DE2507664C3 - Präparathalter für ein Röntgendiffraktionsgerät - Google Patents
Präparathalter für ein RöntgendiffraktionsgerätInfo
- Publication number
- DE2507664C3 DE2507664C3 DE2507664A DE2507664A DE2507664C3 DE 2507664 C3 DE2507664 C3 DE 2507664C3 DE 2507664 A DE2507664 A DE 2507664A DE 2507664 A DE2507664 A DE 2507664A DE 2507664 C3 DE2507664 C3 DE 2507664C3
- Authority
- DE
- Germany
- Prior art keywords
- specimen
- specimen holder
- beryllium
- window
- preparation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000002441 X-ray diffraction Methods 0.000 title claims description 4
- 238000002360 preparation method Methods 0.000 claims description 23
- 229910052790 beryllium Inorganic materials 0.000 claims description 15
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 7
- 238000004458 analytical method Methods 0.000 claims description 3
- 230000001143 conditioned effect Effects 0.000 claims description 3
- 230000005855 radiation Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 description 6
- 239000007789 gas Substances 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000003750 conditioning effect Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000001627 detrimental effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL7403065A NL7403065A (nl) | 1974-03-07 | 1974-03-07 | Preparaathouder voor een roentgendiffraktieappa- raat. |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| DE2507664A1 DE2507664A1 (de) | 1975-09-11 |
| DE2507664B2 DE2507664B2 (de) | 1978-10-26 |
| DE2507664C3 true DE2507664C3 (de) | 1979-07-05 |
Family
ID=19820901
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2507664A Expired DE2507664C3 (de) | 1974-03-07 | 1975-02-22 | Präparathalter für ein Röntgendiffraktionsgerät |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US3973120A (en, 2012) |
| JP (1) | JPS50123385A (en, 2012) |
| BE (1) | BE826337A (en, 2012) |
| DE (1) | DE2507664C3 (en, 2012) |
| FR (1) | FR2263512B1 (en, 2012) |
| GB (1) | GB1500938A (en, 2012) |
| IT (1) | IT1030267B (en, 2012) |
| NL (1) | NL7403065A (en, 2012) |
| SE (1) | SE7502376L (en, 2012) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5954844U (ja) * | 1982-10-04 | 1984-04-10 | 三井東圧化学株式会社 | Ｘ線分析用試料ホルダ− |
| US5181233A (en) * | 1991-11-08 | 1993-01-19 | Florida State University | Specimen holder |
| US5350923A (en) * | 1992-02-06 | 1994-09-27 | Northern Telecom Limited | Apparatus for use with analytical measuring instruments using electromagnetic radiation analysis methods |
| US5627872A (en) * | 1995-02-03 | 1997-05-06 | Northrop Grumman Corporation | Stationary exit window for X-ray lithography beamline |
| DE10322040A1 (de) * | 2003-05-16 | 2004-12-09 | Forschungszentrum Karlsruhe Gmbh | Koppel- und Justiervorrichtung für ein Röntgendiffraktometer |
| ES2378045B1 (es) * | 2009-04-13 | 2013-02-15 | Consejo Superior De Investigaciones Científicas (Csic) | Dispositivo para alojar una muestra en el interior de una cámara de dispersion o difracción de rayos x. |
| JP7181603B2 (ja) * | 2019-08-16 | 2022-12-01 | 株式会社リガク | Ｘ線分析用試料保持装置 |
| EP4012390A1 (en) * | 2020-12-11 | 2022-06-15 | Malvern Panalytical B.V. | Sample mounting system for an x-ray analysis apparatus |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3051834A (en) * | 1959-09-16 | 1962-08-28 | Shimula Yoshihiro | Automatic recording system of x-ray diffraction patterns |
-
1974
- 1974-03-07 NL NL7403065A patent/NL7403065A/xx unknown
-
1975
- 1975-02-22 DE DE2507664A patent/DE2507664C3/de not_active Expired
- 1975-02-27 US US05/553,746 patent/US3973120A/en not_active Expired - Lifetime
- 1975-03-04 JP JP50026435A patent/JPS50123385A/ja active Pending
- 1975-03-04 GB GB8894/75A patent/GB1500938A/en not_active Expired
- 1975-03-04 SE SE7502376A patent/SE7502376L/xx unknown
- 1975-03-04 IT IT67550/75A patent/IT1030267B/it active
- 1975-03-05 BE BE154046A patent/BE826337A/xx unknown
- 1975-03-07 FR FR7507201A patent/FR2263512B1/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| SE7502376L (en, 2012) | 1975-09-08 |
| FR2263512A1 (en, 2012) | 1975-10-03 |
| US3973120A (en) | 1976-08-03 |
| JPS50123385A (en, 2012) | 1975-09-27 |
| DE2507664A1 (de) | 1975-09-11 |
| FR2263512B1 (en, 2012) | 1979-10-19 |
| DE2507664B2 (de) | 1978-10-26 |
| NL7403065A (nl) | 1975-09-09 |
| GB1500938A (en) | 1978-02-15 |
| IT1030267B (it) | 1979-03-30 |
| BE826337A (fr) | 1975-09-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C3 | Grant after two publication steps (3rd publication) | ||
| 8339 | Ceased/non-payment of the annual fee |