SE315228B - - Google Patents

Info

Publication number
SE315228B
SE315228B SE10018/63A SE1001863A SE315228B SE 315228 B SE315228 B SE 315228B SE 10018/63 A SE10018/63 A SE 10018/63A SE 1001863 A SE1001863 A SE 1001863A SE 315228 B SE315228 B SE 315228B
Authority
SE
Sweden
Prior art keywords
fault
output
outputs
blank
voltage
Prior art date
Application number
SE10018/63A
Other languages
English (en)
Inventor
W Mortley
Original Assignee
Marconi Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marconi Co Ltd filed Critical Marconi Co Ltd
Publication of SE315228B publication Critical patent/SE315228B/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/14—Digital output to display device ; Cooperation and interconnection of the display device with other functional units
    • G06F3/153—Digital output to display device ; Cooperation and interconnection of the display device with other functional units using cathode-ray tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
SE10018/63A 1962-10-02 1963-09-12 SE315228B (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB37231/62A GB984885A (en) 1962-10-02 1962-10-02 Improvements in or relating to equipment testing systems

Publications (1)

Publication Number Publication Date
SE315228B true SE315228B (xx) 1969-09-22

Family

ID=10394826

Family Applications (1)

Application Number Title Priority Date Filing Date
SE10018/63A SE315228B (xx) 1962-10-02 1963-09-12

Country Status (4)

Country Link
US (1) US3398363A (xx)
DE (1) DE1255539B (xx)
GB (1) GB984885A (xx)
SE (1) SE315228B (xx)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3464001A (en) * 1967-06-27 1969-08-26 Northern Electric Co Apparatus for sequentially testing the crosspoints of a ferreed switch for contact resistance
US3593130A (en) * 1968-10-01 1971-07-13 Molekularelektronik A circuit for a sorting unit of a programmed automatic measuring device especially adapted for testing of integrated control circuits
US4195257A (en) * 1975-12-04 1980-03-25 Kabushiki Kaisha Meidensha Testing apparatus for a circuit assembly
GB2086061B (en) * 1980-10-13 1985-05-22 Marconi Instruments Ltd Automatic test systems
US4803422A (en) * 1987-12-28 1989-02-07 General Dynamics, Pomona Division Electrical monitoring of flip-chip hybridization

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2937369A (en) * 1955-12-29 1960-05-17 Honeywell Regulator Co Electrical signal measuring apparatus
US2878450A (en) * 1957-05-23 1959-03-17 Marquardt Aircraft Co High speed multi-channel voltage indicator
US3179883A (en) * 1960-11-08 1965-04-20 Bell Telephone Labor Inc Point matrix display unit for testing logic circuit

Also Published As

Publication number Publication date
US3398363A (en) 1968-08-20
GB984885A (en) 1965-03-03
DE1255539B (de) 1967-11-30

Similar Documents

Publication Publication Date Title
US2625614A (en) Envelope delay scanning system
US4223220A (en) Method for electronically imaging the potential distribution in an electronic component and arrangement for implementing the method
US3792195A (en) Signal monitor for recurrent electrical signals
US2887652A (en) Apparatus for the study of the transient properties of an electric transmission circuit
SE315228B (xx)
US2380929A (en) Indicating system particularly for the measure of angles
US3825835A (en) Signal-to-noise ratio measurement
US3713146A (en) Circuitry for remotely displaying radar imagery using a single data channel
US2490530A (en) Wave-signal analyzing system
US2885470A (en) Television transmission quality testing system
US2524296A (en) Pulse-echo radio locator system
US3382436A (en) Panoramic solid-lined and dotted graphic display systems
US3456189A (en) Synchronized random sampling oscilloscope
US2848648A (en) Bar graph oscilloscopes
US2426439A (en) Signal portraying apparatus
US3735038A (en) Means for superimposing a marker signal onto a composite video signal
US4829366A (en) Method and apparatus for measuring delay and/or gain difference using two different frequency sources
US2875402A (en) Trace brightening circuit
US2704807A (en) Panoramic devices
US2438717A (en) Beam switch for single trace observance
US3119949A (en) Television type selected raster lines display
US2538503A (en) Television signal monitoring equipment
US2625667A (en) Multiple trace oscilloscope
US3573538A (en) Gating circuit for selecting synchronization pulses to trigger an oscilloscope
US2573970A (en) Cathode-ray tube time-base circuit