JPS60125542A - 測定デ−タ補正方法 - Google Patents

測定デ−タ補正方法

Info

Publication number
JPS60125542A
JPS60125542A JP23354583A JP23354583A JPS60125542A JP S60125542 A JPS60125542 A JP S60125542A JP 23354583 A JP23354583 A JP 23354583A JP 23354583 A JP23354583 A JP 23354583A JP S60125542 A JPS60125542 A JP S60125542A
Authority
JP
Japan
Prior art keywords
measurement
measuring
data
measured
items
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP23354583A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0514855B2 (enrdf_load_stackoverflow
Inventor
Toshihide Fujiwara
藤原　敏英
Kazu Nagai
永井　和
Taiichi Sakano
坂野　泰一
Takashi Tawara
田原　高
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP23354583A priority Critical patent/JPS60125542A/ja
Priority to DE19843444768 priority patent/DE3444768A1/de
Publication of JPS60125542A publication Critical patent/JPS60125542A/ja
Publication of JPH0514855B2 publication Critical patent/JPH0514855B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/022—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation having an ideal characteristic, map or correction data stored in a digital memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12746—Calibration values determination
    • G01N2201/12753—Calibration values determination and storage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Technology Law (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
JP23354583A 1983-12-13 1983-12-13 測定デ−タ補正方法 Granted JPS60125542A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP23354583A JPS60125542A (ja) 1983-12-13 1983-12-13 測定デ−タ補正方法
DE19843444768 DE3444768A1 (de) 1983-12-13 1984-12-07 Verfahren zum korrigieren kolorimetrischer messergebnisse

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23354583A JPS60125542A (ja) 1983-12-13 1983-12-13 測定デ−タ補正方法

Publications (2)

Publication Number Publication Date
JPS60125542A true JPS60125542A (ja) 1985-07-04
JPH0514855B2 JPH0514855B2 (enrdf_load_stackoverflow) 1993-02-26

Family

ID=16956733

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23354583A Granted JPS60125542A (ja) 1983-12-13 1983-12-13 測定デ−タ補正方法

Country Status (2)

Country Link
JP (1) JPS60125542A (enrdf_load_stackoverflow)
DE (1) DE3444768A1 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62179639A (ja) * 1986-01-31 1987-08-06 Shimadzu Corp 多項目生化学分析方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3628178A1 (de) * 1986-08-20 1988-02-25 Kernforschungsz Karlsruhe Verfahren zur linearisierung der kennlinie einer messgroesse und anordnung zur durchfuehrung des verfahrens
DE3633916A1 (de) * 1986-10-04 1988-04-14 Kernforschungsz Karlsruhe Verfahren zur selektiven messung der konzentrationen von ir- bis uv-strahlung absorbierenden gasfoermigen und/oder fluessigen substanzen in gasen und/oder fluessigkeiten und vorrichtung zur durchfuehrung des verfahrens
DE3830181A1 (de) * 1988-09-06 1990-03-15 Leybold Ag Gleitlageranordnung fuer eine rasch rotierende welle
DE3839561C2 (de) * 1988-11-24 1996-10-24 Lange Gmbh Dr Bruno Vorrichtung zum Bestimmen der Komponenten in flüssigen Medien
DE4121089A1 (de) * 1991-06-26 1993-01-07 Boehringer Mannheim Gmbh Analysesystem zur automatischen analyse von koerperfluessigkeiten
JPH05273118A (ja) * 1992-03-24 1993-10-22 Hitachi Ltd 被検試料液の濃度又は成分の分析方法及び分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3681577A (en) * 1970-10-30 1972-08-01 Technicon Instr Automatic calibration apparatus
US3703726A (en) * 1970-12-31 1972-11-21 Corning Glass Works Quantitative chemical analysis by x-ray emission spectroscopy
JPS59779B2 (ja) * 1977-01-20 1984-01-09 株式会社京都第一科学 尿等の分析方法
US4406547A (en) * 1979-08-07 1983-09-27 Olympus Optical Company Limited Apparatus for effecting automatic analysis
JPS5630650A (en) * 1979-08-22 1981-03-27 Hitachi Ltd Automatic chemical analyzer
JPS585669A (ja) * 1981-06-30 1983-01-13 Shimadzu Corp ベ−スライン補正方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62179639A (ja) * 1986-01-31 1987-08-06 Shimadzu Corp 多項目生化学分析方法

Also Published As

Publication number Publication date
DE3444768A1 (de) 1985-06-20
JPH0514855B2 (enrdf_load_stackoverflow) 1993-02-26
DE3444768C2 (enrdf_load_stackoverflow) 1991-09-12

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