DE1255539B - Einrichtung zum UEberwachen der Funktionsfaehigkeit eines eine Vielzahl elektronischer Schaltungselemente enthaltenden Geraetes - Google Patents

Einrichtung zum UEberwachen der Funktionsfaehigkeit eines eine Vielzahl elektronischer Schaltungselemente enthaltenden Geraetes

Info

Publication number
DE1255539B
DE1255539B DEM58408A DEM0058408A DE1255539B DE 1255539 B DE1255539 B DE 1255539B DE M58408 A DEM58408 A DE M58408A DE M0058408 A DEM0058408 A DE M0058408A DE 1255539 B DE1255539 B DE 1255539B
Authority
DE
Germany
Prior art keywords
points
lines
point
unconnected
stages
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DEM58408A
Other languages
German (de)
English (en)
Inventor
Wilfried Sinden Mortley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BAE Systems Electronics Ltd
Original Assignee
Marconi Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marconi Co Ltd filed Critical Marconi Co Ltd
Publication of DE1255539B publication Critical patent/DE1255539B/de
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/14Digital output to display device ; Cooperation and interconnection of the display device with other functional units
    • G06F3/153Digital output to display device ; Cooperation and interconnection of the display device with other functional units using cathode-ray tubes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31903Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912Tester/user interface
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Theoretical Computer Science (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Tests Of Electronic Circuits (AREA)
DEM58408A 1962-10-02 1963-10-02 Einrichtung zum UEberwachen der Funktionsfaehigkeit eines eine Vielzahl elektronischer Schaltungselemente enthaltenden Geraetes Pending DE1255539B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB37231/62A GB984885A (en) 1962-10-02 1962-10-02 Improvements in or relating to equipment testing systems

Publications (1)

Publication Number Publication Date
DE1255539B true DE1255539B (de) 1967-11-30

Family

ID=10394826

Family Applications (1)

Application Number Title Priority Date Filing Date
DEM58408A Pending DE1255539B (de) 1962-10-02 1963-10-02 Einrichtung zum UEberwachen der Funktionsfaehigkeit eines eine Vielzahl elektronischer Schaltungselemente enthaltenden Geraetes

Country Status (4)

Country Link
US (1) US3398363A (enExample)
DE (1) DE1255539B (enExample)
GB (1) GB984885A (enExample)
SE (1) SE315228B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3464001A (en) * 1967-06-27 1969-08-26 Northern Electric Co Apparatus for sequentially testing the crosspoints of a ferreed switch for contact resistance
US3593130A (en) * 1968-10-01 1971-07-13 Molekularelektronik A circuit for a sorting unit of a programmed automatic measuring device especially adapted for testing of integrated control circuits
US4195257A (en) * 1975-12-04 1980-03-25 Kabushiki Kaisha Meidensha Testing apparatus for a circuit assembly
GB2086061B (en) * 1980-10-13 1985-05-22 Marconi Instruments Ltd Automatic test systems
US4803422A (en) * 1987-12-28 1989-02-07 General Dynamics, Pomona Division Electrical monitoring of flip-chip hybridization

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2937369A (en) * 1955-12-29 1960-05-17 Honeywell Regulator Co Electrical signal measuring apparatus
US2878450A (en) * 1957-05-23 1959-03-17 Marquardt Aircraft Co High speed multi-channel voltage indicator
US3179883A (en) * 1960-11-08 1965-04-20 Bell Telephone Labor Inc Point matrix display unit for testing logic circuit

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
None *

Also Published As

Publication number Publication date
US3398363A (en) 1968-08-20
GB984885A (en) 1965-03-03
SE315228B (enExample) 1969-09-22

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