CA918217A - Fluorescent analytical radiation source - Google Patents

Fluorescent analytical radiation source

Info

Publication number
CA918217A
CA918217A CA084599A CA84599A CA918217A CA 918217 A CA918217 A CA 918217A CA 084599 A CA084599 A CA 084599A CA 84599 A CA84599 A CA 84599A CA 918217 A CA918217 A CA 918217A
Authority
CA
Canada
Prior art keywords
radiation source
analytical radiation
fluorescent analytical
fluorescent
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA084599A
Other versions
CA84599S (en
Inventor
K. Herglotz Heribert
D. Davies Robert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EIDP Inc
Original Assignee
EI Du Pont de Nemours and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EI Du Pont de Nemours and Co filed Critical EI Du Pont de Nemours and Co
Application granted granted Critical
Publication of CA918217A publication Critical patent/CA918217A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2209—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/072—Investigating materials by wave or particle radiation secondary emission combination of measurements, 2 kinds of secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/084—Investigating materials by wave or particle radiation secondary emission photo-electric effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/204—Sources of radiation source created from radiated target

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
CA084599A 1969-06-12 1970-06-03 Fluorescent analytical radiation source Expired CA918217A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US83256269A 1969-06-12 1969-06-12

Publications (1)

Publication Number Publication Date
CA918217A true CA918217A (en) 1973-01-02

Family

ID=25262023

Family Applications (1)

Application Number Title Priority Date Filing Date
CA084599A Expired CA918217A (en) 1969-06-12 1970-06-03 Fluorescent analytical radiation source

Country Status (4)

Country Link
US (1) US3567928A (en)
CA (1) CA918217A (en)
DE (1) DE2029141A1 (en)
GB (1) GB1303343A (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3752989A (en) * 1972-01-27 1973-08-14 Us Commerce Method of producing an intense, high-purity k x-ray beam
GB1443048A (en) * 1972-12-05 1976-07-21 Strahlen Umweltforsch Gmbh X-ray source
US3963922A (en) * 1975-06-09 1976-06-15 Nuclear Semiconductor X-ray fluorescence device
US4172225A (en) * 1978-01-09 1979-10-23 Kevex Corporation Alpha particle x-ray energy analysis system
US4493097A (en) * 1982-08-30 1985-01-08 The Perkin-Elmer Corporation Electron gun assembly
US4868842A (en) * 1987-03-19 1989-09-19 Siemens Medical Systems, Inc. Cathode cup improvement
DE3716618A1 (en) * 1987-05-18 1988-12-08 Philips Patentverwaltung RADIATION SOURCE FOR GENERATING AN ESSENTIAL MONOCHROMATIC X-RAY RADIATION
JPH0225737A (en) * 1988-07-15 1990-01-29 Hitachi Ltd Method and apparatus for surface analysis
DE4017002A1 (en) * 1990-05-26 1991-11-28 Philips Patentverwaltung Monochromatic X=radiation source
GB9222135D0 (en) * 1992-10-21 1992-12-02 Fisons Ltd Electron spectrometer
JP3525643B2 (en) * 1996-09-30 2004-05-10 株式会社島津製作所 Qualitative analyzer
JPH11288678A (en) * 1998-02-10 1999-10-19 Siemens Ag Fluorescence x-ray source
DE102013209104A1 (en) 2013-05-16 2014-11-20 Carl Zeiss Microscopy Gmbh Apparatus and method for spectroscopic analysis
CN112700740B (en) * 2020-12-28 2022-12-30 青岛路桥建设集团有限公司 Safe passage road guide sign

Also Published As

Publication number Publication date
US3567928A (en) 1971-03-02
GB1303343A (en) 1973-01-17
DE2029141A1 (en) 1970-12-23

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