DE112021000475T5 - Halbleiter-laserelement - Google Patents
Halbleiter-laserelement Download PDFInfo
- Publication number
- DE112021000475T5 DE112021000475T5 DE112021000475.1T DE112021000475T DE112021000475T5 DE 112021000475 T5 DE112021000475 T5 DE 112021000475T5 DE 112021000475 T DE112021000475 T DE 112021000475T DE 112021000475 T5 DE112021000475 T5 DE 112021000475T5
- Authority
- DE
- Germany
- Prior art keywords
- film
- layer
- semiconductor laser
- laser element
- face
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 252
- 230000001681 protective effect Effects 0.000 claims abstract description 10
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 22
- 150000004767 nitrides Chemical class 0.000 claims description 21
- 206010030924 Optic ischaemic neuropathy Diseases 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 17
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 14
- 229910002601 GaN Inorganic materials 0.000 claims description 12
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 11
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 7
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 5
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims description 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 3
- 239000010410 layer Substances 0.000 description 251
- 230000003287 optical effect Effects 0.000 description 24
- 239000011241 protective layer Substances 0.000 description 19
- 238000002310 reflectometry Methods 0.000 description 19
- 239000002356 single layer Substances 0.000 description 14
- 239000000758 substrate Substances 0.000 description 14
- 230000015572 biosynthetic process Effects 0.000 description 13
- 238000004519 manufacturing process Methods 0.000 description 12
- 238000005253 cladding Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 11
- 238000003786 synthesis reaction Methods 0.000 description 11
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 9
- 238000009792 diffusion process Methods 0.000 description 9
- 229910052760 oxygen Inorganic materials 0.000 description 9
- 239000001301 oxygen Substances 0.000 description 9
- 230000000052 comparative effect Effects 0.000 description 7
- 230000006866 deterioration Effects 0.000 description 7
- 238000001308 synthesis method Methods 0.000 description 7
- 230000008859 change Effects 0.000 description 6
- 229910052737 gold Inorganic materials 0.000 description 6
- 230000002194 synthesizing effect Effects 0.000 description 6
- 229910052719 titanium Inorganic materials 0.000 description 5
- 238000000151 deposition Methods 0.000 description 4
- 230000008021 deposition Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910052697 platinum Inorganic materials 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000004020 luminiscence type Methods 0.000 description 3
- 238000004544 sputter deposition Methods 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 238000000231 atomic layer deposition Methods 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000002542 deteriorative effect Effects 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 229910052763 palladium Inorganic materials 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000004549 pulsed laser deposition Methods 0.000 description 2
- 238000001771 vacuum deposition Methods 0.000 description 2
- 229910002704 AlGaN Inorganic materials 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009616 inductively coupled plasma Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18361—Structure of the reflectors, e.g. hybrid mirrors
- H01S5/18369—Structure of the reflectors, e.g. hybrid mirrors based on dielectric materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
- H01S5/0287—Facet reflectivity
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18361—Structure of the reflectors, e.g. hybrid mirrors
- H01S5/18377—Structure of the reflectors, e.g. hybrid mirrors comprising layers of different kind of materials, e.g. combinations of semiconducting with dielectric or metallic layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
- H01S5/2218—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special optical properties
- H01S5/222—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers having special optical properties having a refractive index lower than that of the cladding layers or outer guiding layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3211—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities
