DE3444768A1 - Verfahren zum korrigieren kolorimetrischer messergebnisse - Google Patents

Verfahren zum korrigieren kolorimetrischer messergebnisse

Info

Publication number
DE3444768A1
DE3444768A1 DE19843444768 DE3444768A DE3444768A1 DE 3444768 A1 DE3444768 A1 DE 3444768A1 DE 19843444768 DE19843444768 DE 19843444768 DE 3444768 A DE3444768 A DE 3444768A DE 3444768 A1 DE3444768 A1 DE 3444768A1
Authority
DE
Germany
Prior art keywords
measurement
blank
sample solution
correction values
correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19843444768
Other languages
German (de)
English (en)
Other versions
DE3444768C2 (enrdf_load_stackoverflow
Inventor
Taiichi Hachioji Tokio/Tokyo Banno
Toshihide Fujiwara
Yawara Nagai
Takashi Kokubunji Tokio/Tokyo Tabara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Publication of DE3444768A1 publication Critical patent/DE3444768A1/de
Application granted granted Critical
Publication of DE3444768C2 publication Critical patent/DE3444768C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/022—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation having an ideal characteristic, map or correction data stored in a digital memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12746—Calibration values determination
    • G01N2201/12753—Calibration values determination and storage

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Mathematical Physics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Technology Law (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
DE19843444768 1983-12-13 1984-12-07 Verfahren zum korrigieren kolorimetrischer messergebnisse Granted DE3444768A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23354583A JPS60125542A (ja) 1983-12-13 1983-12-13 測定デ−タ補正方法

Publications (2)

Publication Number Publication Date
DE3444768A1 true DE3444768A1 (de) 1985-06-20
DE3444768C2 DE3444768C2 (enrdf_load_stackoverflow) 1991-09-12

Family

ID=16956733

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19843444768 Granted DE3444768A1 (de) 1983-12-13 1984-12-07 Verfahren zum korrigieren kolorimetrischer messergebnisse

Country Status (2)

Country Link
JP (1) JPS60125542A (enrdf_load_stackoverflow)
DE (1) DE3444768A1 (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3628178A1 (de) * 1986-08-20 1988-02-25 Kernforschungsz Karlsruhe Verfahren zur linearisierung der kennlinie einer messgroesse und anordnung zur durchfuehrung des verfahrens
DE3633916A1 (de) * 1986-10-04 1988-04-14 Kernforschungsz Karlsruhe Verfahren zur selektiven messung der konzentrationen von ir- bis uv-strahlung absorbierenden gasfoermigen und/oder fluessigen substanzen in gasen und/oder fluessigkeiten und vorrichtung zur durchfuehrung des verfahrens
DE3830181A1 (de) * 1988-09-06 1990-03-15 Leybold Ag Gleitlageranordnung fuer eine rasch rotierende welle
DE3839561A1 (de) * 1988-11-24 1990-05-31 Lange Gmbh Dr Bruno Vorrichtung zum feststellen von stoerfaellen in fluessigen medien
DE4121089A1 (de) * 1991-06-26 1993-01-07 Boehringer Mannheim Gmbh Analysesystem zur automatischen analyse von koerperfluessigkeiten
DE4309529A1 (de) * 1992-03-24 1993-09-30 Hitachi Ltd Analytisches Verfahren und Vorrichtung

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0723871B2 (ja) * 1986-01-31 1995-03-15 株式会社島津製作所 多項目生化学分析方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2153754A1 (de) * 1970-10-30 1972-05-10 Technicon Instr Gerät zum Kalibrieren einer mehrkanaligen Probenanalysiereinrichtung
US3703726A (en) * 1970-12-31 1972-11-21 Corning Glass Works Quantitative chemical analysis by x-ray emission spectroscopy
DE2800225A1 (de) * 1977-01-20 1978-07-27 Kyoto Daiichi Kagaku Kk Verfahren zum analysieren von fluessigkeitsproben und anlage zum kontinuierlichen, automatischen analysieren derselben
DE3031430A1 (de) * 1979-08-22 1981-03-12 Hitachi Ltd Automatische chemische analysierverfahren und -vorrichtung
DE3029795A1 (de) * 1979-08-07 1981-03-26 Olympus Optical Co., Ltd., Tokio/Tokyo Automatisches analysiergeraet fuer fluessigproben
DE3211571A1 (de) * 1981-06-30 1983-01-13 Shimadzu Corp., Kyoto Spektrophotometereinrichtung und verfahren zur korrektur von damit erhaltenen messwerten

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2153754A1 (de) * 1970-10-30 1972-05-10 Technicon Instr Gerät zum Kalibrieren einer mehrkanaligen Probenanalysiereinrichtung
US3703726A (en) * 1970-12-31 1972-11-21 Corning Glass Works Quantitative chemical analysis by x-ray emission spectroscopy
DE2800225A1 (de) * 1977-01-20 1978-07-27 Kyoto Daiichi Kagaku Kk Verfahren zum analysieren von fluessigkeitsproben und anlage zum kontinuierlichen, automatischen analysieren derselben
DE3029795A1 (de) * 1979-08-07 1981-03-26 Olympus Optical Co., Ltd., Tokio/Tokyo Automatisches analysiergeraet fuer fluessigproben
DE3031430A1 (de) * 1979-08-22 1981-03-12 Hitachi Ltd Automatische chemische analysierverfahren und -vorrichtung
DE3211571A1 (de) * 1981-06-30 1983-01-13 Shimadzu Corp., Kyoto Spektrophotometereinrichtung und verfahren zur korrektur von damit erhaltenen messwerten

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Clin. Chemistry 11, 1965, S. 1051-1057 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3628178A1 (de) * 1986-08-20 1988-02-25 Kernforschungsz Karlsruhe Verfahren zur linearisierung der kennlinie einer messgroesse und anordnung zur durchfuehrung des verfahrens
DE3633916A1 (de) * 1986-10-04 1988-04-14 Kernforschungsz Karlsruhe Verfahren zur selektiven messung der konzentrationen von ir- bis uv-strahlung absorbierenden gasfoermigen und/oder fluessigen substanzen in gasen und/oder fluessigkeiten und vorrichtung zur durchfuehrung des verfahrens
DE3830181A1 (de) * 1988-09-06 1990-03-15 Leybold Ag Gleitlageranordnung fuer eine rasch rotierende welle
DE3839561A1 (de) * 1988-11-24 1990-05-31 Lange Gmbh Dr Bruno Vorrichtung zum feststellen von stoerfaellen in fluessigen medien
DE4121089A1 (de) * 1991-06-26 1993-01-07 Boehringer Mannheim Gmbh Analysesystem zur automatischen analyse von koerperfluessigkeiten
DE4309529A1 (de) * 1992-03-24 1993-09-30 Hitachi Ltd Analytisches Verfahren und Vorrichtung

Also Published As

Publication number Publication date
JPS60125542A (ja) 1985-07-04
JPH0514855B2 (enrdf_load_stackoverflow) 1993-02-26
DE3444768C2 (enrdf_load_stackoverflow) 1991-09-12

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8125 Change of the main classification

Ipc: G01N 21/27

D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee