DE19903573C2 - Verfahren zum Korrigieren von Reflexionsmessungen eines zu testenden reziproken Elements bei einem Vektornetzwerkanalysator - Google Patents

Verfahren zum Korrigieren von Reflexionsmessungen eines zu testenden reziproken Elements bei einem Vektornetzwerkanalysator

Info

Publication number
DE19903573C2
DE19903573C2 DE19903573A DE19903573A DE19903573C2 DE 19903573 C2 DE19903573 C2 DE 19903573C2 DE 19903573 A DE19903573 A DE 19903573A DE 19903573 A DE19903573 A DE 19903573A DE 19903573 C2 DE19903573 C2 DE 19903573C2
Authority
DE
Germany
Prior art keywords
reflection
gate
load
measurement
coefficient
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19903573A
Other languages
German (de)
English (en)
Other versions
DE19903573A1 (de
Inventor
David V Blackham
Jason Chodora
Joel P Dunsmore
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE19903573A1 publication Critical patent/DE19903573A1/de
Application granted granted Critical
Publication of DE19903573C2 publication Critical patent/DE19903573C2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE19903573A 1998-04-24 1999-01-29 Verfahren zum Korrigieren von Reflexionsmessungen eines zu testenden reziproken Elements bei einem Vektornetzwerkanalysator Expired - Fee Related DE19903573C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/066,801 US6060888A (en) 1998-04-24 1998-04-24 Error correction method for reflection measurements of reciprocal devices in vector network analyzers

Publications (2)

Publication Number Publication Date
DE19903573A1 DE19903573A1 (de) 1999-11-04
DE19903573C2 true DE19903573C2 (de) 2002-11-07

Family

ID=22071804

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19903573A Expired - Fee Related DE19903573C2 (de) 1998-04-24 1999-01-29 Verfahren zum Korrigieren von Reflexionsmessungen eines zu testenden reziproken Elements bei einem Vektornetzwerkanalysator

Country Status (4)

Country Link
US (1) US6060888A (enExample)
JP (1) JPH11326413A (enExample)
DE (1) DE19903573C2 (enExample)
GB (1) GB2336686B (enExample)

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CN101019032A (zh) * 2004-09-14 2007-08-15 皇家飞利浦电子股份有限公司 检测负载阻抗的电路
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CN101556320B (zh) * 2009-04-30 2011-10-26 厦门红相电力设备股份有限公司 电容式电压互感器现场校验方法
CN104297711B (zh) * 2014-10-21 2017-04-12 中国电子科技集团公司第四十一研究所 矢量网络分析仪的不确定度分析方法
US10145930B1 (en) * 2015-09-30 2018-12-04 Keysight Technologies, Inc. Method and system for phase synchronization and calibration of a multiport vector network analyzer using a single phase reference
US10148316B2 (en) * 2016-04-26 2018-12-04 Intel Corporation Technologies for PCB and cable loss characterization and fixture de-embedding
CN109375151B (zh) * 2018-12-24 2020-11-10 广东电网有限责任公司 电能表计量误差在线监测技术的监测通道调度方法及装置
CN109596944B (zh) * 2019-01-11 2021-03-23 上海仁童电子科技有限公司 线缆检测方法、装置及电子设备
CN111999560B (zh) * 2020-07-20 2024-01-16 杭州电子科技大学 一种基于阻抗的矢量网络分析仪的校准方法
CN111983431B (zh) * 2020-08-31 2022-11-15 中电科思仪科技股份有限公司 一种提高矢量网络分析仪端口反射系数模拟精度的方法
CN112564823B (zh) * 2020-12-03 2022-11-01 浙江铖昌科技股份有限公司 一种基于自校准算法的多端口射频微波校准方法
CN113296039B (zh) * 2021-04-25 2023-01-24 中国计量科学研究院 一种确定组合体校准因子的方法
CN119044865B (zh) * 2024-09-02 2025-07-25 中国计量科学研究院 微波毫米波等效源反射系数的测量系统及方法

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DE3821575A1 (de) * 1988-06-25 1989-12-28 Philips Patentverwaltung Anordnung zur naeherungsweisen bestimmung des ersatzschaltbildes eines elektrischen bzw. elektronischen bauelementes bei hohen frequenzen
DE19723087A1 (de) * 1996-08-01 1998-02-05 Hewlett Packard Co Fehlerkorrekturverfahren für Transmissionsmessungen in Vektornetzwerkanalysatoren

Also Published As

Publication number Publication date
US6060888A (en) 2000-05-09
GB9908189D0 (en) 1999-06-02
GB2336686B (en) 2002-03-27
JPH11326413A (ja) 1999-11-26
DE19903573A1 (de) 1999-11-04
GB2336686A (en) 1999-10-27

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Legal Events

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OP8 Request for examination as to paragraph 44 patent law
8127 New person/name/address of the applicant

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

D2 Grant after examination
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee