JPS50123385A - - Google Patents

Info

Publication number
JPS50123385A
JPS50123385A JP50026435A JP2643575A JPS50123385A JP S50123385 A JPS50123385 A JP S50123385A JP 50026435 A JP50026435 A JP 50026435A JP 2643575 A JP2643575 A JP 2643575A JP S50123385 A JPS50123385 A JP S50123385A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50026435A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS50123385A publication Critical patent/JPS50123385A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP50026435A 1974-03-07 1975-03-04 Pending JPS50123385A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7403065A NL7403065A (nl) 1974-03-07 1974-03-07 Preparaathouder voor een roentgendiffraktieappa- raat.

Publications (1)

Publication Number Publication Date
JPS50123385A true JPS50123385A (ja) 1975-09-27

Family

ID=19820901

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50026435A Pending JPS50123385A (ja) 1974-03-07 1975-03-04

Country Status (9)

Country Link
US (1) US3973120A (ja)
JP (1) JPS50123385A (ja)
BE (1) BE826337A (ja)
DE (1) DE2507664C3 (ja)
FR (1) FR2263512B1 (ja)
GB (1) GB1500938A (ja)
IT (1) IT1030267B (ja)
NL (1) NL7403065A (ja)
SE (1) SE7502376L (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5954844U (ja) * 1982-10-04 1984-04-10 三井東圧化学株式会社 X線分析用試料ホルダ−

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5181233A (en) * 1991-11-08 1993-01-19 Florida State University Specimen holder
US5350923A (en) * 1992-02-06 1994-09-27 Northern Telecom Limited Apparatus for use with analytical measuring instruments using electromagnetic radiation analysis methods
US5627872A (en) * 1995-02-03 1997-05-06 Northrop Grumman Corporation Stationary exit window for X-ray lithography beamline
DE10322040A1 (de) * 2003-05-16 2004-12-09 Forschungszentrum Karlsruhe Gmbh Koppel- und Justiervorrichtung für ein Röntgendiffraktometer
ES2378045B1 (es) * 2009-04-13 2013-02-15 Consejo Superior De Investigaciones Científicas (Csic) Dispositivo para alojar una muestra en el interior de una cámara de dispersion o difracción de rayos x.
JP7181603B2 (ja) * 2019-08-16 2022-12-01 株式会社リガク X線分析用試料保持装置
EP4012390A1 (en) * 2020-12-11 2022-06-15 Malvern Panalytical B.V. Sample mounting system for an x-ray analysis apparatus

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3051834A (en) * 1959-09-16 1962-08-28 Shimula Yoshihiro Automatic recording system of x-ray diffraction patterns

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5954844U (ja) * 1982-10-04 1984-04-10 三井東圧化学株式会社 X線分析用試料ホルダ−

Also Published As

Publication number Publication date
DE2507664A1 (de) 1975-09-11
US3973120A (en) 1976-08-03
DE2507664B2 (de) 1978-10-26
GB1500938A (en) 1978-02-15
IT1030267B (it) 1979-03-30
DE2507664C3 (de) 1979-07-05
FR2263512A1 (ja) 1975-10-03
BE826337A (fr) 1975-09-05
NL7403065A (nl) 1975-09-09
FR2263512B1 (ja) 1979-10-19
SE7502376L (ja) 1975-09-08

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