JPS48104569A - - Google Patents

Info

Publication number
JPS48104569A
JPS48104569A JP48018823A JP1882373A JPS48104569A JP S48104569 A JPS48104569 A JP S48104569A JP 48018823 A JP48018823 A JP 48018823A JP 1882373 A JP1882373 A JP 1882373A JP S48104569 A JPS48104569 A JP S48104569A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP48018823A
Other languages
Japanese (ja)
Other versions
JPS6055763B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS48104569A publication Critical patent/JPS48104569A/ja
Publication of JPS6055763B2 publication Critical patent/JPS6055763B2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP48018823A 1972-02-15 1973-02-15 厚み測定装置 Expired JPS6055763B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US22645772A 1972-02-15 1972-02-15
US226457 1972-02-15

Publications (2)

Publication Number Publication Date
JPS48104569A true JPS48104569A (enrdf_load_stackoverflow) 1973-12-27
JPS6055763B2 JPS6055763B2 (ja) 1985-12-06

Family

ID=22848979

Family Applications (4)

Application Number Title Priority Date Filing Date
JP48018823A Expired JPS6055763B2 (ja) 1972-02-15 1973-02-15 厚み測定装置
JP7389876A Pending JPS5284766A (en) 1972-02-15 1976-06-24 Method of and apparatus for calibrating thickness meter
JP53030913A Expired JPS6055764B2 (ja) 1972-02-15 1978-03-17 厚み測定装置
JP60155873A Pending JPS61274211A (ja) 1972-02-15 1985-07-15 厚み測定装置

Family Applications After (3)

Application Number Title Priority Date Filing Date
JP7389876A Pending JPS5284766A (en) 1972-02-15 1976-06-24 Method of and apparatus for calibrating thickness meter
JP53030913A Expired JPS6055764B2 (ja) 1972-02-15 1978-03-17 厚み測定装置
JP60155873A Pending JPS61274211A (ja) 1972-02-15 1985-07-15 厚み測定装置

Country Status (5)

Country Link
JP (4) JPS6055763B2 (enrdf_load_stackoverflow)
CA (1) CA990417A (enrdf_load_stackoverflow)
DE (1) DE2307391A1 (enrdf_load_stackoverflow)
FR (1) FR2172254B1 (enrdf_load_stackoverflow)
GB (2) GB1427751A (enrdf_load_stackoverflow)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4119846A (en) * 1977-02-03 1978-10-10 Sangamo Weston, Inc. Non-contacting gage apparatus and method
US4328697A (en) * 1979-05-23 1982-05-11 Lucas Industries Limited Transducer calibration device
GB2088045B (en) * 1980-10-28 1984-09-26 Coal Industry Patents Ltd Signal processing systems
DE3206832A1 (de) * 1982-02-23 1983-09-01 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Beruehrungsfrei messendes dickenmessgeraet
JPS58150809A (ja) * 1982-02-25 1983-09-07 Toshiba Corp 非接触放射線厚み計及びその校正方法
RU2235974C1 (ru) * 2003-06-18 2004-09-10 Открытое акционерное общество "Новосибирский завод химконцентратов" Устройство для измерения толщины тепловыделяющих элементов
CN111016830B (zh) * 2019-10-24 2023-06-27 惠州市德赛西威汽车电子股份有限公司 一种电压脉冲防错处理系统及方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3180985A (en) * 1962-05-14 1965-04-27 Electronic Automation Systems Standardization of radiation-absorption type density gages

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3524063A (en) * 1967-10-12 1970-08-11 Bethlehem Steel Corp Multirange radiation thickness gauge

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3180985A (en) * 1962-05-14 1965-04-27 Electronic Automation Systems Standardization of radiation-absorption type density gages

Also Published As

Publication number Publication date
JPS6055764B2 (ja) 1985-12-06
JPS5284766A (en) 1977-07-14
DE2307391A1 (de) 1973-08-23
GB1427752A (en) 1976-03-10
JPS61274211A (ja) 1986-12-04
CA990417A (en) 1976-06-01
JPS53134469A (en) 1978-11-24
FR2172254B1 (enrdf_load_stackoverflow) 1976-04-09
FR2172254A1 (enrdf_load_stackoverflow) 1973-09-28
JPS6055763B2 (ja) 1985-12-06
GB1427751A (en) 1976-03-10

Similar Documents

Publication Publication Date Title
FR2205929A5 (enrdf_load_stackoverflow)
JPS4982782A (enrdf_load_stackoverflow)
IN140582B (enrdf_load_stackoverflow)
JPS50105601A (enrdf_load_stackoverflow)
FR2172254B1 (enrdf_load_stackoverflow)
JPS5138030Y2 (enrdf_load_stackoverflow)
FR2169340A1 (enrdf_load_stackoverflow)
DK141021C (enrdf_load_stackoverflow)
JPS5429688B2 (enrdf_load_stackoverflow)
JPS5124928B2 (enrdf_load_stackoverflow)
IN141833B (enrdf_load_stackoverflow)
JPS5022543Y2 (enrdf_load_stackoverflow)
JPS579220B2 (enrdf_load_stackoverflow)
CS152243B1 (enrdf_load_stackoverflow)
CS153962B1 (enrdf_load_stackoverflow)
JPS48103415A (enrdf_load_stackoverflow)
CS153293B1 (enrdf_load_stackoverflow)
CS155021B1 (enrdf_load_stackoverflow)
CS154180B1 (enrdf_load_stackoverflow)
CS153971B1 (enrdf_load_stackoverflow)
CH560393A5 (enrdf_load_stackoverflow)
CH571182A5 (enrdf_load_stackoverflow)
CH586600A5 (enrdf_load_stackoverflow)
CH735973A4 (enrdf_load_stackoverflow)
CH599194A5 (enrdf_load_stackoverflow)