DE2627987A1 - Ionenimplantationsvorrichtung - Google Patents

Ionenimplantationsvorrichtung

Info

Publication number
DE2627987A1
DE2627987A1 DE19762627987 DE2627987A DE2627987A1 DE 2627987 A1 DE2627987 A1 DE 2627987A1 DE 19762627987 DE19762627987 DE 19762627987 DE 2627987 A DE2627987 A DE 2627987A DE 2627987 A1 DE2627987 A1 DE 2627987A1
Authority
DE
Germany
Prior art keywords
ion
source electrode
source
openings
beams
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19762627987
Other languages
German (de)
English (en)
Inventor
Wen Chuang Ko
Albert Schien
James Robert Winnard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE2627987A1 publication Critical patent/DE2627987A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Physical Vapour Deposition (AREA)
DE19762627987 1975-06-30 1976-06-23 Ionenimplantationsvorrichtung Withdrawn DE2627987A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/592,149 US3999097A (en) 1975-06-30 1975-06-30 Ion implantation apparatus utilizing multiple aperture source plate and single aperture accel-decel system

Publications (1)

Publication Number Publication Date
DE2627987A1 true DE2627987A1 (de) 1977-01-20

Family

ID=24369503

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19762627987 Withdrawn DE2627987A1 (de) 1975-06-30 1976-06-23 Ionenimplantationsvorrichtung

Country Status (6)

Country Link
US (1) US3999097A (enExample)
JP (1) JPS525263A (enExample)
DE (1) DE2627987A1 (enExample)
FR (1) FR2316724A1 (enExample)
GB (1) GB1492016A (enExample)
IT (1) IT1064307B (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0002472A3 (en) * 1977-12-08 1979-09-05 International Business Machines Corporation Device and method for making doped semiconductor layers
DE3018623A1 (de) * 1980-05-16 1982-01-28 Kernforschungsanlage Jülich GmbH, 5170 Jülich Beschleunigungsgitter
EP0135366A1 (en) * 1983-08-15 1985-03-27 Applied Materials, Inc. System and method for ion implantation

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4371774A (en) * 1980-11-26 1983-02-01 The United States Of America As Represented By The United States Department Of Energy High power linear pulsed beam annealer
US4465934A (en) * 1981-01-23 1984-08-14 Veeco Instruments Inc. Parallel charged particle beam exposure system
US4447773A (en) * 1981-06-22 1984-05-08 California Institute Of Technology Ion beam accelerator system
US4578589A (en) * 1983-08-15 1986-03-25 Applied Materials, Inc. Apparatus and methods for ion implantation
JPH0744027B2 (ja) * 1986-04-28 1995-05-15 日新電機株式会社 イオン処理装置
JPS63146337A (ja) * 1986-12-08 1988-06-18 Fuji Electric Co Ltd イオンビ−ム装置
JP2569613B2 (ja) * 1987-10-27 1997-01-08 日新電機株式会社 イオン注入装置
DE3838947A1 (de) * 1987-11-20 1989-06-01 Osaka Prefecture Ionenquelle
GB2224752B (en) * 1988-11-10 1992-08-05 Stc Plc Film deposition
US5023458A (en) * 1989-01-04 1991-06-11 Eaton Corporation Ion beam control system
US7528391B2 (en) * 2006-12-22 2009-05-05 Varian Semiconductor Equipment Associates, Inc. Techniques for reducing contamination during ion implantation
US9587292B2 (en) * 2009-10-01 2017-03-07 Advanced Applied Physics Solutions, Inc. Method and apparatus for isolating the radioisotope molybdenum-99
CN104091746A (zh) * 2014-06-30 2014-10-08 京东方科技集团股份有限公司 一种离子注入设备用电极和离子注入设备
CN111033689B (zh) * 2017-06-27 2023-07-28 彼得·F·范德莫伊伦 用于等离子体沉积和处理的方法及系统
CN111199858B (zh) * 2018-11-20 2023-09-05 中国电子科技集团公司第四十八研究所 一种成形宽带离子束注入机
WO2021183373A1 (en) 2020-03-13 2021-09-16 Vandermeulen Peter F Methods and systems for medical plasma treatment and generation of plasma activated media

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3394217A (en) * 1965-06-11 1968-07-23 Air Reduction Method and apparatus for controlling plural electron beams
US3491236A (en) * 1967-09-28 1970-01-20 Gen Electric Electron beam fabrication of microelectronic circuit patterns
US3756862A (en) * 1971-12-21 1973-09-04 Ibm Proton enhanced diffusion methods
US3770934A (en) * 1971-10-29 1973-11-06 Machlett Lab Inc Electron beam heating apparatus

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3117022A (en) * 1960-09-06 1964-01-07 Space Technhology Lab Inc Deposition arrangement
US3406305A (en) * 1965-07-05 1968-10-15 Lokomotivbau Elektrotechnisch High power electron gun with electron bombarded apertured cathode having a concave emission surface
US3434894A (en) * 1965-10-06 1969-03-25 Ion Physics Corp Fabricating solid state devices by ion implantation
US3585397A (en) * 1968-10-04 1971-06-15 Hughes Aircraft Co Programmed fine ion implantation beam system
US3558967A (en) * 1969-06-16 1971-01-26 Varian Associates Linear beam tube with plural cathode beamlets providing a convergent electron stream
US3748514A (en) * 1971-08-18 1973-07-24 A Standaart Multi-beam cathode ray tube character display
AT344287B (de) * 1972-03-30 1978-07-10 Kyoto Electronics Mfg Verfahren zur bestimmung der dichte einer flüssigkeit in einer schwingröhre

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3394217A (en) * 1965-06-11 1968-07-23 Air Reduction Method and apparatus for controlling plural electron beams
US3491236A (en) * 1967-09-28 1970-01-20 Gen Electric Electron beam fabrication of microelectronic circuit patterns
US3770934A (en) * 1971-10-29 1973-11-06 Machlett Lab Inc Electron beam heating apparatus
US3756862A (en) * 1971-12-21 1973-09-04 Ibm Proton enhanced diffusion methods

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0002472A3 (en) * 1977-12-08 1979-09-05 International Business Machines Corporation Device and method for making doped semiconductor layers
DE3018623A1 (de) * 1980-05-16 1982-01-28 Kernforschungsanlage Jülich GmbH, 5170 Jülich Beschleunigungsgitter
EP0135366A1 (en) * 1983-08-15 1985-03-27 Applied Materials, Inc. System and method for ion implantation

Also Published As

Publication number Publication date
US3999097A (en) 1976-12-21
JPS541627B2 (enExample) 1979-01-26
FR2316724A1 (fr) 1977-01-28
FR2316724B1 (enExample) 1978-11-17
JPS525263A (en) 1977-01-14
GB1492016A (en) 1977-11-16
IT1064307B (it) 1985-02-18

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8139 Disposal/non-payment of the annual fee