DE2029141A1 - Fluoreszierende Analyse-Strahlenquelle zur gleichzeitigen Erzeugung von fluoreszierender, weicher Röntgenstrahlung und einer für die Analyseprobe charakteristische Sekundär-Elektronenemission - Google Patents
Fluoreszierende Analyse-Strahlenquelle zur gleichzeitigen Erzeugung von fluoreszierender, weicher Röntgenstrahlung und einer für die Analyseprobe charakteristische Sekundär-ElektronenemissionInfo
- Publication number
- DE2029141A1 DE2029141A1 DE19702029141 DE2029141A DE2029141A1 DE 2029141 A1 DE2029141 A1 DE 2029141A1 DE 19702029141 DE19702029141 DE 19702029141 DE 2029141 A DE2029141 A DE 2029141A DE 2029141 A1 DE2029141 A1 DE 2029141A1
- Authority
- DE
- Germany
- Prior art keywords
- fluorescent
- sample
- electron
- cathode
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005855 radiation Effects 0.000 title claims description 51
- 238000004458 analytical method Methods 0.000 title claims description 22
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- 238000010438 heat treatment Methods 0.000 claims description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000002441 X-ray diffraction Methods 0.000 description 4
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
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- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 2
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- BIIBYWQGRFWQKM-JVVROLKMSA-N (2S)-N-[4-(cyclopropylamino)-3,4-dioxo-1-[(3S)-2-oxopyrrolidin-3-yl]butan-2-yl]-2-[[(E)-3-(2,4-dichlorophenyl)prop-2-enoyl]amino]-4,4-dimethylpentanamide Chemical compound CC(C)(C)C[C@@H](C(NC(C[C@H](CCN1)C1=O)C(C(NC1CC1)=O)=O)=O)NC(/C=C/C(C=CC(Cl)=C1)=C1Cl)=O BIIBYWQGRFWQKM-JVVROLKMSA-N 0.000 description 1
- 241000282461 Canis lupus Species 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- 235000010678 Paulownia tomentosa Nutrition 0.000 description 1
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- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
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- 230000002401 inhibitory effect Effects 0.000 description 1
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- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- QMQXDJATSGGYDR-UHFFFAOYSA-N methylidyneiron Chemical compound [C].[Fe] QMQXDJATSGGYDR-UHFFFAOYSA-N 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
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- 238000000562 secondary electron spectroscopy Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 230000004936 stimulating effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000004846 x-ray emission Methods 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/072—Investigating materials by wave or particle radiation secondary emission combination of measurements, 2 kinds of secondary emission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/084—Investigating materials by wave or particle radiation secondary emission photo-electric effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/20—Sources of radiation
- G01N2223/204—Sources of radiation source created from radiated target
Landscapes
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US83256269A | 1969-06-12 | 1969-06-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2029141A1 true DE2029141A1 (de) | 1970-12-23 |
Family
ID=25262023
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19702029141 Pending DE2029141A1 (de) | 1969-06-12 | 1970-06-12 | Fluoreszierende Analyse-Strahlenquelle zur gleichzeitigen Erzeugung von fluoreszierender, weicher Röntgenstrahlung und einer für die Analyseprobe charakteristische Sekundär-Elektronenemission |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3567928A (enrdf_load_stackoverflow) |
| CA (1) | CA918217A (enrdf_load_stackoverflow) |
| DE (1) | DE2029141A1 (enrdf_load_stackoverflow) |
| GB (1) | GB1303343A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0292055A3 (en) * | 1987-05-18 | 1989-04-19 | Philips Patentverwaltung Gmbh | Radiation source for the generation of essentially monochromatic x-rays |
| DE102013209104A1 (de) * | 2013-05-16 | 2014-11-20 | Carl Zeiss Microscopy Gmbh | Vorrichtung und Verfahren zur spektroskopischen Analyse |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3752989A (en) * | 1972-01-27 | 1973-08-14 | Us Commerce | Method of producing an intense, high-purity k x-ray beam |
| GB1443048A (en) * | 1972-12-05 | 1976-07-21 | Strahlen Umweltforsch Gmbh | X-ray source |
| US3963922A (en) * | 1975-06-09 | 1976-06-15 | Nuclear Semiconductor | X-ray fluorescence device |
| US4172225A (en) * | 1978-01-09 | 1979-10-23 | Kevex Corporation | Alpha particle x-ray energy analysis system |
| US4493097A (en) * | 1982-08-30 | 1985-01-08 | The Perkin-Elmer Corporation | Electron gun assembly |
| US4868842A (en) * | 1987-03-19 | 1989-09-19 | Siemens Medical Systems, Inc. | Cathode cup improvement |
| JPH0225737A (ja) * | 1988-07-15 | 1990-01-29 | Hitachi Ltd | 表面分析方法および装置 |
| DE4017002A1 (de) * | 1990-05-26 | 1991-11-28 | Philips Patentverwaltung | Strahlenquelle fuer quasimonochromatische roentgenstrahlung |
| GB9222135D0 (en) * | 1992-10-21 | 1992-12-02 | Fisons Ltd | Electron spectrometer |
| JP3525643B2 (ja) * | 1996-09-30 | 2004-05-10 | 株式会社島津製作所 | 定性分析装置 |
| JPH11288678A (ja) * | 1998-02-10 | 1999-10-19 | Siemens Ag | 蛍光ｘ線源 |
| CN112700740B (zh) * | 2020-12-28 | 2022-12-30 | 青岛路桥建设集团有限公司 | 一种安全通道道路指引标识 |
-
1969
- 1969-06-12 US US832562A patent/US3567928A/en not_active Expired - Lifetime
-
1970
- 1970-06-03 CA CA084599A patent/CA918217A/en not_active Expired
- 1970-06-10 GB GB2812670A patent/GB1303343A/en not_active Expired
- 1970-06-12 DE DE19702029141 patent/DE2029141A1/de active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0292055A3 (en) * | 1987-05-18 | 1989-04-19 | Philips Patentverwaltung Gmbh | Radiation source for the generation of essentially monochromatic x-rays |
| DE102013209104A1 (de) * | 2013-05-16 | 2014-11-20 | Carl Zeiss Microscopy Gmbh | Vorrichtung und Verfahren zur spektroskopischen Analyse |
| US9927361B2 (en) | 2013-05-16 | 2018-03-27 | Carl Zeiss Microscopy Gmbh | Devices and methods for spectroscopic analysis |
| US10436712B2 (en) | 2013-05-16 | 2019-10-08 | Carl Zeiss Microscopy Gmbh | Devices and methods for spectroscopic analysis |
Also Published As
| Publication number | Publication date |
|---|---|
| US3567928A (en) | 1971-03-02 |
| CA918217A (en) | 1973-01-02 |
| GB1303343A (enrdf_load_stackoverflow) | 1973-01-17 |
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