- H01S5/3216—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities quantum well or superlattice cladding layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/14—External cavity lasers
- H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
- H01S5/143—Littman-Metcalf configuration, e.g. laser - grating - mirror
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4012—Beam combining, e.g. by the use of fibres, gratings, polarisers, prisms
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
- H01S5/4031—Edge-emitting structures
- H01S5/4062—Edge-emitting structures with an external cavity or using internal filters, e.g. Talbot filters
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Geometry (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020046662 | 2020-03-17 | ||
| JP2020-046662 | 2020-03-17 | ||
| PCT/JP2021/007842 WO2021187081A1 (ja) | 2020-03-17 | 2021-03-02 | 半導体レーザ素子 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE112021000475T5 true DE112021000475T5 (de) | 2022-12-01 |
Family
ID=77768133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112021000475.1T Pending DE112021000475T5 (de) | 2020-03-17 | 2021-03-02 | Halbleiter-laserelement |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20230072452A1 (https=) |
| JP (1) | JP7696887B2 (https=) |
| CN (1) | CN115280612A (https=) |
| DE (1) | DE112021000475T5 (https=) |
| WO (1) | WO2021187081A1 (https=) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102017112610A1 (de) * | 2017-06-08 | 2018-12-13 | Osram Opto Semiconductors Gmbh | Kantenemittierender Halbleiterlaser und Betriebsverfahren für einen solchen Halbleiterlaser |
| KR20230033185A (ko) * | 2021-08-30 | 2023-03-08 | 삼성디스플레이 주식회사 | 표시 장치, 발광 소자의 제조 방법, 및 이에 따라 제조된 발광 소자를 포함하는 표시 장치의 제조 방법 |
| WO2023149081A1 (ja) * | 2022-02-01 | 2023-08-10 | パナソニックホールディングス株式会社 | 半導体レーザ素子 |
| JP2023160590A (ja) * | 2022-04-22 | 2023-11-02 | 華信光電科技股▲分▼有限公司 | 端面発光半導体レーザ |
| JPWO2024004677A1 (https=) * | 2022-06-28 | 2024-01-04 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003142768A (ja) * | 2001-08-23 | 2003-05-16 | Furukawa Electric Co Ltd:The | 光伝送装置、それに用いられる半導体レーザ装置及びその製造方法 |
| JP2004088049A (ja) * | 2002-03-08 | 2004-03-18 | Mitsubishi Electric Corp | 光半導体装置 |
| JP2004363534A (ja) * | 2002-09-05 | 2004-12-24 | Mitsubishi Electric Corp | 半導体光素子装置およびそれが用いられた半導体レーザモジュール |
| JP4097552B2 (ja) * | 2003-03-27 | 2008-06-11 | 三菱電機株式会社 | 半導体レーザ装置 |
| US7852893B2 (en) * | 2007-02-26 | 2010-12-14 | Kabushiki Kaisha Toshiba | Semiconductor laser device |
| JP2008294202A (ja) * | 2007-05-24 | 2008-12-04 | Nec Electronics Corp | ファブリペロー型共振器レーザとその設計方法 |
| JP2009231367A (ja) * | 2008-03-19 | 2009-10-08 | Sharp Corp | 窒化物半導体レーザ素子および外部共振器型半導体レーザ装置 |
| WO2010005027A1 (ja) * | 2008-07-10 | 2010-01-14 | 浜岡東芝エレクトロニクス株式会社 | 半導体レーザ装置 |
| JP5193718B2 (ja) * | 2008-07-18 | 2013-05-08 | パナソニック株式会社 | 窒化物半導体レーザ装置 |
| CN101741013A (zh) * | 2008-11-21 | 2010-06-16 | 三洋电机株式会社 | 氮化物类半导体激光元件和光拾取装置 |
| JP2010219436A (ja) * | 2009-03-18 | 2010-09-30 | Sony Corp | 多波長半導体レーザおよび光学記録再生装置 |
| JP2012064637A (ja) * | 2010-09-14 | 2012-03-29 | Sanyo Electric Co Ltd | 半導体レーザ素子、半導体レーザ装置およびこれを用いた光装置 |
| JP2012084753A (ja) * | 2010-10-14 | 2012-04-26 | Sanyo Electric Co Ltd | 窒化物系半導体レーザ素子及び光装置 |
| KR20140127034A (ko) * | 2013-04-24 | 2014-11-03 | 주식회사 옵토웰 | 에지 에미팅 레이저 다이오드 및 그의 제조방법 |
| JP5959484B2 (ja) * | 2013-08-23 | 2016-08-02 | ウシオオプトセミコンダクター株式会社 | 半導体レーザ素子、及び半導体レーザ装置 |
| DE102017112610A1 (de) * | 2017-06-08 | 2018-12-13 | Osram Opto Semiconductors Gmbh | Kantenemittierender Halbleiterlaser und Betriebsverfahren für einen solchen Halbleiterlaser |
| JP2019129216A (ja) * | 2018-01-24 | 2019-08-01 | パナソニック株式会社 | 窒化物半導体レーザ素子及び半導体レーザ装置 |
| JP7296934B2 (ja) * | 2018-02-14 | 2023-06-23 | ヌヴォトンテクノロジージャパン株式会社 | 窒化物半導体レーザ素子及び照明光源モジュール |
| WO2020026730A1 (ja) * | 2018-07-30 | 2020-02-06 | パナソニック株式会社 | 半導体発光装置及び外部共振型レーザ装置 |
-
2021
- 2021-03-02 WO PCT/JP2021/007842 patent/WO2021187081A1/ja not_active Ceased
- 2021-03-02 JP JP2022508185A patent/JP7696887B2/ja active Active
- 2021-03-02 CN CN202180020766.4A patent/CN115280612A/zh active Pending
- 2021-03-02 US US17/904,385 patent/US20230072452A1/en active Pending
- 2021-03-02 DE DE112021000475.1T patent/DE112021000475T5/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2021187081A1 (ja) | 2021-09-23 |
| JP7696887B2 (ja) | 2025-06-23 |
| CN115280612A (zh) | 2022-11-01 |
| JPWO2021187081A1 (https=) | 2021-09-23 |
| US20230072452A1 (en) | 2023-03-09 |
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