CA1114635A - Temperature measurement apparatus - Google Patents

Temperature measurement apparatus

Info

Publication number
CA1114635A
CA1114635A CA317,348A CA317348A CA1114635A CA 1114635 A CA1114635 A CA 1114635A CA 317348 A CA317348 A CA 317348A CA 1114635 A CA1114635 A CA 1114635A
Authority
CA
Canada
Prior art keywords
temperature
sensitive device
voltage
power source
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA317,348A
Other languages
English (en)
French (fr)
Inventor
Hiromasa Ishiwatari
Yoshinori Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Application granted granted Critical
Publication of CA1114635A publication Critical patent/CA1114635A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
    • G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/20—Compensating for effects of temperature changes other than those to be measured, e.g. changes in ambient temperature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
CA317,348A 1977-12-05 1978-12-04 Temperature measurement apparatus Expired CA1114635A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPSHO52-146295 1977-12-05
JP14629577A JPS5479085A (en) 1977-12-05 1977-12-05 Temperature measuring apparatus

Publications (1)

Publication Number Publication Date
CA1114635A true CA1114635A (en) 1981-12-22

Family

ID=15404440

Family Applications (1)

Application Number Title Priority Date Filing Date
CA317,348A Expired CA1114635A (en) 1977-12-05 1978-12-04 Temperature measurement apparatus

Country Status (5)

Country Link
US (1) US4210024A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5479085A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CA (1) CA1114635A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE2852570C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB2010487B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

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EP4113084A4 (en) * 2020-12-29 2023-08-16 Crm Icbg (Wuxi) Co., Ltd. PREDICTIVE ELECTRONIC BODY TEMPERATURE THERMOMETER CIRCUIT STRUCTURE WITH TEMPERATURE COMPENSATION

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US5725308A (en) * 1994-12-23 1998-03-10 Rtd Technology, Inc. Quick registering thermometer
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US5833365A (en) * 1995-03-24 1998-11-10 Interuniversitair Micro-Electronika Centrum Vzw Method for local temperature sensing for use in performing high resolution in-situ parameter measurements
US5678925A (en) * 1995-10-16 1997-10-21 Garmaise; Ian Temperature sensing and indicating beverage mug
US5795068A (en) * 1996-08-30 1998-08-18 Xilinx, Inc. Method and apparatus for measuring localized temperatures and voltages on integrated circuits
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DE10138806C1 (de) * 2001-08-14 2002-12-19 Bosch Gmbh Robert Ermittlung der Temperatur eines Abgassensors mittels kalibrierter Innenwiderstandsmessung
US6749335B2 (en) * 2002-05-17 2004-06-15 Sun Microsystems, Inc. Adjustment and calibration system for post-fabrication treatment of on-chip temperature sensor
US20040071182A1 (en) * 2002-10-11 2004-04-15 Welch Allyn, Inc. Thermometry probe calibration method
US6971790B2 (en) * 2002-10-11 2005-12-06 Welch Allyn, Inc. Thermometry probe calibration method
US6874933B1 (en) * 2002-10-15 2005-04-05 National Semiconductor Corporation Apparatus for digital temperature measurement in an integrated circuit
US6948846B2 (en) * 2003-10-23 2005-09-27 Eaton Corporation Test apparatus for power circuits of an electrical distribution device
US7447607B2 (en) * 2004-08-31 2008-11-04 Watow Electric Manufacturing System and method of compensation for device mounting and thermal transfer error
US7911339B2 (en) 2005-10-18 2011-03-22 Apple Inc. Shoe wear-out sensor, body-bar sensing system, unitless activity assessment and associated methods
US7643895B2 (en) 2006-05-22 2010-01-05 Apple Inc. Portable media device with workout support
US20070271116A1 (en) 2006-05-22 2007-11-22 Apple Computer, Inc. Integrated media jukebox and physiologic data handling application
US8073984B2 (en) 2006-05-22 2011-12-06 Apple Inc. Communication protocol for use with portable electronic devices
US9137309B2 (en) 2006-05-22 2015-09-15 Apple Inc. Calibration techniques for activity sensing devices
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US8182139B2 (en) * 2008-05-30 2012-05-22 Apple Inc. Calibration of temperature sensing circuitry in an electronic device
KR101520358B1 (ko) * 2008-12-09 2015-05-14 삼성전자주식회사 온도변화에 따른 출력특성을 보상한 온도감지기 및 온도보상방법
US8351289B1 (en) 2009-12-30 2013-01-08 Micron Technology, Inc. Apparatuses and methods for sensing a phase-change test cell and determining changes to the test cell resistance due to thermal exposure
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US9835574B2 (en) 2014-07-02 2017-12-05 Stmicroelectronics S.R.L. Gas measurement device and measurement method thereof
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ITUA20164320A1 (it) 2016-06-13 2017-12-13 St Microelectronics Srl Ponte sensore con resistori commutati, sistema e procedimento corrispondenti
TWI698130B (zh) * 2018-12-20 2020-07-01 瑞昱半導體股份有限公司 溫度計算參數提供電路、溫度計算參數提供方法以及溫度監控方法
RU2738198C1 (ru) * 2019-11-22 2020-12-09 Акционерное общество "Государственный космический научно-производственный центр им. М.В. Хруничева" Способ снижения погрешности измерения температуры электрическим мостом и измерительный мост Уитстона-Капиноса

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JPS5833490B2 (ja) * 1976-12-03 1983-07-20 株式会社東芝 温度測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4113084A4 (en) * 2020-12-29 2023-08-16 Crm Icbg (Wuxi) Co., Ltd. PREDICTIVE ELECTRONIC BODY TEMPERATURE THERMOMETER CIRCUIT STRUCTURE WITH TEMPERATURE COMPENSATION

Also Published As

Publication number Publication date
GB2010487A (en) 1979-06-27
JPS5479085A (en) 1979-06-23
US4210024A (en) 1980-07-01
GB2010487B (en) 1982-10-13
JPS6310370B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-03-07
DE2852570A1 (de) 1979-06-07
DE2852570C2 (de) 1984-10-04

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Legal Events

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