DE1444526B2 - Verfahren zum Abscheiden eines halb leitenden Elements - Google Patents

Verfahren zum Abscheiden eines halb leitenden Elements

Info

Publication number
DE1444526B2
DE1444526B2 DE19621444526 DE1444526A DE1444526B2 DE 1444526 B2 DE1444526 B2 DE 1444526B2 DE 19621444526 DE19621444526 DE 19621444526 DE 1444526 A DE1444526 A DE 1444526A DE 1444526 B2 DE1444526 B2 DE 1444526B2
Authority
DE
Germany
Prior art keywords
temperature
reaction gas
carrier
deposition
sihcl
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19621444526
Other languages
German (de)
English (en)
Other versions
DE1444526A1 (de
Inventor
Theodor Dr 8000 München Rummel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of DE1444526A1 publication Critical patent/DE1444526A1/de
Publication of DE1444526B2 publication Critical patent/DE1444526B2/de
Withdrawn legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B33/00Silicon; Compounds thereof
    • C01B33/02Silicon
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02Epitaxial-layer growth
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/08Germanium
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32Processing objects by plasma generation
    • H01J2237/33Processing objects by plasma generation characterised by the type of processing
    • H01J2237/332Coating
    • H01J2237/3321CVD [Chemical Vapor Deposition]
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/935Gas flow control

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Silicon Compounds (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Chemical Vapour Deposition (AREA)
DE19621444526 1962-08-24 1962-08-24 Verfahren zum Abscheiden eines halb leitenden Elements Withdrawn DE1444526B2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES0081093 1962-08-24

Publications (2)

Publication Number Publication Date
DE1444526A1 DE1444526A1 (de) 1968-10-17
DE1444526B2 true DE1444526B2 (de) 1971-02-04

Family

ID=7509332

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19621444526 Withdrawn DE1444526B2 (de) 1962-08-24 1962-08-24 Verfahren zum Abscheiden eines halb leitenden Elements

Country Status (6)

Country Link
US (1) US3341359A (enrdf_load_html_response)
CH (1) CH430665A (enrdf_load_html_response)
DE (1) DE1444526B2 (enrdf_load_html_response)
FR (1) FR1397154A (enrdf_load_html_response)
GB (1) GB998942A (enrdf_load_html_response)
SE (1) SE337973B (enrdf_load_html_response)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2831816A1 (de) 1978-07-19 1980-01-31 Siemens Ag Verfahren zum abscheiden von silicium in feinkristalliner form
JP3444327B2 (ja) * 1996-03-04 2003-09-08 信越半導体株式会社 シリコン単結晶薄膜の製造方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL233004A (enrdf_load_html_response) * 1954-05-18 1900-01-01
DE1048638B (de) * 1957-07-02 1959-01-15 Siemens &. Halske Aktiengesellschaft, Berlin und München Verfahren zur Herstellung von Halbleitereinkristallen, insbesondere von Silizium durch thermische Zersetzung oder Reduktion
NL256017A (enrdf_load_html_response) * 1959-09-23 1900-01-01
NL260072A (enrdf_load_html_response) * 1960-01-15

Also Published As

Publication number Publication date
DE1444526A1 (de) 1968-10-17
FR1397154A (fr) 1965-04-30
CH430665A (de) 1967-02-28
GB998942A (en) 1965-07-21
SE337973B (enrdf_load_html_response) 1971-08-23
US3341359A (en) 1967-09-12

Similar Documents

Publication Publication Date Title
DE2047198C3 (de) Verfahren zum Ziehen von Halbleiterkristallen
DE112009000360B4 (de) Verfahren zum Wachsen eines Siliziumkarbideinkristalls
DE112009000328B4 (de) Verfahren zum Aufwachsen eines Siliziumcarbideinkristalls
DE1667657B2 (de) Verfahren zur herstellung von siliciumkarbidwhiskers
DE19710672A1 (de) Quarzglas-Tiegel zum Ziehen von Einkristall und Verfahren zu seiner Herstellung
DE3035267C2 (enrdf_load_html_response)
DE2639707A1 (de) Verfahren zum regeln des sauerstoffgehalts beim ziehen von siliciumkristallen
DD207937A5 (de) Verfahren und vorrichtung zur herstellung von einkristallen
DE112007002336B4 (de) Vorrichtung und Verfahren zur Herstellung von Einkristallen
DE69312582T2 (de) Verfahren zur Herstellung eines Metalloxid-Kristalls
DE1719024A1 (de) Verfahren zur Herstellung eines Stabes aus Halbleitermaterial fuer elektronische Zwecke
DE2831816A1 (de) Verfahren zum abscheiden von silicium in feinkristalliner form
DE1444526C (de) Verfahren zum Abscheiden eines halb leitenden Elements
DE1444526B2 (de) Verfahren zum Abscheiden eines halb leitenden Elements
DE69613033T2 (de) Züchtung von Silizium-Einkristall aus einer Schmelze mit aussergewöhnlichen Wirbelströmen auf der Oberfläche
DE68912686T2 (de) Verfahren zur Herstellung eines Einkristalls aus einer Halbleiter-Verbindung.
DE2632614A1 (de) Vorrichtung zum ziehen eines einkristallinen koerpers aus einem schmelzfilm
AT240333B (de) Verfahren zum thermischen Abscheiden von elementarem Silizium oder einem andern halbleitenden Element
DE1444396A1 (de) Verfahren zur Regelung der Zusammensetzung einer Dampfphase
DE3531949A1 (de) Verfahren zur herstellung von ss-zinkdiphosphid-einkristallen
DE2422251A1 (de) Verfahren und vorrichtumg zum herstellen von dotierten cadmiumtellurideinkristallen
DE2447691A1 (de) Verfahren zum herstellen von reinem silicium
AT226649B (de) Verfahren zum Herstellen von einkristallinem Silizium
DE1232558B (de) Verfahren zum Herstellen von kristallinem, insbesondere einkristallinem Bor
AT203551B (de) Verfahren zur Behandlung eines schmelzbaren, zumindest einen gelösten Stoff enthaltenden Materials

Legal Events

Date Code Title Description
SH Request for examination between 03.10.1968 and 22.04.1971
E77 Valid patent as to the heymanns-index 1977
EHJ Ceased/non-payment of the annual fee