DE2852570C2 - Temperaturmeßvorrichtung - Google Patents

Temperaturmeßvorrichtung

Info

Publication number
DE2852570C2
DE2852570C2 DE2852570A DE2852570A DE2852570C2 DE 2852570 C2 DE2852570 C2 DE 2852570C2 DE 2852570 A DE2852570 A DE 2852570A DE 2852570 A DE2852570 A DE 2852570A DE 2852570 C2 DE2852570 C2 DE 2852570C2
Authority
DE
Germany
Prior art keywords
temperature
voltage
counter
value
pulse generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2852570A
Other languages
German (de)
English (en)
Other versions
DE2852570A1 (de
Inventor
Hiromasa Ikoma Ishiwatari
Yoshinori Kadoma Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Publication of DE2852570A1 publication Critical patent/DE2852570A1/de
Application granted granted Critical
Publication of DE2852570C2 publication Critical patent/DE2852570C2/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
    • G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/20—Compensating for effects of temperature changes other than those to be measured, e.g. changes in ambient temperature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
DE2852570A 1977-12-05 1978-12-05 Temperaturmeßvorrichtung Expired DE2852570C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14629577A JPS5479085A (en) 1977-12-05 1977-12-05 Temperature measuring apparatus

Publications (2)

Publication Number Publication Date
DE2852570A1 DE2852570A1 (de) 1979-06-07
DE2852570C2 true DE2852570C2 (de) 1984-10-04

Family

ID=15404440

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2852570A Expired DE2852570C2 (de) 1977-12-05 1978-12-05 Temperaturmeßvorrichtung

Country Status (5)

Country Link
US (1) US4210024A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5479085A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CA (1) CA1114635A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE2852570C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB2010487B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4446775A1 (de) * 1994-12-24 1996-06-27 Miele & Cie Verfahren zur Kompensation der thermischen Offsetdrift von Sensoren

