GB1303343A - - Google Patents
Info
- Publication number
- GB1303343A GB1303343A GB2812670A GB2812670A GB1303343A GB 1303343 A GB1303343 A GB 1303343A GB 2812670 A GB2812670 A GB 2812670A GB 2812670 A GB2812670 A GB 2812670A GB 1303343 A GB1303343 A GB 1303343A
- Authority
- GB
- United Kingdom
- Prior art keywords
- rays
- june
- mirror
- detector
- oscilloscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract 2
- PQXKHYXIUOZZFA-UHFFFAOYSA-M lithium fluoride Chemical compound [Li+].[F-] PQXKHYXIUOZZFA-UHFFFAOYSA-M 0.000 abstract 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 abstract 1
- 238000002441 X-ray diffraction Methods 0.000 abstract 1
- 229910052799 carbon Inorganic materials 0.000 abstract 1
- 229910052757 nitrogen Inorganic materials 0.000 abstract 1
- 239000012188 paraffin wax Substances 0.000 abstract 1
- 230000001360 synchronised effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/072—Investigating materials by wave or particle radiation secondary emission combination of measurements, 2 kinds of secondary emission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/084—Investigating materials by wave or particle radiation secondary emission photo-electric effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/20—Sources of radiation
- G01N2223/204—Sources of radiation source created from radiated target
Landscapes
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US83256269A | 1969-06-12 | 1969-06-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1303343A true GB1303343A (enrdf_load_stackoverflow) | 1973-01-17 |
Family
ID=25262023
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB2812670A Expired GB1303343A (enrdf_load_stackoverflow) | 1969-06-12 | 1970-06-10 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3567928A (enrdf_load_stackoverflow) |
| CA (1) | CA918217A (enrdf_load_stackoverflow) |
| DE (1) | DE2029141A1 (enrdf_load_stackoverflow) |
| GB (1) | GB1303343A (enrdf_load_stackoverflow) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3752989A (en) * | 1972-01-27 | 1973-08-14 | Us Commerce | Method of producing an intense, high-purity k x-ray beam |
| GB1443048A (en) * | 1972-12-05 | 1976-07-21 | Strahlen Umweltforsch Gmbh | X-ray source |
| US3963922A (en) * | 1975-06-09 | 1976-06-15 | Nuclear Semiconductor | X-ray fluorescence device |
| US4172225A (en) * | 1978-01-09 | 1979-10-23 | Kevex Corporation | Alpha particle x-ray energy analysis system |
| US4493097A (en) * | 1982-08-30 | 1985-01-08 | The Perkin-Elmer Corporation | Electron gun assembly |
| US4868842A (en) * | 1987-03-19 | 1989-09-19 | Siemens Medical Systems, Inc. | Cathode cup improvement |
| DE3716618A1 (de) * | 1987-05-18 | 1988-12-08 | Philips Patentverwaltung | Strahlenquelle zur erzeugung einer im wesentlichen monochromatischen roentgenstrahlung |
| JPH0225737A (ja) * | 1988-07-15 | 1990-01-29 | Hitachi Ltd | 表面分析方法および装置 |
| DE4017002A1 (de) * | 1990-05-26 | 1991-11-28 | Philips Patentverwaltung | Strahlenquelle fuer quasimonochromatische roentgenstrahlung |
| GB9222135D0 (en) * | 1992-10-21 | 1992-12-02 | Fisons Ltd | Electron spectrometer |
| JP3525643B2 (ja) * | 1996-09-30 | 2004-05-10 | 株式会社島津製作所 | 定性分析装置 |
| JPH11288678A (ja) * | 1998-02-10 | 1999-10-19 | Siemens Ag | 蛍光ｘ線源 |
| DE102013209104A1 (de) | 2013-05-16 | 2014-11-20 | Carl Zeiss Microscopy Gmbh | Vorrichtung und Verfahren zur spektroskopischen Analyse |
| CN112700740B (zh) * | 2020-12-28 | 2022-12-30 | 青岛路桥建设集团有限公司 | 一种安全通道道路指引标识 |
-
1969
- 1969-06-12 US US832562A patent/US3567928A/en not_active Expired - Lifetime
-
1970
- 1970-06-03 CA CA084599A patent/CA918217A/en not_active Expired
- 1970-06-10 GB GB2812670A patent/GB1303343A/en not_active Expired
- 1970-06-12 DE DE19702029141 patent/DE2029141A1/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US3567928A (en) | 1971-03-02 |
| DE2029141A1 (de) | 1970-12-23 |
| CA918217A (en) | 1973-01-02 |
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|---|---|---|
| GB1303343A (enrdf_load_stackoverflow) | ||
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed [section 19, patents act 1949] | ||
| PCNP | Patent ceased through non-payment of renewal fee |