DE1598924B2 - Roentgenspektrometer - Google Patents
RoentgenspektrometerInfo
- Publication number
- DE1598924B2 DE1598924B2 DE19661598924 DE1598924A DE1598924B2 DE 1598924 B2 DE1598924 B2 DE 1598924B2 DE 19661598924 DE19661598924 DE 19661598924 DE 1598924 A DE1598924 A DE 1598924A DE 1598924 B2 DE1598924 B2 DE 1598924B2
- Authority
- DE
- Germany
- Prior art keywords
- ray tube
- axis
- ray
- arrangement according
- crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 claims description 27
- 230000005855 radiation Effects 0.000 claims description 12
- 238000002441 X-ray diffraction Methods 0.000 claims description 5
- 230000000149 penetrating effect Effects 0.000 claims 1
- 239000006185 dispersion Substances 0.000 description 8
- 238000005259 measurement Methods 0.000 description 4
- 230000000881 depressing effect Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Dispersion Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US467214A US3394255A (en) | 1965-06-28 | 1965-06-28 | Diffraction mechanism in which a monochromator diffracts the X-ray beam in planes transverse to an axis of specimen rotation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE1598924A1 DE1598924A1 (de) | 1970-09-03 |
| DE1598924B2 true DE1598924B2 (de) | 1971-11-25 |
Family
ID=23854839
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19661598924 Pending DE1598924B2 (de) | 1965-06-28 | 1966-06-24 | Roentgenspektrometer |
Country Status (4)
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1772741A1 (de) * | 1968-06-27 | 1971-06-03 | Walter Prof Dr Hoppe | Einrichtung fuer die Durchfuehrbarkeit von Roentgenfeinstrukturmessungen mit Diffraktometern mit offener Eulerwiege |
| US3714426A (en) * | 1970-08-18 | 1973-01-30 | Stoe & Cie Gmbh | Method of x-ray analysis of crystal structure an x-ray goniometer for carrying out said method |
| DE2748501C3 (de) * | 1977-10-28 | 1985-05-30 | Born, Eberhard, Dr. | Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen |
| NL1009012C2 (nl) * | 1998-04-28 | 1999-10-29 | Stichting Tech Wetenschapp | Werkwijze voor het bepalen van celparameters van een kristalstructuur onder toepassing van diffractie. |
| JP3519292B2 (ja) * | 1998-11-13 | 2004-04-12 | 理学電機株式会社 | 微小部ｘ線回折測定方法及び微小部ｘ線回折装置 |
| JP6685078B2 (ja) * | 2013-03-15 | 2020-04-22 | プロト マニュファクチャリング リミテッド | Ｘ線回折装置およびｘ線回折装置駆動方法 |
| CN111508633B (zh) * | 2020-06-02 | 2022-04-22 | 中国计量科学研究院 | 单能x射线辐射装置 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3105901A (en) * | 1959-03-30 | 1963-10-01 | Philips Corp | X-ray diffraction device with 360 rotatable specimen holder |
| US3213278A (en) * | 1962-04-13 | 1965-10-19 | Philips Corp | X-ray spectrograph having plural detectors |
| US3322948A (en) * | 1964-12-21 | 1967-05-30 | Owens Illinois Inc | X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable |
-
1965
- 1965-06-28 US US467214A patent/US3394255A/en not_active Expired - Lifetime
-
1966
- 1966-04-07 NL NL6604700A patent/NL6604700A/xx unknown
- 1966-06-24 DE DE19661598924 patent/DE1598924B2/de active Pending
- 1966-06-28 GB GB29010/66A patent/GB1139434A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE1598924A1 (de) | 1970-09-03 |
| NL6604700A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1966-12-29 |
| US3394255A (en) | 1968-07-23 |
| GB1139434A (en) | 1969-01-08 |
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