DE1928787A1 - Halbleiterelement - Google Patents

Halbleiterelement

Info

Publication number
DE1928787A1
DE1928787A1 DE19691928787 DE1928787A DE1928787A1 DE 1928787 A1 DE1928787 A1 DE 1928787A1 DE 19691928787 DE19691928787 DE 19691928787 DE 1928787 A DE1928787 A DE 1928787A DE 1928787 A1 DE1928787 A1 DE 1928787A1
Authority
DE
Germany
Prior art keywords
zone
semiconductor wafer
semiconductor element
recess
conical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19691928787
Other languages
German (de)
English (en)
Inventor
Clerc Dipl-Phys Denis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BBC BROWN BOVERI and CIE
BBC Brown Boveri AG Germany
Original Assignee
BBC BROWN BOVERI and CIE
Brown Boveri und Cie AG Germany
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BBC BROWN BOVERI and CIE, Brown Boveri und Cie AG Germany filed Critical BBC BROWN BOVERI and CIE
Publication of DE1928787A1 publication Critical patent/DE1928787A1/de
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/102Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/103Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
    • H10D62/104Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices having particular shapes of the bodies at or near reverse-biased junctions, e.g. having bevels or moats
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D18/00Thyristors

Landscapes

  • Thyristors (AREA)
DE19691928787 1968-07-15 1969-06-06 Halbleiterelement Pending DE1928787A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1055368A CH485324A (de) 1968-07-15 1968-07-15 Halbleiterelement

Publications (1)

Publication Number Publication Date
DE1928787A1 true DE1928787A1 (de) 1970-11-12

Family

ID=4364431

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19691928787 Pending DE1928787A1 (de) 1968-07-15 1969-06-06 Halbleiterelement
DE6922591U Expired DE6922591U (de) 1968-07-15 1969-06-06 Halbleiterelement

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE6922591U Expired DE6922591U (de) 1968-07-15 1969-06-06 Halbleiterelement

Country Status (7)

Country Link
AT (1) AT278907B (enrdf_load_stackoverflow)
CH (1) CH485324A (enrdf_load_stackoverflow)
DE (2) DE1928787A1 (enrdf_load_stackoverflow)
FR (1) FR2012977A7 (enrdf_load_stackoverflow)
GB (1) GB1220315A (enrdf_load_stackoverflow)
NL (1) NL6812691A (enrdf_load_stackoverflow)
SE (1) SE354381B (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3518863A1 (de) * 1984-05-25 1985-11-28 Mitsubishi Denki K.K., Tokio/Tokyo Halbleitertablette mit verringerter oberflaechenfeldintensitaet

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10326578B4 (de) 2003-06-12 2006-01-19 Siltronic Ag Verfahren zur Herstellung einer SOI-Scheibe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3518863A1 (de) * 1984-05-25 1985-11-28 Mitsubishi Denki K.K., Tokio/Tokyo Halbleitertablette mit verringerter oberflaechenfeldintensitaet

Also Published As

Publication number Publication date
FR2012977A7 (enrdf_load_stackoverflow) 1970-03-27
SE354381B (enrdf_load_stackoverflow) 1973-03-05
DE6922591U (de) 1971-03-18
GB1220315A (en) 1971-01-27
NL6812691A (enrdf_load_stackoverflow) 1970-01-19
CH485324A (de) 1970-01-31
AT278907B (de) 1970-02-25

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