DE3131673C2 - Digitales elektrisches Längenmeßgerät - Google Patents

Digitales elektrisches Längenmeßgerät

Info

Publication number
DE3131673C2
DE3131673C2 DE3131673A DE3131673A DE3131673C2 DE 3131673 C2 DE3131673 C2 DE 3131673C2 DE 3131673 A DE3131673 A DE 3131673A DE 3131673 A DE3131673 A DE 3131673A DE 3131673 C2 DE3131673 C2 DE 3131673C2
Authority
DE
Germany
Prior art keywords
measuring
measuring device
electrical length
digital electrical
length measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3131673A
Other languages
German (de)
English (en)
Other versions
DE3131673A1 (de
Inventor
Johann 8221 Buchöster Oberhans
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dr Johannes Heidenhain GmbH
Original Assignee
Dr Johannes Heidenhain GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dr Johannes Heidenhain GmbH filed Critical Dr Johannes Heidenhain GmbH
Priority to DE3131673A priority Critical patent/DE3131673C2/de
Priority to EP82105687A priority patent/EP0071739B1/de
Priority to AT82105687T priority patent/ATE34224T1/de
Priority to US06/403,800 priority patent/US4419824A/en
Priority to JP57138043A priority patent/JPS5838809A/ja
Publication of DE3131673A1 publication Critical patent/DE3131673A1/de
Application granted granted Critical
Publication of DE3131673C2 publication Critical patent/DE3131673C2/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/18—Micrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/002—Details
    • G01B3/008—Arrangements for controlling the measuring force

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length-Measuring Instruments Using Mechanical Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
DE3131673A 1981-08-11 1981-08-11 Digitales elektrisches Längenmeßgerät Expired DE3131673C2 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE3131673A DE3131673C2 (de) 1981-08-11 1981-08-11 Digitales elektrisches Längenmeßgerät
EP82105687A EP0071739B1 (de) 1981-08-11 1982-06-26 Digitales elektrisches Längenmessgerät
AT82105687T ATE34224T1 (de) 1981-08-11 1982-06-26 Digitales elektrisches laengenmessgeraet.
US06/403,800 US4419824A (en) 1981-08-11 1982-07-30 Digital electrical length measuring instrument
JP57138043A JPS5838809A (ja) 1981-08-11 1982-08-10 電気的ディジタル測長器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3131673A DE3131673C2 (de) 1981-08-11 1981-08-11 Digitales elektrisches Längenmeßgerät

Publications (2)

Publication Number Publication Date
DE3131673A1 DE3131673A1 (de) 1983-03-03
DE3131673C2 true DE3131673C2 (de) 1984-01-19

Family

ID=6139049

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3131673A Expired DE3131673C2 (de) 1981-08-11 1981-08-11 Digitales elektrisches Längenmeßgerät

Country Status (5)

