DE112012002411T5 - Polierkopf, Poliervorrichtung und Verfahren zum Polieren eines Werkstücks - Google Patents
Polierkopf, Poliervorrichtung und Verfahren zum Polieren eines Werkstücks Download PDFInfo
- Publication number
- DE112012002411T5 DE112012002411T5 DE112012002411.7T DE112012002411T DE112012002411T5 DE 112012002411 T5 DE112012002411 T5 DE 112012002411T5 DE 112012002411 T DE112012002411 T DE 112012002411T DE 112012002411 T5 DE112012002411 T5 DE 112012002411T5
- Authority
- DE
- Germany
- Prior art keywords
- workpiece
- polishing
- holding plate
- shape
- polishing head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q3/00—Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
- B23Q3/02—Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine for mounting on a work-table, tool-slide, or analogous part
- B23Q3/10—Auxiliary devices, e.g. bolsters, extension members
- B23Q3/106—Auxiliary devices, e.g. bolsters, extension members extendable members, e.g. extension members
- B23Q3/107—Auxiliary devices, e.g. bolsters, extension members extendable members, e.g. extension members with positive adjustment means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/129—Preparing bulk and homogeneous wafers by polishing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/20—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by the properties tested or measured, e.g. structural or electrical properties
- H10P74/203—Structural properties, e.g. testing or measuring thicknesses, line widths, warpage, bond strengths or physical defects
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49998—Work holding
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011137789A JP2013004928A (ja) | 2011-06-21 | 2011-06-21 | 研磨ヘッド、研磨装置及びワークの研磨方法 |
| JPJP-2011-137789 | 2011-06-21 | ||
| PCT/JP2012/003454 WO2012176376A1 (ja) | 2011-06-21 | 2012-05-28 | 研磨ヘッド、研磨装置及びワークの研磨方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE112012002411T5 true DE112012002411T5 (de) | 2014-04-30 |
Family
ID=47422242
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112012002411.7T Withdrawn DE112012002411T5 (de) | 2011-06-21 | 2012-05-28 | Polierkopf, Poliervorrichtung und Verfahren zum Polieren eines Werkstücks |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20140101925A1 (https=) |
| JP (1) | JP2013004928A (https=) |
| KR (1) | KR20140048887A (https=) |
| CN (1) | CN103702798A (https=) |
| DE (1) | DE112012002411T5 (https=) |
| SG (1) | SG194964A1 (https=) |
| TW (1) | TW201321130A (https=) |
| WO (1) | WO2012176376A1 (https=) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101596561B1 (ko) * | 2014-01-02 | 2016-03-07 | 주식회사 엘지실트론 | 웨이퍼 연마 장치 |
| US9566687B2 (en) * | 2014-10-13 | 2017-02-14 | Sunedison Semiconductor Limited (Uen201334164H) | Center flex single side polishing head having recess and cap |
| CN104282545A (zh) * | 2014-10-15 | 2015-01-14 | 易德福 | 一种晶片研磨方法 |
| GB2534130B (en) * | 2015-01-06 | 2018-12-19 | Smart Separations Ltd | Apparatus and methods |
| JP6394569B2 (ja) * | 2015-11-06 | 2018-09-26 | 信越半導体株式会社 | ウェーハの研磨方法及び研磨装置 |
| JP6508123B2 (ja) * | 2016-05-13 | 2019-05-08 | 信越半導体株式会社 | テンプレートアセンブリの選別方法及びワークの研磨方法並びにテンプレートアセンブリ |
| JP6312229B1 (ja) * | 2017-06-12 | 2018-04-18 | 信越半導体株式会社 | 研磨方法及び研磨装置 |
| CN111434458A (zh) * | 2019-01-11 | 2020-07-21 | 株式会社 V 技术 | 研磨头及研磨装置 |
| CN111390750B (zh) * | 2020-03-25 | 2021-09-03 | 福建北电新材料科技有限公司 | 晶片面型加工装置 |
| JP7363978B1 (ja) * | 2022-07-04 | 2023-10-18 | 株式会社Sumco | ウェーハ研磨条件の決定方法、ウェーハの製造方法およびウェーハ片面研磨システム |
| CN118528086B (zh) * | 2024-07-29 | 2024-09-17 | 万向钱潮股份公司 | 一种轴承双端面加工方法及系统 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0970750A (ja) * | 1995-09-07 | 1997-03-18 | Sony Corp | 基板研磨装置 |
| JP2000198069A (ja) * | 1998-10-30 | 2000-07-18 | Shin Etsu Handotai Co Ltd | 研磨用ワ―ク保持盤およびその製造方法ならびにワ―クの研磨方法および研磨装置 |
| WO2000025981A1 (en) * | 1998-10-30 | 2000-05-11 | Shin-Etsu Handotai Co., Ltd. | Unpolished work holding board and production method thereof and work polishing method and device |
| US6758726B2 (en) * | 2002-06-28 | 2004-07-06 | Lam Research Corporation | Partial-membrane carrier head |
| CN100468646C (zh) * | 2005-02-02 | 2009-03-11 | 联华电子股份有限公司 | 化学机械研磨方法 |
-
2011
- 2011-06-21 JP JP2011137789A patent/JP2013004928A/ja active Pending
-
2012
- 2012-05-28 KR KR1020137033820A patent/KR20140048887A/ko not_active Withdrawn
- 2012-05-28 SG SG2013084462A patent/SG194964A1/en unknown
- 2012-05-28 DE DE112012002411.7T patent/DE112012002411T5/de not_active Withdrawn
- 2012-05-28 US US14/117,566 patent/US20140101925A1/en not_active Abandoned
- 2012-05-28 WO PCT/JP2012/003454 patent/WO2012176376A1/ja not_active Ceased
- 2012-05-28 CN CN201280029952.5A patent/CN103702798A/zh active Pending
- 2012-06-14 TW TW101121349A patent/TW201321130A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JP2013004928A (ja) | 2013-01-07 |
| CN103702798A (zh) | 2014-04-02 |
| KR20140048887A (ko) | 2014-04-24 |
| WO2012176376A1 (ja) | 2012-12-27 |
| US20140101925A1 (en) | 2014-04-17 |
| TW201321130A (zh) | 2013-06-01 |
| SG194964A1 (en) | 2013-12-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |