DE2914674C2 - Verfahren zum Prüfen gedruckter Schaltungskarten und Prüfgerät zur Durchführung des Verfahrens - Google Patents
Verfahren zum Prüfen gedruckter Schaltungskarten und Prüfgerät zur Durchführung des VerfahrensInfo
- Publication number
- DE2914674C2 DE2914674C2 DE2914674A DE2914674A DE2914674C2 DE 2914674 C2 DE2914674 C2 DE 2914674C2 DE 2914674 A DE2914674 A DE 2914674A DE 2914674 A DE2914674 A DE 2914674A DE 2914674 C2 DE2914674 C2 DE 2914674C2
- Authority
- DE
- Germany
- Prior art keywords
- processor
- pins
- driver
- shift register
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 79
- 238000000034 method Methods 0.000 title claims abstract description 18
- 230000005540 biological transmission Effects 0.000 claims description 3
- 230000006870 function Effects 0.000 claims description 3
- 230000008878 coupling Effects 0.000 claims 2
- 238000010168 coupling process Methods 0.000 claims 2
- 238000005859 coupling reaction Methods 0.000 claims 2
- 238000006073 displacement reaction Methods 0.000 claims 1
- 239000004020 conductor Substances 0.000 description 22
- 239000003550 marker Substances 0.000 description 3
- 238000009415 formwork Methods 0.000 description 2
- 108090000623 proteins and genes Proteins 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31915—In-circuit Testers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/895,891 US4174805A (en) | 1978-04-13 | 1978-04-13 | Method and apparatus for transmitting data to a predefined destination bus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE2914674A1 DE2914674A1 (de) | 1979-10-25 |
| DE2914674C2 true DE2914674C2 (de) | 1983-05-11 |
Family
ID=25405236
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2914674A Expired DE2914674C2 (de) | 1978-04-13 | 1979-04-11 | Verfahren zum Prüfen gedruckter Schaltungskarten und Prüfgerät zur Durchführung des Verfahrens |
| DE2914678A Expired DE2914678C2 (de) | 1978-04-13 | 1979-04-11 | Verfahren zum Prüfen einer asynchron arbeitenden digitalen Schaltung und Prüfgerät zur Durchführung des Verfahrens |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2914678A Expired DE2914678C2 (de) | 1978-04-13 | 1979-04-11 | Verfahren zum Prüfen einer asynchron arbeitenden digitalen Schaltung und Prüfgerät zur Durchführung des Verfahrens |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4174805A (cg-RX-API-DMAC7.html) |
| JP (1) | JPS54138349A (cg-RX-API-DMAC7.html) |
| DE (2) | DE2914674C2 (cg-RX-API-DMAC7.html) |
| FR (2) | FR2422992A1 (cg-RX-API-DMAC7.html) |
| GB (2) | GB2019014B (cg-RX-API-DMAC7.html) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4267594A (en) * | 1979-06-22 | 1981-05-12 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Decommutator patchboard verifier |
| US4308615A (en) * | 1979-09-17 | 1981-12-29 | Honeywell Information Systems Inc. | Microprocessor based maintenance system |
| US4380070A (en) * | 1979-11-20 | 1983-04-12 | Lockheed Corporation | Automatic circuit identifier |
| US4291404A (en) * | 1979-11-20 | 1981-09-22 | Lockheed Corporation | Automatic circuit tester with improved voltage regulator |
| IT1128762B (it) * | 1980-02-20 | 1986-06-04 | Cselt Centro Studi Lab Telecom | Circuito per diagnosi di reti di connessione pcm |
| US4402055A (en) * | 1981-01-27 | 1983-08-30 | Westinghouse Electric Corp. | Automatic test system utilizing interchangeable test devices |
| EP0104169A4 (en) * | 1982-03-30 | 1986-01-07 | Lockheed Corp | AUTOMATIC CIRCUIT IDENTIFIER. |
| CU21488A1 (es) * | 1982-07-26 | 1987-06-09 | Inst Central De Investigacion | Medidor lógico |
| DE3237365A1 (de) * | 1982-10-08 | 1984-04-12 | Siemens AG, 1000 Berlin und 8000 München | Anordnung zur erzeugung von mustern von pruefsignalen bei einem pruefgeraet |
| US4551837A (en) * | 1983-03-25 | 1985-11-05 | International Telephone & Telegraph Corp. | High speed operational recurring signature evaluator for digital equipment tester |