Country Link
US (1) US4419824A (OSRAM)
EP (1) EP0071739B1 (OSRAM)
JP (1) JPS5838809A (OSRAM)
AT (1) ATE34224T1 (OSRAM)
DE (1) DE3131673C2 (OSRAM)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD221011A1 (de) * 1983-12-13 1985-04-10 Suhl Feinmesszeugfab Veb Messtaster
DE3703652A1 (de) * 1987-02-06 1988-08-18 Pav Praezisions Apparatebau Ag Schieblehre
US4876800A (en) * 1988-10-07 1989-10-31 Ltv Aerospace And Defense Company Portable grip length indicator
SE500504C2 (sv) * 1989-09-15 1994-07-04 Jan Tholerus Anordning för tjockleksbestämning av föremål, företrädesvis vid häftning av ark
FR2680238A1 (fr) * 1991-08-05 1993-02-12 Airgiss Sa Micrometre numerique.
CH683638A5 (de) * 1992-01-27 1994-04-15 Hans Meyer Längenmessgerät.
US5448361A (en) * 1993-07-23 1995-09-05 Patton; Martin O. Electro-optical micrometer
JP2965444B2 (ja) * 1993-10-01 1999-10-18 株式会社ミツトヨ 定圧型測定機
JP3623038B2 (ja) * 1996-02-26 2005-02-23 株式会社ミツトヨ マイクロメータ
US5870833A (en) * 1997-08-06 1999-02-16 Clorox Company Balancing container finish measuring device
JP3115555B2 (ja) * 1998-04-03 2000-12-11 株式会社ミツトヨ マイクロメータ
US6508012B2 (en) 2000-12-30 2003-01-21 Earnest G. Wells, Jr. Digital fastener size indicator
SE523803C2 (sv) * 2001-09-18 2004-05-18 Hagloef Sweden Ab Klave för mätning av träds diameter
US20030047009A1 (en) * 2002-08-26 2003-03-13 Webb Walter L. Digital callipers
JP5022724B2 (ja) * 2006-03-07 2012-09-12 株式会社ミツトヨ 絶対位置測定装置
US7373735B2 (en) * 2006-06-24 2008-05-20 Jacobs Todd M Device and method for rapid hardware sizing
US8087312B2 (en) * 2008-07-18 2012-01-03 Nexteer (Beijing) Technology Co., Ltd. Automotive transmission shift system linear measurement device
CN101881586A (zh) * 2010-06-04 2010-11-10 钟胜 绝对位置测量数显千分尺
CN103453814B (zh) * 2013-08-27 2016-08-10 私立华联学院 辅助校准装置
JP6857090B2 (ja) * 2017-06-26 2021-04-14 株式会社ミツトヨ ノギスのサムローラー定圧機構
CN108775846A (zh) * 2018-05-11 2018-11-09 平湖市宇达精密机械有限公司 手动快速定长检测装置
TWI724520B (zh) * 2019-08-29 2021-04-11 岡杉企業有限公司 螺絲量具

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE310032C (OSRAM) *
GB191001840A (en) * 1910-01-25 1910-07-21 Frederic William Russell Improvements in Quick Adjusting Micrometer Gauges.
DE710032C (de) * 1938-09-13 1941-09-02 J E Reinecker Akt Ges Vorrichtung zum Festklemmen des Messstabes von Laengenmessgeraeten
FR1351834A (fr) * 1962-03-21 1964-02-07 Szerszamgepfejleszto Intezet Dispositif de réglage fin pour outils, appareils ou instruments
CH410446A (it) * 1964-05-13 1966-03-31 Borletti Spa Micrometro con numeratore
US3416380A (en) * 1966-09-08 1968-12-17 Warner Lambert Pharmaceutical Micrometer adjustment lock
CH527407A (de) 1971-01-28 1972-08-31 Meier Johann Längenmessgerät
JPS5234998Y2 (OSRAM) * 1971-07-27 1977-08-10
JPS49121554A (OSRAM) * 1973-03-22 1974-11-20
GB1489310A (en) * 1975-04-03 1977-10-19 Rolls Royce Measuring instrument
JPS5243458U (OSRAM) * 1975-09-23 1977-03-28
US4062120A (en) * 1976-06-10 1977-12-13 Quality Measurement Systems, Inc. Digital electronic micrometer
DE2731294A1 (de) 1977-07-11 1979-01-25 Quality Measurement Systems Elektronisches digitalmikrometer
US4215480A (en) * 1977-12-16 1980-08-05 James Neill Holdings Limited Distance measuring gauge
JPS6145441Y2 (OSRAM) 1978-06-24 1986-12-20
JPS5679901A (en) * 1979-12-05 1981-06-30 Mitsutoyo Mfg Co Ltd Length measuring instrument
IT1128168B (it) * 1980-07-22 1986-05-28 Micrometro Italia Srl Micrometro a lettura digitale
GB2104659B (en) * 1981-07-21 1985-01-23 Mitutoyo Mfg Co Ltd Dimension measuring instrument
ZA843232B (en) * 1983-05-03 1984-12-24 Bristol Myers Co Antiperspirant stick with low staining potential

Also Published As

Publication number Publication date
ATE34224T1 (de) 1988-05-15
DE3131673A1 (de) 1983-03-03
EP0071739A2 (de) 1983-02-16
JPH0159523B2 (OSRAM) 1989-12-18
EP0071739B1 (de) 1988-05-11
JPS5838809A (ja) 1983-03-07
EP0071739A3 (en) 1985-10-02
US4419824A (en) 1983-12-13

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee