
Application granted granted Critical
Publication of DE3752014D1 publication Critical patent/DE3752014D1/de
Publication of DE3752014T2 publication Critical patent/DE3752014T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G17/00—Apparatus for or methods of weighing material of special form or property
    • G01G17/02—Apparatus for or methods of weighing material of special form or property for weighing material of filamentary or sheet form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G9/00—Methods of, or apparatus for, the determination of weight, not provided for in groups G01G1/00 - G01G7/00
    • G01G9/005—Methods of, or apparatus for, the determination of weight, not provided for in groups G01G1/00 - G01G7/00 using radiations, e.g. radioactive

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Paper (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
DE3752014T 1986-11-12 1987-10-29 Verfahren und Anordnung zur laufenden Kennzeichnung einer Blatt Bildung. Expired - Fee Related DE3752014T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/930,142 US5092678A (en) 1986-11-12 1986-11-12 On-line sheet formation characterizing method and device

Publications (2)

Publication Number Publication Date
DE3752014D1 true DE3752014D1 (de) 1997-03-13
DE3752014T2 DE3752014T2 (de) 1997-06-19

Family

ID=25458973

Family Applications (2)

Application Number Title Priority Date Filing Date
DE3752014T Expired - Fee Related DE3752014T2 (de) 1986-11-12 1987-10-29 Verfahren und Anordnung zur laufenden Kennzeichnung einer Blatt Bildung.
DE8787309549T Expired - Fee Related DE3781372T2 (de) 1986-11-12 1987-10-29 Geraet zur prozessgekoppelten charakterisierung einer (papier-)bahnbildung.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE8787309549T Expired - Fee Related DE3781372T2 (de) 1986-11-12 1987-10-29 Geraet zur prozessgekoppelten charakterisierung einer (papier-)bahnbildung.

Country Status (7)

Country Link
US (1) US5092678A (de)
EP (2) EP0267712B1 (de)
JP (1) JP2533580B2 (de)
KR (1) KR880006538A (de)
CA (1) CA1330370C (de)
DE (2) DE3752014T2 (de)
FI (1) FI94289C (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5331408A (en) * 1990-05-28 1994-07-19 Pulp And Paper Research Institute Of Canada On-line micro formation sensor
US5479720A (en) * 1994-01-21 1996-01-02 Abb Industrial Systems, Inc. Methods and apparatus for measuring web thickness and other characteristics of a moving web
US5573011A (en) * 1994-04-08 1996-11-12 Felsing; Gary W. System for quantifying neurological function
US5654799A (en) * 1995-05-05 1997-08-05 Measurex Corporation Method and apparatus for measuring and controlling the surface characteristics of sheet materials such as paper
SE507524C2 (sv) * 1996-10-15 1998-06-15 Stora Kopparbergs Bergslags Ab Sätt och mätmaskin för analysering av pappersbana
US6088094A (en) * 1997-12-23 2000-07-11 Zellweger Uster, Inc. On-line sliver monitor
US7101461B2 (en) 2001-01-29 2006-09-05 Kimberly-Clark Worldwide, Inc. Method and apparatus for imaging a paper web
US7071480B2 (en) * 2003-06-13 2006-07-04 Voith Paper Patent Gmbh Sensor with alignment self compensation
JP2009058293A (ja) * 2007-08-30 2009-03-19 Hamamatsu Metrix Kk シート状ワーク検査装置
US7837833B2 (en) * 2007-10-23 2010-11-23 Honeywell Asca Inc. Method for characterizing fibrous materials using stokes parameters
US8660682B2 (en) 2010-11-22 2014-02-25 Honeywell Asca Inc. Air wipe and sheet guide temperature control on paper and continuous web scanners

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE868977C (de) * 1951-11-17 1953-03-02 Walter Dr-Ing Brecht Verfahren zur objektiven Messung der Wolkigkeit von flaechenhaften Stoffen, wie Papieren, Folien, Filmen u. dgl.
US3135819A (en) * 1961-02-02 1964-06-02 Sanborn Company Shutter calibrating system
US3114791A (en) * 1961-08-07 1963-12-17 Kimberly Clark Co Papermaking machine
US3228282A (en) * 1962-02-23 1966-01-11 Brun Corp Apparatus for measuring and recording basis weight of paper and the like
US3458261A (en) * 1964-09-25 1969-07-29 Kollmorgen Corp Pulsed light photometric apparatus for measuring light characteristics of moving materials
NL6600413A (de) * 1965-01-18 1966-08-25
US3405268A (en) * 1965-03-12 1968-10-08 Brun Sensor Systems Inc Radiant energy absorption gage for measuring the weight of a base material and the content of a material sorbed by the base material
FI40836B (de) * 1967-10-31 1969-02-28 Valmet Oy
US3824021A (en) * 1973-06-14 1974-07-16 N Axelrod Redundant imperfection detection system for materials
US4288160A (en) * 1973-12-28 1981-09-08 Nekoosa Papers Inc. Optical property measurement system and method
US3900265A (en) * 1974-03-08 1975-08-19 Intec Corp Laser scanner flaw detection system
DD133467A1 (de) * 1977-10-12 1979-01-03 Dietz,Hartmut,Dd Verfahren zum bestimmen der transparenzschwankungen optisch transparenter materialien
US4455090A (en) * 1979-07-26 1984-06-19 The Wiggins Teape Group Limited Apparatus for measuring surface reflectance characteristics
JPS57131007A (en) * 1981-02-06 1982-08-13 Shimadzu Corp Film thickness gauge
JPS58162844A (ja) * 1982-03-23 1983-09-27 Toshiba Corp パタ−ン検査装置
US4453404A (en) * 1982-11-22 1984-06-12 The Mead Corporation Method and apparatus for determining statistical characteristics of sheet material
US4602160A (en) * 1983-09-28 1986-07-22 Sentrol Systems Ltd. Infrared constituent analyzer and control system
US4776538A (en) * 1984-06-11 1988-10-11 Cornell Research Foundation, Inc. Parachute with leading-edge slats
US4648712A (en) * 1985-02-04 1987-03-10 Champion International Corporation Apparatus and method for analyzing parameters of a fibrous substrate
CA1222319A (en) * 1985-05-16 1987-05-26 Cip Inc. Apparatus for analysing the formation of a paper web

Also Published As

Publication number Publication date
FI94289C (fi) 1996-05-28
JP2533580B2 (ja) 1996-09-11
KR880006538A (ko) 1988-07-23
DE3752014T2 (de) 1997-06-19
EP0267712B1 (de) 1992-08-26
EP0468538A1 (de) 1992-01-29
US5092678A (en) 1992-03-03
EP0267712A3 (en) 1990-01-03
DE3781372D1 (de) 1992-10-01
EP0267712A2 (de) 1988-05-18
CA1330370C (en) 1994-06-21
FI874986A (fi) 1988-05-13
EP0468538B1 (de) 1997-01-29
DE3781372T2 (de) 1993-03-25
FI874986A0 (fi) 1987-11-11
FI94289B (fi) 1995-04-28
JPS63228048A (ja) 1988-09-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee