DE112011106139B3 - Ionenätzvorrichtung - Google Patents

Ionenätzvorrichtung Download PDF

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Publication number
DE112011106139B3
DE112011106139B3 DE112011106139.0T DE112011106139T DE112011106139B3 DE 112011106139 B3 DE112011106139 B3 DE 112011106139B3 DE 112011106139 T DE112011106139 T DE 112011106139T DE 112011106139 B3 DE112011106139 B3 DE 112011106139B3
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DE
Germany
Prior art keywords
sample
ion
ion beam
mask
axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE112011106139.0T
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German (de)
English (en)
Inventor
Atsushi Kamino
Asako Kaneko
Toru Iwaya
Hirobumi Muto
Hisayuki Takasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Hitachi High Tech Corp
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Publication of DE112011106139B3 publication Critical patent/DE112011106139B3/de
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
    • H01J37/3053—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching for evaporating or etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/16—Vessels; Containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002—Details
    • H01J37/3005—Observing the objects or the point of impact on the object
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002—Details
    • H01J37/3007—Electron or ion-optical systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/202—Movement
    • H01J2237/20207—Tilt
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/202—Movement
    • H01J2237/20214—Rotation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Sampling And Sample Adjustment (AREA)
DE112011106139.0T 2010-11-05 2011-11-02 Ionenätzvorrichtung Active DE112011106139B3 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010248022 2010-11-05
JP2010-248022 2010-11-05

Publications (1)

Publication Number Publication Date
DE112011106139B3 true DE112011106139B3 (de) 2018-10-11

Family

ID=46024529

Family Applications (2)

Application Number Title Priority Date Filing Date
DE112011106139.0T Active DE112011106139B3 (de) 2010-11-05 2011-11-02 Ionenätzvorrichtung
DE112011103677.9T Active DE112011103677B4 (de) 2010-11-05 2011-11-02 Ionenätzvorrichtung

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE112011103677.9T Active DE112011103677B4 (de) 2010-11-05 2011-11-02 Ionenätzvorrichtung

Country Status (6)

Country Link
US (3) US20130220806A1 (enExample)
JP (2) JP5491639B2 (enExample)
KR (1) KR101470267B1 (enExample)
CN (2) CN103180929B (enExample)
DE (2) DE112011106139B3 (enExample)
WO (1) WO2012060416A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018212511A1 (de) * 2018-07-26 2020-01-30 Carl Zeiss Microscopy Gmbh Aufnahmevorrichtung, Probenhalter-System und Verfahren zur Präparation mikroskopischer Proben

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JP6529264B2 (ja) * 2014-01-22 2019-06-12 株式会社日立ハイテクサイエンス 荷電粒子ビーム装置および試料観察方法
CN103831675B (zh) * 2014-03-19 2016-03-30 中国科学院光电技术研究所 一种大口径光学元件的离子束加工装置及方法
US9761412B2 (en) * 2014-05-09 2017-09-12 Hitachi High-Technologies Corporation Ion milling apparatus and sample processing method
DE112015005875B4 (de) 2015-01-30 2021-03-18 Hitachi High-Tech Corporation Maskenpositionseinstellverfahren zum ionenfräsen, elektronenmikroskop zum einstellen der maskenposition, auf probenbühne montierte maskeneinstellvorrichtung und probenmaskenkomponente einer ionenfräsvorrichtung
CN105158516B (zh) * 2015-08-20 2018-10-16 上海华力微电子有限公司 一种集成电路分析中透射电镜平面样品的制备方法
WO2017051469A1 (ja) 2015-09-25 2017-03-30 株式会社日立ハイテクノロジーズ イオンミリング装置
DE102015219298B4 (de) * 2015-10-06 2019-01-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Präparation einer Probe für die Mikrostrukturdiagnostik sowie Probe für die Mikrostrukturdiagnostik
US11226273B2 (en) * 2016-02-03 2022-01-18 Hitachi High-Tech Corporation Sample holder, ion milling apparatus, sample processing method, sample observing method, and sample processing and observing method
CN108475608B (zh) * 2016-02-26 2021-07-09 株式会社日立高新技术 离子铣削装置以及离子铣削方法
JP2017174504A (ja) * 2016-03-18 2017-09-28 株式会社日立ハイテクサイエンス 複合荷電粒子ビーム装置
JP6753679B2 (ja) * 2016-03-25 2020-09-09 株式会社日立ハイテクサイエンス 制御装置、荷電粒子ビーム装置、プログラム及び加工品を生産する方法
JP6489322B2 (ja) * 2016-04-28 2019-03-27 日新イオン機器株式会社 イオンビームエッチング装置
CN105973674B (zh) * 2016-07-01 2017-03-29 中国科学院地质与地球物理研究所 一种大面积薄区透射电镜样品的制备方法
KR102123887B1 (ko) * 2016-07-14 2020-06-17 주식회사 히타치하이테크 이온 밀링 장치
WO2018029778A1 (ja) * 2016-08-09 2018-02-15 株式会社日立ハイテクノロジーズ 荷電粒子線装置
JP6928943B2 (ja) * 2017-03-28 2021-09-01 株式会社日立ハイテクサイエンス 荷電粒子ビーム装置
JP6817139B2 (ja) * 2017-05-09 2021-01-20 日本電子株式会社 試料ホルダーユニット及び試料観察装置
JP6943641B2 (ja) * 2017-06-12 2021-10-06 日本電子株式会社 試料ホルダーシステム及び試料観察装置
KR102551000B1 (ko) * 2018-02-28 2023-07-05 주식회사 히타치하이테크 이온 밀링 장치 및 이온 밀링 장치의 이온원 조정 방법
JP6843790B2 (ja) * 2018-03-13 2021-03-17 日本電子株式会社 イオンミリング装置及び試料ホルダー
DE102018204940B4 (de) * 2018-03-29 2023-03-30 Leica Microsystems Cms Gmbh Optisches System mit verkippter Beleuchtungsebene und Verfahren zum Beleuchten eines Probenvolumens in einem optischen System mit verkippter Beleuchtungsebene
JP6808691B2 (ja) * 2018-08-09 2021-01-06 日本電子株式会社 試料搬送装置及び電子顕微鏡
JP6851348B2 (ja) * 2018-08-15 2021-03-31 日本電子株式会社 真空装置及び復旧支援方法
JP6828095B2 (ja) * 2019-07-08 2021-02-10 株式会社日立ハイテク イオンミリング方法
CN110355455B (zh) * 2019-08-02 2020-06-16 中国科学院地质与地球物理研究所 氩离子切割装置
CN110605467B (zh) * 2019-09-20 2020-08-04 中国科学院地质与地球物理研究所 离子切割校准装置、校准方法及离子切割装置
CN110993475B (zh) * 2019-12-05 2020-08-28 山东省分析测试中心 一种用于断口分析的扫描电镜万向转动样品台及扫描电镜
JP6831443B2 (ja) * 2019-12-24 2021-02-17 株式会社日立ハイテク イオンミリング装置、及びイオンミリング方法
JP2020194789A (ja) * 2020-08-11 2020-12-03 株式会社日立ハイテク イオンミリング方法、およびイオンミリング装置
JP7208195B2 (ja) * 2020-08-14 2023-01-18 日本電子株式会社 イオンミリング装置および試料ホルダー
KR102465468B1 (ko) * 2020-12-21 2022-11-09 (주)코셈 착탈 가능한 계단형 지그와, 이를 이용하여 시료의 높이를 조절하는 홀더, 및 이 홀더를 포함하는 시료대
JP7312777B2 (ja) * 2021-02-26 2023-07-21 日本電子株式会社 試料加工装置および試料加工方法
US20250046567A1 (en) * 2021-12-14 2025-02-06 Hitachi High-Tech Corporation Ion Milling Device
WO2024034052A1 (ja) * 2022-08-10 2024-02-15 株式会社日立ハイテク イオンミリング装置及びそれを用いた加工方法
WO2024053073A1 (ja) * 2022-09-08 2024-03-14 株式会社日立ハイテク イオンミリング装置、断面ミリング処理方法及び断面ミリングホルダ
WO2025004137A1 (ja) * 2023-06-26 2025-01-02 株式会社日立ハイテク 試料カートリッジおよび荷電粒子線装置
US20250316525A1 (en) * 2024-04-04 2025-10-09 Applied Materials, Inc. Semiconductor Processing System with Horizontal Scan

