GB1287366A - Device for measuring the thickness of metallic layers - Google Patents
Device for measuring the thickness of metallic layersInfo
- Publication number
- GB1287366A GB1287366A GB320270A GB320270A GB1287366A GB 1287366 A GB1287366 A GB 1287366A GB 320270 A GB320270 A GB 320270A GB 320270 A GB320270 A GB 320270A GB 1287366 A GB1287366 A GB 1287366A
- Authority
- GB
- United Kingdom
- Prior art keywords
- thickness
- meter
- layer
- integrator
- switch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
1287366 Beta particle thickness measurement L STRENG 22 Jan 1970 3202/70 Headings G1A and G1U Apparatus for measuring the thickness of a layer 13 on a carrier 35 detects the backscattered # radiation 12 in a Geiger-Muller tube whose pulse output is passed through an AND gate and a binary frequency division device 17 to an integrator 22. The integrator output is proportional to the pulse rate which itself is a non- linear function of the thickness. This signal is backed off by the voltage produced by battery 27 to compensate for the scatter from the carrier and the resultant signal passes through network 28 to a linearizing amplifier 29 which derives a signal having an inverse relation to the thickness of the layer so that the output which feeds meter 31 is linearly related to the thickness of the layer. The sensitivity of meter 31 can be charged by switch 32. A measuring clock 18 is connected to both open and shut AND gate 19 at the required times and also to provide an interrogation pulse to integrator 22. In operation the backscatter from the bore carrier 35 is measured and the battery voltage 27 adjusted until meter 31 indicates zero. A standard having a layer of known thickness is measured and network 28 adjusted to give the correct indication on meter 31 with switch 32 in its right hand position. Switch 32 is changed over and resistor 33 adjusted until the meter indicates the correct thickness. This calibration will be correct for any measuring time interval since any change in the time interval changes both the duration of opening of AND gate 16 and the frequency division ratio of device 17 so that the same number of pulses are fed to the integrator. Amplifier 29, Fig.2 (not shown) is constructed to have four discrete characteristics selected by a switch which changes the input and output polarity and also inserts either a fixed resistor or a parallel network of diodes and resistors in the feedback path so that the characteristics of the amplifier follows the curve Y =A(e<SP>BX</SP>-l) where Y is layer thickness, x is the detector count and A and B are constants and this derived signal can be added to the input signal to provide a linear curve relating thickness Y and detector count x, Fig.4 (not shown).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB320270A GB1287366A (en) | 1970-01-22 | 1970-01-22 | Device for measuring the thickness of metallic layers |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB320270A GB1287366A (en) | 1970-01-22 | 1970-01-22 | Device for measuring the thickness of metallic layers |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1287366A true GB1287366A (en) | 1972-08-31 |
Family
ID=9753884
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB320270A Expired GB1287366A (en) | 1970-01-22 | 1970-01-22 | Device for measuring the thickness of metallic layers |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB1287366A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0201076A2 (en) * | 1985-05-07 | 1986-11-12 | RETIFLEX S.p.A. | Reticular structures having improved mechanical characteristics. |
| CN110823105A (en) * | 2019-05-03 | 2020-02-21 | 韩子杰 | Nuclear material coating uniformity measuring device and using method |
-
1970
- 1970-01-22 GB GB320270A patent/GB1287366A/en not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0201076A2 (en) * | 1985-05-07 | 1986-11-12 | RETIFLEX S.p.A. | Reticular structures having improved mechanical characteristics. |
| EP0201076A3 (en) * | 1985-05-07 | 1988-06-22 | Moplefan S.P.A. | Reticular structures having improved mechanical characteristics as well as process and device for preparing same |
| CN110823105A (en) * | 2019-05-03 | 2020-02-21 | 韩子杰 | Nuclear material coating uniformity measuring device and using method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed | ||
| PLNP | Patent lapsed through nonpayment of renewal fees |