DE2613490C3 - Verfahren zum Entfernen von Vorsprüngen von der Oberfläche einer Halbleiterschicht - Google Patents

Verfahren zum Entfernen von Vorsprüngen von der Oberfläche einer Halbleiterschicht

Info

Publication number
DE2613490C3
DE2613490C3 DE2613490A DE2613490A DE2613490C3 DE 2613490 C3 DE2613490 C3 DE 2613490C3 DE 2613490 A DE2613490 A DE 2613490A DE 2613490 A DE2613490 A DE 2613490A DE 2613490 C3 DE2613490 C3 DE 2613490C3
Authority
DE
Germany
Prior art keywords
protrusions
projections
dielectric layer
layer
semiconductor layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2613490A
Other languages
German (de)
English (en)
Other versions
DE2613490A1 (de
DE2613490B2 (de
Inventor
Lewis Emanuel Allentown Pa. Katz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of DE2613490A1 publication Critical patent/DE2613490A1/de
Publication of DE2613490B2 publication Critical patent/DE2613490B2/de
Application granted granted Critical
Publication of DE2613490C3 publication Critical patent/DE2613490C3/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H10P95/06—Planarisation of inorganic insulating materials
    • H10P95/062—Planarisation of inorganic insulating materials involving a dielectric removal step
    • H10P95/064—Planarisation of inorganic insulating materials involving a dielectric removal step the removal being chemical etching
    • H10P95/066—Planarisation of inorganic insulating materials involving a dielectric removal step the removal being chemical etching the removal being a selective chemical etching step, e.g. selective dry etching through a mask
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00—Etching of wafers, substrates or parts of devices
    • H10P50/69—Etching of wafers, substrates or parts of devices using masks for semiconductor materials
    • H10P50/691—Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials
    • H10P50/693—Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials characterised by their size, orientation, disposition, behaviour or shape, in horizontal or vertical plane
    • H10P50/695—Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials characterised by their size, orientation, disposition, behaviour or shape, in horizontal or vertical plane characterised by the process involved to create the mask, e.g. lift-off masks or sidewalls or to modify the mask
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/017—Clean surfaces
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/051—Etching
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00—Metal treatment
    • Y10S148/106—Masks, special

Landscapes

  • Weting (AREA)
  • Formation Of Insulating Films (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
DE2613490A 1975-03-31 1976-03-30 Verfahren zum Entfernen von Vorsprüngen von der Oberfläche einer Halbleiterschicht Expired DE2613490C3 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/563,722 US3990925A (en) 1975-03-31 1975-03-31 Removal of projections on epitaxial layers

Publications (3)

Publication Number Publication Date
DE2613490A1 DE2613490A1 (de) 1976-10-14
DE2613490B2 DE2613490B2 (de) 1978-04-13
DE2613490C3 true DE2613490C3 (de) 1981-10-08

Family

ID=24251640

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2613490A Expired DE2613490C3 (de) 1975-03-31 1976-03-30 Verfahren zum Entfernen von Vorsprüngen von der Oberfläche einer Halbleiterschicht

Country Status (7)

Country Link
US (1) US3990925A (ref)
JP (1) JPS51121266A (ref)
CA (1) CA1042115A (ref)
DE (1) DE2613490C3 (ref)
FR (1) FR2306529A1 (ref)
GB (1) GB1537306A (ref)
IT (1) IT1058695B (ref)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5244173A (en) * 1975-10-06 1977-04-06 Hitachi Ltd Method of flat etching of silicon substrate
JPS5527686A (en) * 1978-08-21 1980-02-27 Sony Corp Projection eliminating device
JPS5612723A (en) * 1979-07-11 1981-02-07 Fujitsu Ltd Manufacture of semiconductor device
JPS56114315A (en) * 1980-02-14 1981-09-08 Fujitsu Ltd Manufacture of semiconductor device
JPS57115824A (en) * 1981-01-10 1982-07-19 Nec Home Electronics Ltd Removing epitaxial layer mound
DE3524765A1 (de) * 1985-07-11 1987-01-22 Licentia Gmbh Verfahren zum herstellen einer durchsichtphotokathode
JPS62128516A (ja) * 1985-11-29 1987-06-10 Shin Etsu Handotai Co Ltd 半導体ウエ−ハの突起物除去方法
DE3721940A1 (de) * 1987-07-02 1989-01-12 Ibm Deutschland Entfernen von partikeln von oberflaechen fester koerper durch laserbeschuss
JP3060714B2 (ja) * 1992-04-15 2000-07-10 日本電気株式会社 半導体集積回路の製造方法
JP2011096935A (ja) * 2009-10-30 2011-05-12 Fujifilm Corp エピタキシャルウエハ、エピタキシャルウエハの製造方法、発光素子ウエハ、発光素子ウエハの製造方法、及び発光素子
FR2994615A1 (fr) * 2012-08-14 2014-02-21 Commissariat Energie Atomique Procede de planarisation d'une couche epitaxiee
KR102646643B1 (ko) 2017-09-14 2024-03-12 신에쓰 가가꾸 고교 가부시끼가이샤 수중유형 유화 조성물의 제조 방법 및 화장료
JP2019090956A (ja) * 2017-11-16 2019-06-13 旭化成エレクトロニクス株式会社 光学素子の製造方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1652225A1 (de) * 1967-08-21 1971-04-22 Halbleiterwerk Frankfurt Oder Verfahren zum Abtragen und Polieren von Halbleiterkoerpern,insbesondere Silizium-Einkristallscheiben
US3656671A (en) * 1970-03-16 1972-04-18 Ibm Frangible projection removal
US3699644A (en) * 1971-01-04 1972-10-24 Sylvania Electric Prod Method of dividing wafers
US3783044A (en) * 1971-04-09 1974-01-01 Motorola Inc Photoresist keys and depth indicator
US3718514A (en) * 1971-05-28 1973-02-27 Bell Telephone Labor Inc Removal of projections on epitaxial layers
BE789090A (fr) * 1971-09-22 1973-01-15 Western Electric Co Procede et solution d'attaque de semi-conducteurs
US3838501A (en) * 1973-02-09 1974-10-01 Honeywell Inf Systems Method in microcircuit package assembly providing nonabrasive, electrically passive edges on integrated circuit chips

Also Published As

Publication number Publication date
GB1537306A (en) 1978-12-29
CA1042115A (en) 1978-11-07
FR2306529B1 (ref) 1978-05-19
IT1058695B (it) 1982-05-10
FR2306529A1 (fr) 1976-10-29
USB563722I5 (ref) 1976-01-13
US3990925A (en) 1976-11-09
DE2613490A1 (de) 1976-10-14
JPS51121266A (en) 1976-10-23
DE2613490B2 (de) 1978-04-13
JPS5533176B2 (ref) 1980-08-29

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
8339 Ceased/non-payment of the annual fee