JPS6055763B2 - 厚み測定装置 - Google Patents
厚み測定装置Info
- Publication number
- JPS6055763B2 JPS6055763B2 JP48018823A JP1882373A JPS6055763B2 JP S6055763 B2 JPS6055763 B2 JP S6055763B2 JP 48018823 A JP48018823 A JP 48018823A JP 1882373 A JP1882373 A JP 1882373A JP S6055763 B2 JPS6055763 B2 JP S6055763B2
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- analog
- counter
- signal
- digital
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US22645772A | 1972-02-15 | 1972-02-15 | |
| US226457 | 1972-02-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS48104569A JPS48104569A (enrdf_load_stackoverflow) | 1973-12-27 |
| JPS6055763B2 true JPS6055763B2 (ja) | 1985-12-06 |
Family
ID=22848979
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP48018823A Expired JPS6055763B2 (ja) | 1972-02-15 | 1973-02-15 | 厚み測定装置 |
| JP7389876A Pending JPS5284766A (en) | 1972-02-15 | 1976-06-24 | Method of and apparatus for calibrating thickness meter |
| JP53030913A Expired JPS6055764B2 (ja) | 1972-02-15 | 1978-03-17 | 厚み測定装置 |
| JP60155873A Pending JPS61274211A (ja) | 1972-02-15 | 1985-07-15 | 厚み測定装置 |
Family Applications After (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7389876A Pending JPS5284766A (en) | 1972-02-15 | 1976-06-24 | Method of and apparatus for calibrating thickness meter |
| JP53030913A Expired JPS6055764B2 (ja) | 1972-02-15 | 1978-03-17 | 厚み測定装置 |
| JP60155873A Pending JPS61274211A (ja) | 1972-02-15 | 1985-07-15 | 厚み測定装置 |
Country Status (5)
| Country | Link |
|---|---|
| JP (4) | JPS6055763B2 (enrdf_load_stackoverflow) |
| CA (1) | CA990417A (enrdf_load_stackoverflow) |
| DE (1) | DE2307391A1 (enrdf_load_stackoverflow) |
| FR (1) | FR2172254B1 (enrdf_load_stackoverflow) |
| GB (2) | GB1427751A (enrdf_load_stackoverflow) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4119846A (en) * | 1977-02-03 | 1978-10-10 | Sangamo Weston, Inc. | Non-contacting gage apparatus and method |
| US4328697A (en) * | 1979-05-23 | 1982-05-11 | Lucas Industries Limited | Transducer calibration device |
| GB2088045B (en) * | 1980-10-28 | 1984-09-26 | Coal Industry Patents Ltd | Signal processing systems |
| DE3206832A1 (de) * | 1982-02-23 | 1983-09-01 | Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa | Beruehrungsfrei messendes dickenmessgeraet |
| JPS58150809A (ja) * | 1982-02-25 | 1983-09-07 | Toshiba Corp | 非接触放射線厚み計及びその校正方法 |
| RU2235974C1 (ru) * | 2003-06-18 | 2004-09-10 | Открытое акционерное общество "Новосибирский завод химконцентратов" | Устройство для измерения толщины тепловыделяющих элементов |
| CN111016830B (zh) * | 2019-10-24 | 2023-06-27 | 惠州市德赛西威汽车电子股份有限公司 | 一种电压脉冲防错处理系统及方法 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3180985A (en) * | 1962-05-14 | 1965-04-27 | Electronic Automation Systems | Standardization of radiation-absorption type density gages |
| US3524063A (en) * | 1967-10-12 | 1970-08-11 | Bethlehem Steel Corp | Multirange radiation thickness gauge |
-
1973
- 1973-02-14 CA CA163,711A patent/CA990417A/en not_active Expired
- 1973-02-15 DE DE19732307391 patent/DE2307391A1/de active Pending
- 1973-02-15 JP JP48018823A patent/JPS6055763B2/ja not_active Expired
- 1973-02-15 GB GB740373A patent/GB1427751A/en not_active Expired
- 1973-02-15 GB GB4319675A patent/GB1427752A/en not_active Expired
- 1973-02-15 FR FR7305264A patent/FR2172254B1/fr not_active Expired
-
1976
- 1976-06-24 JP JP7389876A patent/JPS5284766A/ja active Pending
-
1978
- 1978-03-17 JP JP53030913A patent/JPS6055764B2/ja not_active Expired
-
1985
- 1985-07-15 JP JP60155873A patent/JPS61274211A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6055764B2 (ja) | 1985-12-06 |
| JPS5284766A (en) | 1977-07-14 |
| DE2307391A1 (de) | 1973-08-23 |
| GB1427752A (en) | 1976-03-10 |
| JPS61274211A (ja) | 1986-12-04 |
| CA990417A (en) | 1976-06-01 |
| JPS53134469A (en) | 1978-11-24 |
| FR2172254B1 (enrdf_load_stackoverflow) | 1976-04-09 |
| JPS48104569A (enrdf_load_stackoverflow) | 1973-12-27 |
| FR2172254A1 (enrdf_load_stackoverflow) | 1973-09-28 |
| GB1427751A (en) | 1976-03-10 |
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