DE2307391A1 - Dickenmessgeraet und verfahren zu seiner eichung - Google Patents

Dickenmessgeraet und verfahren zu seiner eichung

Info

Publication number
DE2307391A1
DE2307391A1 DE19732307391 DE2307391A DE2307391A1 DE 2307391 A1 DE2307391 A1 DE 2307391A1 DE 19732307391 DE19732307391 DE 19732307391 DE 2307391 A DE2307391 A DE 2307391A DE 2307391 A1 DE2307391 A1 DE 2307391A1
Authority
DE
Germany
Prior art keywords
counter
thickness
value
signal
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19732307391
Other languages
German (de)
English (en)
Inventor
Claude Faraguet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Weston Instruments Inc
Original Assignee
Weston Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Weston Instruments Inc filed Critical Weston Instruments Inc
Publication of DE2307391A1 publication Critical patent/DE2307391A1/de
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE19732307391 1972-02-15 1973-02-15 Dickenmessgeraet und verfahren zu seiner eichung Pending DE2307391A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22645772A 1972-02-15 1972-02-15

Publications (1)

Publication Number Publication Date
DE2307391A1 true DE2307391A1 (de) 1973-08-23

Family

ID=22848979

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19732307391 Pending DE2307391A1 (de) 1972-02-15 1973-02-15 Dickenmessgeraet und verfahren zu seiner eichung

Country Status (5)

Country Link
JP (4) JPS6055763B2 (enrdf_load_stackoverflow)
CA (1) CA990417A (enrdf_load_stackoverflow)
DE (1) DE2307391A1 (enrdf_load_stackoverflow)
FR (1) FR2172254B1 (enrdf_load_stackoverflow)
GB (2) GB1427751A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111016830A (zh) * 2019-10-24 2020-04-17 惠州市德赛西威汽车电子股份有限公司 一种电压脉冲防错处理系统及方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4119846A (en) * 1977-02-03 1978-10-10 Sangamo Weston, Inc. Non-contacting gage apparatus and method
US4328697A (en) * 1979-05-23 1982-05-11 Lucas Industries Limited Transducer calibration device
GB2088045B (en) * 1980-10-28 1984-09-26 Coal Industry Patents Ltd Signal processing systems
DE3206832A1 (de) * 1982-02-23 1983-09-01 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Beruehrungsfrei messendes dickenmessgeraet
JPS58150809A (ja) * 1982-02-25 1983-09-07 Toshiba Corp 非接触放射線厚み計及びその校正方法
RU2235974C1 (ru) * 2003-06-18 2004-09-10 Открытое акционерное общество "Новосибирский завод химконцентратов" Устройство для измерения толщины тепловыделяющих элементов

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3180985A (en) * 1962-05-14 1965-04-27 Electronic Automation Systems Standardization of radiation-absorption type density gages
US3524063A (en) * 1967-10-12 1970-08-11 Bethlehem Steel Corp Multirange radiation thickness gauge

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111016830A (zh) * 2019-10-24 2020-04-17 惠州市德赛西威汽车电子股份有限公司 一种电压脉冲防错处理系统及方法
CN111016830B (zh) * 2019-10-24 2023-06-27 惠州市德赛西威汽车电子股份有限公司 一种电压脉冲防错处理系统及方法

Also Published As

Publication number Publication date
JPS6055764B2 (ja) 1985-12-06
JPS5284766A (en) 1977-07-14
GB1427752A (en) 1976-03-10
JPS61274211A (ja) 1986-12-04
CA990417A (en) 1976-06-01
JPS53134469A (en) 1978-11-24
FR2172254B1 (enrdf_load_stackoverflow) 1976-04-09
JPS48104569A (enrdf_load_stackoverflow) 1973-12-27
FR2172254A1 (enrdf_load_stackoverflow) 1973-09-28
JPS6055763B2 (ja) 1985-12-06
GB1427751A (en) 1976-03-10

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Legal Events

Date Code Title Description
OHA Expiration of time for request for examination