GB2336686B - Vector network analyzers - Google Patents

Vector network analyzers

Info

Publication number
GB2336686B
GB2336686B GB9908189A GB9908189A GB2336686B GB 2336686 B GB2336686 B GB 2336686B GB 9908189 A GB9908189 A GB 9908189A GB 9908189 A GB9908189 A GB 9908189A GB 2336686 B GB2336686 B GB 2336686B
Authority
GB
United Kingdom
Prior art keywords
vector network
network analyzers
analyzers
vector
network
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9908189A
Other languages
English (en)
Other versions
GB9908189D0 (en
GB2336686A (en
Inventor
David Vernon Blackham
Jason A Chodora
Joel P Dunsmore
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc, Hewlett Packard Co filed Critical Agilent Technologies Inc
Publication of GB9908189D0 publication Critical patent/GB9908189D0/en
Publication of GB2336686A publication Critical patent/GB2336686A/en
Application granted granted Critical
Publication of GB2336686B publication Critical patent/GB2336686B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
GB9908189A 1998-04-24 1999-04-09 Vector network analyzers Expired - Fee Related GB2336686B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/066,801 US6060888A (en) 1998-04-24 1998-04-24 Error correction method for reflection measurements of reciprocal devices in vector network analyzers

Publications (3)

Publication Number Publication Date
GB9908189D0 GB9908189D0 (en) 1999-06-02
GB2336686A GB2336686A (en) 1999-10-27
GB2336686B true GB2336686B (en) 2002-03-27

Family

ID=22071804

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9908189A Expired - Fee Related GB2336686B (en) 1998-04-24 1999-04-09 Vector network analyzers

Country Status (4)

Country Link
US (1) US6060888A (enExample)
JP (1) JPH11326413A (enExample)
DE (1) DE19903573C2 (enExample)
GB (1) GB2336686B (enExample)

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US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
WO2006017078A2 (en) 2004-07-07 2006-02-16 Cascade Microtech, Inc. Probe head having a membrane suspended probe
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US6997753B2 (en) * 2003-10-22 2006-02-14 Gore Enterprise Holdings, Inc. Apparatus, system and method for improved calibration and measurement of differential devices
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
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US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
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US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
DE202005021435U1 (de) 2004-09-13 2008-02-28 Cascade Microtech, Inc., Beaverton Doppelseitige Prüfaufbauten
CN101019032A (zh) * 2004-09-14 2007-08-15 皇家飞利浦电子股份有限公司 检测负载阻抗的电路
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
WO2006137979A2 (en) 2005-06-13 2006-12-28 Cascade Microtech, Inc. Wideband active-passive differential signal probe
FI20065339A0 (fi) * 2006-05-18 2006-05-18 Nokia Corp Antennin sovitusmittaus ja vahvistuksen ohjaus
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US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7777497B2 (en) * 2008-01-17 2010-08-17 Com Dev International Ltd. Method and system for tracking scattering parameter test system calibration
CN101339234B (zh) * 2008-07-31 2012-05-09 国网电力科学研究院武汉南瑞有限责任公司 便携式cvt误差测试方法及装置
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
CN101556320B (zh) * 2009-04-30 2011-10-26 厦门红相电力设备股份有限公司 电容式电压互感器现场校验方法
CN104297711B (zh) * 2014-10-21 2017-04-12 中国电子科技集团公司第四十一研究所 矢量网络分析仪的不确定度分析方法
US10145930B1 (en) * 2015-09-30 2018-12-04 Keysight Technologies, Inc. Method and system for phase synchronization and calibration of a multiport vector network analyzer using a single phase reference
US10148316B2 (en) * 2016-04-26 2018-12-04 Intel Corporation Technologies for PCB and cable loss characterization and fixture de-embedding
CN109375151B (zh) * 2018-12-24 2020-11-10 广东电网有限责任公司 电能表计量误差在线监测技术的监测通道调度方法及装置
CN109596944B (zh) * 2019-01-11 2021-03-23 上海仁童电子科技有限公司 线缆检测方法、装置及电子设备
CN111999560B (zh) * 2020-07-20 2024-01-16 杭州电子科技大学 一种基于阻抗的矢量网络分析仪的校准方法
CN111983431B (zh) * 2020-08-31 2022-11-15 中电科思仪科技股份有限公司 一种提高矢量网络分析仪端口反射系数模拟精度的方法
CN112564823B (zh) * 2020-12-03 2022-11-01 浙江铖昌科技股份有限公司 一种基于自校准算法的多端口射频微波校准方法
CN113296039B (zh) * 2021-04-25 2023-01-24 中国计量科学研究院 一种确定组合体校准因子的方法
CN119044865B (zh) * 2024-09-02 2025-07-25 中国计量科学研究院 微波毫米波等效源反射系数的测量系统及方法

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GB2292616A (en) * 1994-08-24 1996-02-28 Hewlett Packard Co Calibration of a circuit network measurement device
GB2315873A (en) * 1996-08-01 1998-02-11 Hewlett Packard Co Method of error correction in vector network analyser transmission measurements

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GB2292616A (en) * 1994-08-24 1996-02-28 Hewlett Packard Co Calibration of a circuit network measurement device
GB2315873A (en) * 1996-08-01 1998-02-11 Hewlett Packard Co Method of error correction in vector network analyser transmission measurements

Also Published As

Publication number Publication date
US6060888A (en) 2000-05-09
GB9908189D0 (en) 1999-06-02
JPH11326413A (ja) 1999-11-26
DE19903573A1 (de) 1999-11-04
DE19903573C2 (de) 2002-11-07
GB2336686A (en) 1999-10-27

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20080409