Families Citing this family (66)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4329693A (en) * 1979-09-04 1982-05-11 Kaye Instruments, Inc. Method of and apparatus for data recording and the like
US4443117A (en) * 1980-09-26 1984-04-17 Terumo Corporation Measuring apparatus, method of manufacture thereof, and method of writing data into same
JPS58120137A (ja) * 1982-01-13 1983-07-16 Terumo Corp 電子体温計
US4536851A (en) * 1982-10-22 1985-08-20 Damon Germanton Electronic thermometer and associated apparatus
GB8306764D0 (en) * 1983-03-11 1983-04-20 Johnson Matthey Plc Calibration warning apparatus
JPS59191623A (ja) * 1983-04-15 1984-10-30 Toshiba Corp 調理器
GB2157515B (en) * 1984-02-01 1987-10-07 Suwa Seikosha Kk Electronic thermometer
FR2566119A1 (fr) * 1984-06-14 1985-12-20 Petercem Sa Procede et dispositif de compensation de capacite parasite et de correction de temperature pour capteur de proximite
JPS6167116A (ja) * 1984-09-07 1986-04-07 Matsushita Electric Ind Co Ltd 温度制御装置
JPS61269031A (ja) * 1985-05-23 1986-11-28 Toshiba Corp 温度検出装置
EP0245393A1 (de) * 1985-11-19 1987-11-19 Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V. Vorrichtung zur bestimmung der basaltemperaturkurve
JPS62150687A (ja) * 1985-12-23 1987-07-04 株式会社東芝 温度検知回路
US4728199A (en) * 1985-12-31 1988-03-01 Kyushu Hitachi Maxell, Ltd. Temperature measurement device
JPS62240824A (ja) * 1986-04-11 1987-10-21 Sharp Corp 温度計
ATE86753T1 (de) * 1988-11-04 1993-03-15 Horiba Ltd Temperaturkompensationsschaltung.
US5017019A (en) * 1989-04-14 1991-05-21 Exergen Corporation Radiation detector for differential biological temperature readings
FR2662797A1 (fr) * 1990-06-05 1991-12-06 Jaeger Regulation Capteur-transducteur, notamment pour systeme de controle de temperature.
EP0510880B1 (en) * 1991-04-23 2002-07-10 Kabushiki Kaisha Toshiba Cryogenic measurement equipment
DE4218022A1 (de) * 1992-06-01 1993-12-02 Siemens Ag Vorrichtung zur Überprüfung eines Meßsignals
DE9212230U1 (de) * 1992-09-10 1993-10-21 Siemens AG, 80333 München Anordnung mit mehreren Analogeingabeeinheiten
US5253938A (en) * 1992-10-07 1993-10-19 The United States Of America As Represented By The Secretary Of The Navy Thermistor controlled current source versatile temperature sensor
DE4305314A1 (de) * 1993-02-20 1994-08-25 Mannesmann Kienzle Gmbh Anordnung zur Funktionskontrolle eines Temperatursensors
DE4315336B4 (de) * 1993-05-03 2005-05-04 Abb Patent Gmbh Verfahren und Einrichtung zur Messung und Korrektur von Prozeßvariablen
FR2722895B1 (fr) * 1994-07-20 1996-10-04 Atlantic Soc Fr Dev Thermique Dispositif de regulation thermique
FI113405B (fi) * 1994-11-02 2004-04-15 Jarmo Juhani Enala Reaaliaikainen mittausmenetelmä
US7386401B2 (en) 1994-11-21 2008-06-10 Phatrat Technology, Llc Helmet that reports impact information, and associated methods
US8280682B2 (en) 2000-12-15 2012-10-02 Tvipr, Llc Device for monitoring movement of shipped goods
US6266623B1 (en) 1994-11-21 2001-07-24 Phatrat Technology, Inc. Sport monitoring apparatus for determining loft time, speed, power absorbed and other factors such as height
US5725308A (en) * 1994-12-23 1998-03-10 Rtd Technology, Inc. Quick registering thermometer
US5833365A (en) * 1995-03-24 1998-11-10 Interuniversitair Micro-Electronika Centrum Vzw Method for local temperature sensing for use in performing high resolution in-situ parameter measurements
US5678925A (en) * 1995-10-16 1997-10-21 Garmaise; Ian Temperature sensing and indicating beverage mug
US5795068A (en) * 1996-08-30 1998-08-18 Xilinx, Inc. Method and apparatus for measuring localized temperatures and voltages on integrated circuits
US5857777A (en) * 1996-09-25 1999-01-12 Claud S. Gordon Company Smart temperature sensing device
IL123052A (en) * 1997-01-31 2001-03-19 Omega Engineering Thermoelectric product
WO1999060579A2 (en) * 1998-05-20 1999-11-25 The Foxboro Company Three-wire rtd interface
US6361207B1 (en) * 1999-06-04 2002-03-26 Florida Rf Labs, Inc. Temperature sensing termination
JP4679782B2 (ja) * 1999-12-10 2011-04-27 富士通株式会社 温度センサ
US6612737B1 (en) 1999-12-29 2003-09-02 Affymetrix, Inc. System and method for self-calibrating measurement
US7171331B2 (en) 2001-12-17 2007-01-30 Phatrat Technology, Llc Shoes employing monitoring devices, and associated methods
DE10138806C1 (de) * 2001-08-14 2002-12-19 Bosch Gmbh Robert Ermittlung der Temperatur eines Abgassensors mittels kalibrierter Innenwiderstandsmessung
US6749335B2 (en) * 2002-05-17 2004-06-15 Sun Microsystems, Inc. Adjustment and calibration system for post-fabrication treatment of on-chip temperature sensor
US20040071182A1 (en) * 2002-10-11 2004-04-15 Welch Allyn, Inc. Thermometry probe calibration method
US6971790B2 (en) * 2002-10-11 2005-12-06 Welch Allyn, Inc. Thermometry probe calibration method
US6874933B1 (en) * 2002-10-15 2005-04-05 National Semiconductor Corporation Apparatus for digital temperature measurement in an integrated circuit
US6948846B2 (en) * 2003-10-23 2005-09-27 Eaton Corporation Test apparatus for power circuits of an electrical distribution device
US7447607B2 (en) * 2004-08-31 2008-11-04 Watow Electric Manufacturing System and method of compensation for device mounting and thermal transfer error
US7911339B2 (en) 2005-10-18 2011-03-22 Apple Inc. Shoe wear-out sensor, body-bar sensing system, unitless activity assessment and associated methods
US7643895B2 (en) 2006-05-22 2010-01-05 Apple Inc. Portable media device with workout support
US20070271116A1 (en) 2006-05-22 2007-11-22 Apple Computer, Inc. Integrated media jukebox and physiologic data handling application
US8073984B2 (en) 2006-05-22 2011-12-06 Apple Inc. Communication protocol for use with portable electronic devices
US9137309B2 (en) 2006-05-22 2015-09-15 Apple Inc. Calibration techniques for activity sensing devices
US7813715B2 (en) 2006-08-30 2010-10-12 Apple Inc. Automated pairing of wireless accessories with host devices
US7913297B2 (en) 2006-08-30 2011-03-22 Apple Inc. Pairing of wireless devices using a wired medium
US7698101B2 (en) 2007-03-07 2010-04-13 Apple Inc. Smart garment
US8182139B2 (en) * 2008-05-30 2012-05-22 Apple Inc. Calibration of temperature sensing circuitry in an electronic device
KR101520358B1 (ko) * 2008-12-09 2015-05-14 삼성전자주식회사 온도변화에 따른 출력특성을 보상한 온도감지기 및 온도보상방법
US8351289B1 (en) 2009-12-30 2013-01-08 Micron Technology, Inc. Apparatuses and methods for sensing a phase-change test cell and determining changes to the test cell resistance due to thermal exposure
US8794829B2 (en) * 2009-12-31 2014-08-05 Welch Allyn, Inc. Temperature-measurement probe
DE102010040039A1 (de) 2010-08-31 2012-03-01 Endress + Hauser Wetzer Gmbh + Co Kg Verfahren und Vorrichtung zur in situ Kalibrierung eines Thermometers
WO2012108500A1 (ja) * 2011-02-09 2012-08-16 日本特殊陶業株式会社 可燃性ガス検出装置
US9835574B2 (en) 2014-07-02 2017-12-05 Stmicroelectronics S.R.L. Gas measurement device and measurement method thereof
DE112015005434T5 (de) * 2015-01-06 2017-08-17 Hitachi Automotive Systems, Ltd. Fehlerdetektionsvorrichtung
ITUA20164320A1 (it) 2016-06-13 2017-12-13 St Microelectronics Srl Ponte sensore con resistori commutati, sistema e procedimento corrispondenti
TWI698130B (zh) * 2018-12-20 2020-07-01 瑞昱半導體股份有限公司 溫度計算參數提供電路、溫度計算參數提供方法以及溫度監控方法
RU2738198C1 (ru) * 2019-11-22 2020-12-09 Акционерное общество "Государственный космический научно-производственный центр им. М.В. Хруничева" Способ снижения погрешности измерения температуры электрическим мостом и измерительный мост Уитстона-Капиноса
CN114689199B (zh) * 2020-12-29 2023-06-02 华润微集成电路(无锡)有限公司 实现温度补偿的预测型电子体温计电路结构