| JPS6125263A (ja) * | 1984-07-13 | 1986-02-04 | Sony Corp | 電子機器制御システム |
| DE3543699A1 (de) * | 1985-12-11 | 1987-06-19 | Rohde & Schwarz | Verfahren zum pruefen der einzelnen bauelemente einer leiterplatte (in-circuit-test) |
| US5414712A (en) * | 1991-07-23 | 1995-05-09 | Progressive Computing, Inc. | Method for transmitting data using a communication interface box |
| US10184962B2 (en) | 2016-09-26 | 2019-01-22 | International Business Machines Corporation | Removable transient voltage detector |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3621387A (en) * | 1969-08-21 | 1971-11-16 | Gen Instrument Corp | Computer-controlled tester for integrated circuit devices |
| US3740645A (en) * | 1970-10-19 | 1973-06-19 | Teletype Corp | Circuit testing by comparison with a standard circuit |
| US3739349A (en) * | 1971-05-24 | 1973-06-12 | Sperry Rand Corp | Digital equipment interface unit |
| US3784907A (en) * | 1972-10-16 | 1974-01-08 | Ibm | Method of propagation delay testing a functional logic system |
| US4000460A (en) * | 1974-07-01 | 1976-12-28 | Xerox Corporation | Digital circuit module test system |
| US3924109A (en) * | 1974-07-22 | 1975-12-02 | Technology Marketing Inc | Automatic circuit card testing system |
| US3976864A (en) * | 1974-09-03 | 1976-08-24 | Hewlett-Packard Company | Apparatus and method for testing digital circuits |
| US3922537A (en) * | 1974-09-26 | 1975-11-25 | Instrumentation Engineering | Multiplex device for automatic test equipment |
| US3976940A (en) * | 1975-02-25 | 1976-08-24 | Fairchild Camera And Instrument Corporation | Testing circuit |
| US4012625A (en) * | 1975-09-05 | 1977-03-15 | Honeywell Information Systems, Inc. | Non-logic printed wiring board test system |
| US4063311A (en) * | 1976-08-17 | 1977-12-13 | Cincinnati Milacron Inc. | Asynchronously operating signal diagnostic system for a programmable machine function controller |
| US4125763A (en) * | 1977-07-15 | 1978-11-14 | Fluke Trendar Corporation | Automatic tester for microprocessor board |
-
1978
- 1978-04-13 US US05/895,891 patent/US4174805A/en not_active Expired - Lifetime
-
1979
- 1979-04-11 DE DE2914674A patent/DE2914674C2/de not_active Expired
- 1979-04-11 DE DE2914678A patent/DE2914678C2/de not_active Expired
- 1979-04-12 GB GB7913038A patent/GB2019014B/en not_active Expired
- 1979-04-12 JP JP4371379A patent/JPS54138349A/ja active Granted
- 1979-04-12 GB GB7913037A patent/GB2019013B/en not_active Expired
- 1979-04-13 FR FR7909550A patent/FR2422992A1/fr active Granted
- 1979-04-13 FR FR7909551A patent/FR2432715A1/fr active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| GB2019014B (en) | 1982-06-23 |
| DE2914678A1 (de) | 1979-10-25 |
| US4174805A (en) | 1979-11-20 |
| FR2422992A1 (fr) | 1979-11-09 |
| GB2019013B (en) | 1982-06-23 |
| GB2019013A (en) | 1979-10-24 |
| GB2019014A (en) | 1979-10-24 |
| FR2422992B1 (cg-RX-API-DMAC7.html) | 1983-10-21 |
| DE2914674A1 (de) | 1979-10-25 |
| FR2432715B1 (cg-RX-API-DMAC7.html) | 1983-08-05 |
| FR2432715A1 (fr) | 1980-02-29 |
| JPS54138349A (en) | 1979-10-26 |
| DE2914678C2 (de) | 1986-10-16 |
| JPS6246894B2 (cg-RX-API-DMAC7.html) | 1987-10-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OD | Request for examination | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: NCR INTERNATIONAL INC., DAYTON, OHIO, US |
|
| 8328 | Change in the person/name/address of the agent |
Free format text: KAHLER, K., DIPL.-ING., 8948 MINDELHEIM KAECK, J., DIPL.-ING. DIPL.-WIRTSCH.-ING., 8910 LANDSBERG FIENER, J., PAT.-ANWAELTE, 8948 MINDELHEIM |
|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: AT&T GLOBAL INFORMATION SOLUTIONS INTERNATIONAL IN |
|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: NCR INTERNATIONAL, INC. (N.D.GES.D.STAATES DELAWAR |
|
| 8339 | Ceased/non-payment of the annual fee |