DE2523660C3 - Vorrichtung zum Nachweis von Gasen und Dämpfen - Google Patents
Vorrichtung zum Nachweis von Gasen und DämpfenInfo
- Publication number
- DE2523660C3 DE2523660C3 DE19752523660 DE2523660A DE2523660C3 DE 2523660 C3 DE2523660 C3 DE 2523660C3 DE 19752523660 DE19752523660 DE 19752523660 DE 2523660 A DE2523660 A DE 2523660A DE 2523660 C3 DE2523660 C3 DE 2523660C3
- Authority
- DE
- Germany
- Prior art keywords
- electrode
- vapors
- gases
- support body
- ion current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000007789 gas Substances 0.000 title claims description 17
- 238000001514 detection method Methods 0.000 title claims description 9
- 238000004804 winding Methods 0.000 claims description 4
- 239000000919 ceramic Substances 0.000 claims description 3
- 150000002500 ions Chemical class 0.000 description 26
- 239000002585 base Substances 0.000 description 11
- 229910052736 halogen Inorganic materials 0.000 description 8
- 150000002367 halogens Chemical class 0.000 description 8
- 230000032683 aging Effects 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000003513 alkali Substances 0.000 description 2
- 150000001340 alkali metals Chemical class 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 230000037237 body shape Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002366 halogen compounds Chemical class 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/16—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using electric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
- G01M3/22—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators
- G01M3/226—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/40—Investigating fluid-tightness of structures by using electric means, e.g. by observing electric discharges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
- G01N27/70—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas and measuring current or voltage
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CH994774A CH580809A5 (OSRAM) | 1974-07-18 | 1974-07-18 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| DE2523660A1 DE2523660A1 (de) | 1976-01-29 |
| DE2523660B2 DE2523660B2 (de) | 1978-05-18 |
| DE2523660C3 true DE2523660C3 (de) | 1979-01-18 |
Family
ID=4357413
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19752523660 Expired DE2523660C3 (de) | 1974-07-18 | 1975-05-28 | Vorrichtung zum Nachweis von Gasen und Dämpfen |
Country Status (5)
| Country | Link |
|---|---|
| CH (1) | CH580809A5 (OSRAM) |
| DE (1) | DE2523660C3 (OSRAM) |
| FR (1) | FR2279100A1 (OSRAM) |
| GB (1) | GB1472358A (OSRAM) |
| NL (1) | NL162742C (OSRAM) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101726523B (zh) * | 2009-12-01 | 2013-04-03 | 福州大学 | 温度调制柱端安培检测电极及其制造方法 |
-
1974
- 1974-07-18 CH CH994774A patent/CH580809A5/xx not_active IP Right Cessation
- 1974-10-04 NL NL7413135A patent/NL162742C/xx not_active IP Right Cessation
-
1975
- 1975-05-28 DE DE19752523660 patent/DE2523660C3/de not_active Expired
- 1975-05-29 GB GB2342275A patent/GB1472358A/en not_active Expired
- 1975-06-19 FR FR7519199A patent/FR2279100A1/fr active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| GB1472358A (en) | 1977-05-04 |
| DE2523660A1 (de) | 1976-01-29 |
| NL162742C (nl) | 1980-06-16 |
| CH580809A5 (OSRAM) | 1976-10-15 |
| DE2523660B2 (de) | 1978-05-18 |
| FR2279100A1 (fr) | 1976-02-13 |
| NL162742B (nl) | 1980-01-15 |
| FR2279100B1 (OSRAM) | 1980-04-18 |
| NL7413135A (nl) | 1976-01-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C3 | Grant after two publication steps (3rd publication) | ||
| 8339 | Ceased/non-payment of the annual fee |