GB1427751A - Non-contacting gauging methods and apparatus - Google Patents

Non-contacting gauging methods and apparatus

Info

Publication number
GB1427751A
GB1427751A GB740373A GB740373A GB1427751A GB 1427751 A GB1427751 A GB 1427751A GB 740373 A GB740373 A GB 740373A GB 740373 A GB740373 A GB 740373A GB 1427751 A GB1427751 A GB 1427751A
Authority
GB
United Kingdom
Prior art keywords
thickness
meter
output
standard
standards
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB740373A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Weston Instruments Inc
Original Assignee
Weston Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Weston Instruments Inc filed Critical Weston Instruments Inc
Publication of GB1427751A publication Critical patent/GB1427751A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length Measuring Devices By Optical Means (AREA)
GB740373A 1972-02-15 1973-02-15 Non-contacting gauging methods and apparatus Expired GB1427751A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22645772A 1972-02-15 1972-02-15

Publications (1)

Publication Number Publication Date
GB1427751A true GB1427751A (en) 1976-03-10

Family

ID=22848979

Family Applications (2)

Application Number Title Priority Date Filing Date
GB740373A Expired GB1427751A (en) 1972-02-15 1973-02-15 Non-contacting gauging methods and apparatus
GB4319675A Expired GB1427752A (en) 1972-02-15 1973-02-15 Method and apparatus for measuring material thickness

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB4319675A Expired GB1427752A (en) 1972-02-15 1973-02-15 Method and apparatus for measuring material thickness

Country Status (5)

Country Link
JP (4) JPS6055763B2 (enrdf_load_stackoverflow)
CA (1) CA990417A (enrdf_load_stackoverflow)
DE (1) DE2307391A1 (enrdf_load_stackoverflow)
FR (1) FR2172254B1 (enrdf_load_stackoverflow)
GB (2) GB1427751A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2804454A1 (de) * 1977-02-03 1978-08-24 Sangamo Weston Verfahren zur eichung einer einrichtung zum messen der dicke eines materials
FR2457518A1 (fr) * 1979-05-23 1980-12-19 Lucas Industries Ltd Dispositif de calibrage de transducteur
DE3141564A1 (de) * 1980-10-28 1982-07-29 Coal Industry (Patents) Ltd., London Signalaufbereitungssystem

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3206832A1 (de) * 1982-02-23 1983-09-01 Tokyo Shibaura Denki K.K., Kawasaki, Kanagawa Beruehrungsfrei messendes dickenmessgeraet
JPS58150809A (ja) * 1982-02-25 1983-09-07 Toshiba Corp 非接触放射線厚み計及びその校正方法
RU2235974C1 (ru) * 2003-06-18 2004-09-10 Открытое акционерное общество "Новосибирский завод химконцентратов" Устройство для измерения толщины тепловыделяющих элементов
CN111016830B (zh) * 2019-10-24 2023-06-27 惠州市德赛西威汽车电子股份有限公司 一种电压脉冲防错处理系统及方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3180985A (en) * 1962-05-14 1965-04-27 Electronic Automation Systems Standardization of radiation-absorption type density gages
US3524063A (en) * 1967-10-12 1970-08-11 Bethlehem Steel Corp Multirange radiation thickness gauge

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2804454A1 (de) * 1977-02-03 1978-08-24 Sangamo Weston Verfahren zur eichung einer einrichtung zum messen der dicke eines materials
FR2457518A1 (fr) * 1979-05-23 1980-12-19 Lucas Industries Ltd Dispositif de calibrage de transducteur
DE3141564A1 (de) * 1980-10-28 1982-07-29 Coal Industry (Patents) Ltd., London Signalaufbereitungssystem
US4428618A (en) 1980-10-28 1984-01-31 Coal Industry (Patents) Limited Mining machine control signal processing system

Also Published As

Publication number Publication date
JPS6055764B2 (ja) 1985-12-06
JPS5284766A (en) 1977-07-14
DE2307391A1 (de) 1973-08-23
GB1427752A (en) 1976-03-10
JPS61274211A (ja) 1986-12-04
CA990417A (en) 1976-06-01
JPS53134469A (en) 1978-11-24
FR2172254B1 (enrdf_load_stackoverflow) 1976-04-09
JPS48104569A (enrdf_load_stackoverflow) 1973-12-27
FR2172254A1 (enrdf_load_stackoverflow) 1973-09-28
JPS6055763B2 (ja) 1985-12-06

Similar Documents

Publication Publication Date Title
US3955086A (en) Radiation thickness gauge
GB1284764A (en) Measuring the quantity of fluidic materials in containers
US3729632A (en) Penetrating radiation gauge
GB1427751A (en) Non-contacting gauging methods and apparatus
US4309606A (en) Measuring plate thickness
US4320289A (en) Precision laser pulse radiometer
GB1068166A (en) Method of and apparatus for measuring moisture content of granular materials
US3639763A (en) Device for measuring the thickness of metallic layers utilizing beta ray backscattering
US3180985A (en) Standardization of radiation-absorption type density gages
GB1483251A (en) Wide range radiation gage for determining a material property
EP0090465B1 (en) X-ray analysis apparatus with pulse amplitude shift correction
GB1143941A (en) Improvements in or relating to dosimetry techniques
US3792252A (en) Apparatus for determining the level and profile of a material
GB1145562A (en) A method of measurement of physical magnitudes
US3235732A (en) Radiation thickness gauge including a feedback readout circuit
US3253149A (en) Method and apparatus for hardness testing using backscattered beta radiation
GB1241942A (en) Improvements in or relating to the calibration of instruments
JPS5450359A (en) Radiation thickness gauge
GB2169720A (en) Detecting rate of change of signals
US5049744A (en) Radioactive particle densitometer apparatus employing modulation circuitry
US3745340A (en) Apparatus for measuring the sulfur content of hydrocarbons
US3832542A (en) Wide range radiation gage having a controlled-gain photodetector for determining a material property
GB1069541A (en) X-ray gauging method
PL83720B1 (enrdf_load_stackoverflow)
GB1287366A (en) Device for measuring the thickness of metallic layers

Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLE Entries relating assignments, transmissions, licences in the register of patents
PCNP Patent ceased through non-payment of renewal fee