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3564420A (en) * 1967-11-28 1971-02-16 Nasa Method and means for providing an absolute power measurement capability
US3657926A (en) * 1970-04-02 1972-04-25 Thayer Corp Method and apparatus for measuring physical phenomena
US4050309A (en) * 1974-11-04 1977-09-27 William Wahl Corporation Method and apparatus for measuring temperature
JPS5276085A (en) * 1975-12-20 1977-06-25 Toshiba Corp Clinical thermometer
US4041382A (en) * 1976-08-16 1977-08-09 The Sippican Corporation Calibrating a measurement system including bridge circuit
JPS5833490B2 (ja) * 1976-12-03 1983-07-20 株式会社東芝 温度測定装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4446775A1 (de) * 1994-12-24 1996-06-27 Miele & Cie Verfahren zur Kompensation der thermischen Offsetdrift von Sensoren
DE4446775B4 (de) * 1994-12-24 2006-07-20 Miele & Cie. Kg Verfahren zur Kompensation der thermischen Offsetdrift von Sensoren

Also Published As

Publication number Publication date
GB2010487A (en) 1979-06-27
CA1114635A (en) 1981-12-22
JPS5479085A (en) 1979-06-23
US4210024A (en) 1980-07-01
GB2010487B (en) 1982-10-13
JPS6310370B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-03-07
DE2852570A1 (de) 1979-06-07

Similar Documents

Publication Publication Date Title
DE2852570C2 (de) Temperaturmeßvorrichtung
DE2753871C2 (de) Elektronische Temperaturmeßschaltung
EP3701274B1 (de) Verfahren zum betrieb eines batteriesensors und batteriesensor
DE2630959C2 (de) Kilowattstundenzähler mit statischem Meßwerk
EP0126846B1 (de) Induktiver Sensor
DE19781050B4 (de) Diagnoseverfahren und -vorrichtung für Trockenelektrolyt-Gasanalysator
DE2303936C2 (de) Drehmomentmesser
EP0447928A1 (de) Verfahren und Batterieprüfgerät zum Bestimmen des Zustands einer Bleibatterie
EP0240598B1 (de) System zur Füllstandsmessung
DE4311614A1 (de) Meßinstrument
CH666748A5 (de) Elektrische waage.
EP0377600B1 (de) Verfahren, anwendung desselben und vorrichtung zur lambdawerterfassung
DE10134680A1 (de) Schaltungsanrdnung für einen kapazitiven Sensor
DE3601675A1 (de) Mehrbereichsmesstaugliches elektronisches thermometer
EP1391742A2 (de) Überwachungseinrichtung und Verfahren zur Ermittlung des Betriebszustands einer Speicherbatterie
DE2546163C2 (de) Elektronische Schaltungsanordnung zur Temperaturmessung
DE2937227C2 (de) Verfahren zum Eichen eines elektrometrischen pH-Meßgeräts und eine Vorrichtung zur Durchführung des Verfahrens
DE1498819C3 (de) Vorrichtung zur Bestimmung einer charakteristischen Eigenschaft eines Materials
DE2507657A1 (de) Wandlersystem
DE3830457C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CH653445A5 (de) Verfahren und einrichtung zur messung eines elektrischen widerstandes.
DE2710782C2 (de) Vorrichtung zur Messung von Temperaturdifferenzen
DE102012102081B3 (de) Integrierender A/D-Wandler
EP0245393A1 (de) Vorrichtung zur bestimmung der basaltemperaturkurve
DE2352692B2 (de) Gerät zur Untersuchung der Herzimpulsfrequenz

Legal Events

Date Code Title Description
OAP Request for examination filed
OD Request for examination
8128 New person/name/address of the agent

Representative=s name: JUNG, E., DIPL.-CHEM. DR.PHIL. SCHIRDEWAHN, J., DI

D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee