DE2544102A1 - Verfahren und vorrichtung zur fehlerauffindung an werkstuecken mittels optischer abtastung - Google Patents

Verfahren und vorrichtung zur fehlerauffindung an werkstuecken mittels optischer abtastung

Info

Publication number
DE2544102A1
DE2544102A1 DE19752544102 DE2544102A DE2544102A1 DE 2544102 A1 DE2544102 A1 DE 2544102A1 DE 19752544102 DE19752544102 DE 19752544102 DE 2544102 A DE2544102 A DE 2544102A DE 2544102 A1 DE2544102 A1 DE 2544102A1
Authority
DE
Germany
Prior art keywords
signal
error
stage
output
width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19752544102
Other languages
German (de)
English (en)
Inventor
Kuniomi Abe
Yoshizo Ikegami
Seijiro Kushibe
Tsunemasa Okada
Takao Yoshinaga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konan Camera Research Institue Inc
Original Assignee
Konan Camera Research Institue Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konan Camera Research Institue Inc filed Critical Konan Camera Research Institue Inc
Publication of DE2544102A1 publication Critical patent/DE2544102A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/83—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields
    • G01N27/84—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields by applying magnetic powder or magnetic ink

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
DE19752544102 1974-10-02 1975-10-02 Verfahren und vorrichtung zur fehlerauffindung an werkstuecken mittels optischer abtastung Withdrawn DE2544102A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP49114144A JPS5140975A (en) 1974-10-02 1974-10-02 Jidotanshohoho oyobi sochi

Publications (1)

Publication Number Publication Date
DE2544102A1 true DE2544102A1 (de) 1976-04-08

Family

ID=14630235

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19752544102 Withdrawn DE2544102A1 (de) 1974-10-02 1975-10-02 Verfahren und vorrichtung zur fehlerauffindung an werkstuecken mittels optischer abtastung

Country Status (3)

Country Link
US (1) US3988530A (enExample)
JP (1) JPS5140975A (enExample)
DE (1) DE2544102A1 (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2360882A1 (fr) * 1976-07-31 1978-03-03 Deutsch Pruef Messgeraete Procede et dispositif pour la saisie et l'appreciation automatique d'indications optiques de fissures a la surface de pieces
DE2648694A1 (de) * 1976-10-27 1978-05-03 Foerster Inst Dr Friedrich Verfahren und einrichtung zum pruefen von halbzeug
DE3150303A1 (de) * 1980-12-22 1982-08-12 Hoxan Corp., Sapporo, Hokkaido Magnetpulver-schweissfehlerdetektorsystem
DE3234616A1 (de) * 1982-03-22 1983-09-29 Mecapec S.A., 8716 Schmerikon Verfahren und einrichtung zur magnetischen materialfehlerdetektion
EP0309758A3 (en) * 1987-09-23 1990-03-07 Kurt Dr. Sauerwein Procedure and facility for determination and evaluation of surface cracks on workpieces

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49129512A (enExample) * 1973-04-13 1974-12-11
US4118732A (en) * 1977-02-15 1978-10-03 Nippon Steel Corporation Apparatus for detecting a surface flaw of a material at high temperature
SE404964B (sv) * 1977-03-22 1978-11-06 Sarlos Seppo Edvard Anordning for detektering av stralning fran ett foremal for faststellande av avvikelser eller fel hos en yta av detsamma
FR2402868A1 (fr) * 1977-09-12 1979-04-06 Usinor Procede et appareil de detection de defauts de surface sur une bande defilant a grande vitesse
US4152723A (en) * 1977-12-19 1979-05-01 Sperry Rand Corporation Method of inspecting circuit boards and apparatus therefor
JPS5677704A (en) * 1979-11-30 1981-06-26 Hitachi Ltd Inspection system for surface defect of substance
EP0090190A1 (de) * 1982-03-22 1983-10-05 Mecapec S.A. Verfahren und Einrichtung zur magnetischen Materialfehlerdetektion
US4692799A (en) * 1982-04-05 1987-09-08 Showa Electric Wire & Cable Co., Ltd. Automatic inspection system for detecting foreign matter
DE3734294A1 (de) * 1987-10-09 1989-04-27 Sick Optik Elektronik Erwin Optische oberflaechen-inspektionsvorrichtung
JPH01143945A (ja) * 1987-11-30 1989-06-06 Fuji Photo Film Co Ltd テープ欠陥検出方法
US4951223A (en) * 1989-03-28 1990-08-21 Langdon Wales R Web material inspection system
US5204912A (en) * 1990-02-26 1993-04-20 Gerber Systems Corporation Defect verification and marking system for use with printed circuit boards
JPH0443784A (ja) * 1990-06-11 1992-02-13 Matsushita Electric Ind Co Ltd 磁気記録信号測定方法及び装置
JP2999341B2 (ja) * 1993-03-04 2000-01-17 オプテックス株式会社 ホットメルト付着品質判定方法及び装置
WO2000060344A1 (fr) * 1999-03-31 2000-10-12 Hitachi, Ltd. Procede et appareil d'essai non destructif
US6459448B1 (en) 2000-04-19 2002-10-01 K-G Devices Corporation System and method for automatically inspecting arrays of geometric targets
US7064309B2 (en) 2001-09-17 2006-06-20 The Boeing Company Method for detecting foreign object debris
JP2004266458A (ja) * 2003-02-28 2004-09-24 Shimadzu Corp 撮影装置、および、同期撮影タイミング制御器
CZ305330B6 (cs) * 2010-11-19 2015-08-05 tarman Stanislav Ĺ Zkušební zařízení pro zjišťování vad rotačních kovových těles magnetickou práškovou metodou
JP2019516191A (ja) * 2016-05-03 2019-06-13 レオニ カーベル ゲーエムベーハー 操作者の強調された視認のための色の区分けを備える映像システム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2798605A (en) * 1950-07-12 1957-07-09 Tele Tect Corp Electronic inspection apparatus
US2803755A (en) * 1954-12-16 1957-08-20 Gen Electric Automatic inspection gage
US3019347A (en) * 1959-11-23 1962-01-30 Jones & Laughlin Steel Corp Electronic surface inspection system
US3020034A (en) * 1959-11-23 1962-02-06 Jones & Laughlin Steel Corp Inspection and control system
US3379829A (en) * 1964-04-14 1968-04-23 Itt Flaw detection apparatus
US3889053A (en) * 1973-10-30 1975-06-10 Westinghouse Electric Corp Contactless test system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2360882A1 (fr) * 1976-07-31 1978-03-03 Deutsch Pruef Messgeraete Procede et dispositif pour la saisie et l'appreciation automatique d'indications optiques de fissures a la surface de pieces
DE2648694A1 (de) * 1976-10-27 1978-05-03 Foerster Inst Dr Friedrich Verfahren und einrichtung zum pruefen von halbzeug
DE3150303A1 (de) * 1980-12-22 1982-08-12 Hoxan Corp., Sapporo, Hokkaido Magnetpulver-schweissfehlerdetektorsystem
DE3234616A1 (de) * 1982-03-22 1983-09-29 Mecapec S.A., 8716 Schmerikon Verfahren und einrichtung zur magnetischen materialfehlerdetektion
EP0309758A3 (en) * 1987-09-23 1990-03-07 Kurt Dr. Sauerwein Procedure and facility for determination and evaluation of surface cracks on workpieces

Also Published As

Publication number Publication date
JPS5734500B2 (enExample) 1982-07-23
JPS5140975A (en) 1976-04-06
US3988530A (en) 1976-10-26

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Legal Events

Date Code Title Description
8141 Disposal/no request for examination