DE3215074C2 - - Google Patents

Info

Publication number
DE3215074C2
DE3215074C2 DE3215074A DE3215074A DE3215074C2 DE 3215074 C2 DE3215074 C2 DE 3215074C2 DE 3215074 A DE3215074 A DE 3215074A DE 3215074 A DE3215074 A DE 3215074A DE 3215074 C2 DE3215074 C2 DE 3215074C2
Authority
DE
Germany
Prior art keywords
test
transmitter
receiver
output
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3215074A
Other languages
German (de)
English (en)
Other versions
DE3215074A1 (de
Inventor
Klaus 8032 Graefelfing De Welzhofer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE19823215074 priority Critical patent/DE3215074A1/de
Priority to EP83103728A priority patent/EP0093899B1/de
Priority to US06/487,062 priority patent/US4607214A/en
Publication of DE3215074A1 publication Critical patent/DE3215074A1/de
Application granted granted Critical
Publication of DE3215074C2 publication Critical patent/DE3215074C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE19823215074 1982-04-22 1982-04-22 Anordnung zur anpassung einer pruefeinrichtung an einen pruefling Granted DE3215074A1 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE19823215074 DE3215074A1 (de) 1982-04-22 1982-04-22 Anordnung zur anpassung einer pruefeinrichtung an einen pruefling
EP83103728A EP0093899B1 (de) 1982-04-22 1983-04-18 Anordnung zur Anpassung einer Prüfeinrichtung an einen Prüfling
US06/487,062 US4607214A (en) 1982-04-22 1983-04-21 Adaptor circuit for adapting a test facility to a unit under test having a fast signal response

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19823215074 DE3215074A1 (de) 1982-04-22 1982-04-22 Anordnung zur anpassung einer pruefeinrichtung an einen pruefling

Publications (2)

Publication Number Publication Date
DE3215074A1 DE3215074A1 (de) 1983-10-27
DE3215074C2 true DE3215074C2 (en:Method) 1989-06-08

Family

ID=6161691

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19823215074 Granted DE3215074A1 (de) 1982-04-22 1982-04-22 Anordnung zur anpassung einer pruefeinrichtung an einen pruefling

Country Status (3)

Country Link
US (1) US4607214A (en:Method)
EP (1) EP0093899B1 (en:Method)
DE (1) DE3215074A1 (en:Method)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4806852A (en) * 1984-09-07 1989-02-21 Megatest Corporation Automatic test system with enhanced performance of timing generators
US4704550A (en) * 1986-11-07 1987-11-03 American Telephone And Telegraph Company Method and apparatus for driving electrical circuits
JP3319608B2 (ja) * 1991-10-18 2002-09-03 ソニー株式会社 電子機器
US7248066B2 (en) * 2003-12-29 2007-07-24 Stmicroelectronics Pvt. Ltd. On-chip analysis and computation of transition behavior of embedded nets in integrated circuits

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3631229A (en) * 1970-09-30 1971-12-28 Ibm Monolithic memory array tester
US3682131A (en) * 1971-01-20 1972-08-08 Nordson Corp Coating apparatus control with delay-duration timer having constant current charging circuit and bistable trigger circuit
DE2233612C3 (de) * 1972-07-07 1975-03-13 Siemens Ag, 1000 Berlin Und 8000 Muenchen Endstufe für einen Prüfsignalgeber
FR2283592A1 (fr) * 1974-08-27 1976-03-26 Thomson Csf Dispositif extracteur de synchronisation et systeme de transmission d'informations comportant un tel dispositif
US3974402A (en) * 1975-03-26 1976-08-10 Honeywell Information Systems, Inc. Logic level translator
US4044244A (en) * 1976-08-06 1977-08-23 International Business Machines Corporation Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof
US4092589A (en) * 1977-03-23 1978-05-30 Fairchild Camera And Instrument Corp. High-speed testing circuit
US4161029A (en) * 1977-09-19 1979-07-10 Frye George J Automatic transient response analyzer system
US4211915A (en) * 1978-12-04 1980-07-08 General Electric Company Keyboard verification system
DE2951929C2 (de) * 1979-12-21 1985-09-12 Siemens AG, 1000 Berlin und 8000 München Prüfeinrichtung
US4465971A (en) * 1982-03-15 1984-08-14 Rca Corporation Circuit for coupling signals to or from a circuit under test

Also Published As

Publication number Publication date
EP0093899A1 (de) 1983-11-16
EP0093899B1 (de) 1986-12-30
DE3215074A1 (de) 1983-10-27
US4607214A (en) 1986-08-19

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Legal Events

Date Code Title Description
OM8 Search report available as to paragraph 43 lit. 1 sentence 1 patent law
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee