JPH0237523B2 - - Google Patents

Info

Publication number
JPH0237523B2
JPH0237523B2 JP57028125A JP2812582A JPH0237523B2 JP H0237523 B2 JPH0237523 B2 JP H0237523B2 JP 57028125 A JP57028125 A JP 57028125A JP 2812582 A JP2812582 A JP 2812582A JP H0237523 B2 JPH0237523 B2 JP H0237523B2
Authority
JP
Japan
Prior art keywords
thickness
calibration
radiation
range
curve
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57028125A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58150809A (ja
Inventor
Tatsuo Tsujii
Takaaki Okino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57028125A priority Critical patent/JPS58150809A/ja
Publication of JPS58150809A publication Critical patent/JPS58150809A/ja
Publication of JPH0237523B2 publication Critical patent/JPH0237523B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57028125A 1982-02-25 1982-02-25 非接触放射線厚み計及びその校正方法 Granted JPS58150809A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57028125A JPS58150809A (ja) 1982-02-25 1982-02-25 非接触放射線厚み計及びその校正方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57028125A JPS58150809A (ja) 1982-02-25 1982-02-25 非接触放射線厚み計及びその校正方法

Publications (2)

Publication Number Publication Date
JPS58150809A JPS58150809A (ja) 1983-09-07
JPH0237523B2 true JPH0237523B2 (enrdf_load_stackoverflow) 1990-08-24

Family

ID=12240064

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57028125A Granted JPS58150809A (ja) 1982-02-25 1982-02-25 非接触放射線厚み計及びその校正方法

Country Status (1)

Country Link
JP (1) JPS58150809A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014037984A1 (ja) 2012-09-10 2014-03-13 株式会社 東芝 Ｘ線厚さ計
WO2015125178A1 (ja) 2014-02-24 2015-08-27 株式会社 東芝 Ｘ線厚さ計

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63140906A (ja) * 1986-12-04 1988-06-13 Daiwa Can Co Ltd 透視画像による測寸方法
JPS63173907A (ja) * 1987-01-14 1988-07-18 Daiwa Can Co Ltd 缶蓋巻締部の測定方法
JPS63173906A (ja) * 1987-01-14 1988-07-18 Daiwa Can Co Ltd 缶蓋巻締部の測定方法
KR102109286B1 (ko) * 2018-11-30 2020-05-11 주식회사 포스코 전기 강판의 절연층 두께 측정 장치 및 방법

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA990417A (en) * 1972-02-15 1976-06-01 Claude Faraguet Method and apparatus for measuring material thickness
US4119846A (en) * 1977-02-03 1978-10-10 Sangamo Weston, Inc. Non-contacting gage apparatus and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014037984A1 (ja) 2012-09-10 2014-03-13 株式会社 東芝 Ｘ線厚さ計
WO2015125178A1 (ja) 2014-02-24 2015-08-27 株式会社 東芝 Ｘ線厚さ計

Also Published As

Publication number Publication date
JPS58150809A (ja) 1983-09-07

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