GB984885A - Improvements in or relating to equipment testing systems - Google Patents
Improvements in or relating to equipment testing systemsInfo
- Publication number
- GB984885A GB984885A GB37231/62A GB3723162A GB984885A GB 984885 A GB984885 A GB 984885A GB 37231/62 A GB37231/62 A GB 37231/62A GB 3723162 A GB3723162 A GB 3723162A GB 984885 A GB984885 A GB 984885A
- Authority
- GB
- United Kingdom
- Prior art keywords
- fault
- output
- outputs
- blank
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/14—Digital output to display device ; Cooperation and interconnection of the display device with other functional units
- G06F3/153—Digital output to display device ; Cooperation and interconnection of the display device with other functional units using cathode-ray tubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31912—Tester/user interface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Human Computer Interaction (AREA)
- Theoretical Computer Science (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB37231/62A GB984885A (en) | 1962-10-02 | 1962-10-02 | Improvements in or relating to equipment testing systems |
| SE10018/63A SE315228B (enExample) | 1962-10-02 | 1963-09-12 | |
| US312488A US3398363A (en) | 1962-10-02 | 1963-09-30 | Equipment testing systems for visually indicating faults occurring at any of a number of testing points |
| DEM58408A DE1255539B (de) | 1962-10-02 | 1963-10-02 | Einrichtung zum UEberwachen der Funktionsfaehigkeit eines eine Vielzahl elektronischer Schaltungselemente enthaltenden Geraetes |
| FR949303A FR1375994A (fr) | 1962-10-02 | 1963-10-02 | Perfectionnements aux systèmes pour l'essai des équipements |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB37231/62A GB984885A (en) | 1962-10-02 | 1962-10-02 | Improvements in or relating to equipment testing systems |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB984885A true GB984885A (en) | 1965-03-03 |
Family
ID=10394826
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB37231/62A Expired GB984885A (en) | 1962-10-02 | 1962-10-02 | Improvements in or relating to equipment testing systems |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3398363A (enExample) |
| DE (1) | DE1255539B (enExample) |
| GB (1) | GB984885A (enExample) |
| SE (1) | SE315228B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3464001A (en) * | 1967-06-27 | 1969-08-26 | Northern Electric Co | Apparatus for sequentially testing the crosspoints of a ferreed switch for contact resistance |
| US3593130A (en) * | 1968-10-01 | 1971-07-13 | Molekularelektronik | A circuit for a sorting unit of a programmed automatic measuring device especially adapted for testing of integrated control circuits |
| US4195257A (en) * | 1975-12-04 | 1980-03-25 | Kabushiki Kaisha Meidensha | Testing apparatus for a circuit assembly |
| GB2086061B (en) * | 1980-10-13 | 1985-05-22 | Marconi Instruments Ltd | Automatic test systems |
| US4803422A (en) * | 1987-12-28 | 1989-02-07 | General Dynamics, Pomona Division | Electrical monitoring of flip-chip hybridization |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2937369A (en) * | 1955-12-29 | 1960-05-17 | Honeywell Regulator Co | Electrical signal measuring apparatus |
| US2878450A (en) * | 1957-05-23 | 1959-03-17 | Marquardt Aircraft Co | High speed multi-channel voltage indicator |
| US3179883A (en) * | 1960-11-08 | 1965-04-20 | Bell Telephone Labor Inc | Point matrix display unit for testing logic circuit |
-
1962
- 1962-10-02 GB GB37231/62A patent/GB984885A/en not_active Expired
-
1963
- 1963-09-12 SE SE10018/63A patent/SE315228B/xx unknown
- 1963-09-30 US US312488A patent/US3398363A/en not_active Expired - Lifetime
- 1963-10-02 DE DEM58408A patent/DE1255539B/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US3398363A (en) | 1968-08-20 |
| DE1255539B (de) | 1967-11-30 |
| SE315228B (enExample) | 1969-09-22 |
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