Citations (7)

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Publication number Priority date Publication date Assignee Title
DE69128994T2 (de) * 1990-09-17 1998-07-02 Matsushita Electric Ind Co Ltd Verfahren zur Erzeugung mikroskopischer Strukturen
JPH10188873A (ja) * 1996-12-24 1998-07-21 Hitachi Ltd イオンミリング装置
US20050118065A1 (en) * 2003-09-16 2005-06-02 Jeol Ltd. Apparatus and method for preparing samples
US20050236587A1 (en) * 2002-07-12 2005-10-27 Toshio Kodama Ion beam device and ion beam processing method, and holder member
US20070125958A1 (en) * 2005-11-01 2007-06-07 Fei Company Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
US20070227879A1 (en) * 2006-04-04 2007-10-04 Isao Yamada Ultra precise polishing method and ultra precise polishing apparatus
US20080202920A1 (en) * 2007-02-22 2008-08-28 Hitachi High-Technologies Corporation Ion Milling system and ion milling method

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US7150811B2 (en) * 2002-11-26 2006-12-19 Pei Company Ion beam for target recovery
US7611610B2 (en) * 2003-11-18 2009-11-03 Fei Company Method and apparatus for controlling topographical variation on a milled cross-section of a structure
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JP4891712B2 (ja) 2006-09-05 2012-03-07 株式会社日立ハイテクノロジーズ 類似度分布を利用したテンプレートマッチング方法を用いた検査装置
JP5331342B2 (ja) * 2008-01-11 2013-10-30 株式会社日立ハイテクノロジーズ イオンミリング装置
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JP2011154920A (ja) * 2010-01-28 2011-08-11 Hitachi High-Technologies Corp イオンミリング装置，試料加工方法，加工装置、および試料駆動機構
JP5612493B2 (ja) * 2010-03-18 2014-10-22 株式会社日立ハイテクサイエンス 複合荷電粒子ビーム装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69128994T2 (de) * 1990-09-17 1998-07-02 Matsushita Electric Ind Co Ltd Verfahren zur Erzeugung mikroskopischer Strukturen
JPH10188873A (ja) * 1996-12-24 1998-07-21 Hitachi Ltd イオンミリング装置
US20050236587A1 (en) * 2002-07-12 2005-10-27 Toshio Kodama Ion beam device and ion beam processing method, and holder member
US20050118065A1 (en) * 2003-09-16 2005-06-02 Jeol Ltd. Apparatus and method for preparing samples
US20070125958A1 (en) * 2005-11-01 2007-06-07 Fei Company Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
US20070227879A1 (en) * 2006-04-04 2007-10-04 Isao Yamada Ultra precise polishing method and ultra precise polishing apparatus
US20080202920A1 (en) * 2007-02-22 2008-08-28 Hitachi High-Technologies Corporation Ion Milling system and ion milling method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018212511A1 (de) * 2018-07-26 2020-01-30 Carl Zeiss Microscopy Gmbh Aufnahmevorrichtung, Probenhalter-System und Verfahren zur Präparation mikroskopischer Proben
DE102018212511B4 (de) * 2018-07-26 2020-02-06 Carl Zeiss Microscopy Gmbh Aufnahmevorrichtung, Probenhalter-System und Verfahren zur Präparation mikroskopischer Proben

Also Published As

Publication number Publication date
CN105047511A (zh) 2015-11-11
CN103180929B (zh) 2015-06-10
DE112011103677T5 (de) 2013-08-22
US20130220806A1 (en) 2013-08-29
US11133153B2 (en) 2021-09-28
JP2014139938A (ja) 2014-07-31
JPWO2012060416A1 (ja) 2014-05-12
US20180301318A1 (en) 2018-10-18
CN103180929A (zh) 2013-06-26
US20160163508A1 (en) 2016-06-09
KR20130077884A (ko) 2013-07-09
US10008365B2 (en) 2018-06-26
JP5491639B2 (ja) 2014-05-14
CN105047511B (zh) 2017-03-29
JP5943950B2 (ja) 2016-07-05
WO2012060416A1 (ja) 2012-05-10
KR101470267B1 (ko) 2014-12-05
DE112011103677B4 (de) 2017-10-05

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