DE2325152A1 - Verfahren zum herstellen von halbleiterstrukturen mittels der planartechnik - Google Patents
Verfahren zum herstellen von halbleiterstrukturen mittels der planartechnikInfo
- Publication number
- DE2325152A1 DE2325152A1 DE2325152A DE2325152A DE2325152A1 DE 2325152 A1 DE2325152 A1 DE 2325152A1 DE 2325152 A DE2325152 A DE 2325152A DE 2325152 A DE2325152 A DE 2325152A DE 2325152 A1 DE2325152 A1 DE 2325152A1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor
- oxidized
- silicon
- dopant
- arsenic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W15/00—Highly-doped buried regions of integrated devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P36/00—Gettering within semiconductor bodies
- H10P36/03—Gettering within semiconductor bodies within silicon bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/40—Treatments of semiconductor bodies to modify their internal properties, e.g. to produce internal imperfections
- H10P95/402—Treatments of semiconductor bodies to modify their internal properties, e.g. to produce internal imperfections of silicon bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/90—Thermal treatments, e.g. annealing or sintering
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W15/00—Highly-doped buried regions of integrated devices
- H10W15/01—Manufacture or treatment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/06—Gettering
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/097—Lattice strain and defects
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/155—Solid solubility
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Bipolar Transistors (AREA)
- Led Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00255468A US3821038A (en) | 1972-05-22 | 1972-05-22 | Method for fabricating semiconductor structures with minimum crystallographic defects |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2325152A1 true DE2325152A1 (de) | 1973-12-06 |
Family
ID=22968459
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2325152A Withdrawn DE2325152A1 (de) | 1972-05-22 | 1973-05-18 | Verfahren zum herstellen von halbleiterstrukturen mittels der planartechnik |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US3821038A (https=) |
| JP (1) | JPS5516373B2 (https=) |
| CA (1) | CA994653A (https=) |
| DE (1) | DE2325152A1 (https=) |
| FR (1) | FR2185858B1 (https=) |
| GB (1) | GB1421444A (https=) |
| IT (1) | IT981609B (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3970431A (en) * | 1974-01-23 | 1976-07-20 | Stanford Research Institute | Carbon monoxide gas detector |
| US4009058A (en) * | 1975-06-16 | 1977-02-22 | Rca Corporation | Method of fabricating large area, high voltage PIN photodiode devices |
| JPS60117665A (ja) * | 1983-11-30 | 1985-06-25 | Toshiba Corp | サイリスタの製造方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2055162A1 (de) * | 1969-11-10 | 1971-05-19 | Ibm | Verfahren zur Isolationsbereichbil dung im Halbleitersubstrat einer monohthi sehen Halbleitervorrichtung |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1288029A (https=) * | 1970-02-07 | 1972-09-06 |
-
1972
- 1972-05-22 US US00255468A patent/US3821038A/en not_active Expired - Lifetime
-
1973
- 1973-03-26 IT IT22096/73A patent/IT981609B/it active
- 1973-04-10 FR FR7313795A patent/FR2185858B1/fr not_active Expired
- 1973-04-13 JP JP4151373A patent/JPS5516373B2/ja not_active Expired
- 1973-04-24 CA CA170,062A patent/CA994653A/en not_active Expired
- 1973-04-30 GB GB2040973A patent/GB1421444A/en not_active Expired
- 1973-05-18 DE DE2325152A patent/DE2325152A1/de not_active Withdrawn
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2055162A1 (de) * | 1969-11-10 | 1971-05-19 | Ibm | Verfahren zur Isolationsbereichbil dung im Halbleitersubstrat einer monohthi sehen Halbleitervorrichtung |
Non-Patent Citations (1)
| Title |
|---|
| Bell System Technical Journal, Bd. 39, 1960, S. 205-233 * |
Also Published As
| Publication number | Publication date |
|---|---|
| GB1421444A (en) | 1976-01-21 |
| IT981609B (it) | 1974-10-10 |
| FR2185858A1 (https=) | 1974-01-04 |
| JPS5516373B2 (https=) | 1980-05-01 |
| CA994653A (en) | 1976-08-10 |
| US3821038A (en) | 1974-06-28 |
| JPS4929064A (https=) | 1974-03-15 |
| FR2185858B1 (https=) | 1977-08-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OD | Request for examination | ||
| 8139 | Disposal/non-payment of the annual fee |