DE112009000838T5 - Contact unit - Google Patents
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- Publication number
- DE112009000838T5 DE112009000838T5 DE112009000838T DE112009000838T DE112009000838T5 DE 112009000838 T5 DE112009000838 T5 DE 112009000838T5 DE 112009000838 T DE112009000838 T DE 112009000838T DE 112009000838 T DE112009000838 T DE 112009000838T DE 112009000838 T5 DE112009000838 T5 DE 112009000838T5
- Authority
- DE
- Germany
- Prior art keywords
- wafer
- main body
- transport device
- pressure element
- electrical contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67706—Mechanical details, e.g. roller, belt
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/02—Conveying systems characterised by their application for specified purposes not otherwise provided for for conveying workpieces through baths of liquid
- B65G49/04—Conveying systems characterised by their application for specified purposes not otherwise provided for for conveying workpieces through baths of liquid the workpieces being immersed and withdrawn by movement in a vertical direction
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/10—Electrodes, e.g. composition, counter electrode
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67709—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations using magnetic elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
Abstract
Transportvorrichtung um Wafer durch eine Flüssigkeit zu transportieren, wobei die Transportvorrichtung vorgesehen ist, Wafer kontinuierlich an einem ersten Ende aufzunehmen und diese im Wesentlichen horizontal zu einem zweiten Ende zu transportieren, bevor die Wafer freigegeben werden, wobei die Transportvorrichtung mindestens zwei Haltevorrichtungen umfasst (10; 110; 210), um jeden Wafer zu halten und elektrisch zwischen den zumindest zwei Kontaktvorrichtungen während des Transports durch die Flüssigkeit zu kontaktieren, wobei jede Haltevorrichtung umfasst:
– einen Hauptkörper (12; 112; 212) umfassend eine im Wesentlichen keilförmige Öffnung (14a, 14b; 114a, 114b; 214a, 214b), um ein Ende jedes Wafers aufzunehmen;
– ein elektrischer Kontakt (40; 140; 240), um das Ende jedes Wafers zu kontaktieren, wobei der elektrische Kontakt mit einer Energieversorgung verbunden ist;
– ein Druckelement (20; 120; 220), das beweglich mit dem Hauptkörper verbunden ist, um den elektrischen Kontakt (40; 140; 240) zum Ende eines jeden Wafers zu drücken.A transport device for transporting wafers through a liquid, wherein the transport device is provided to receive wafers continuously at a first end and to transport them substantially horizontally to a second end before the wafers are released, wherein the transport device comprises at least two holding devices (10; 110, 210) to hold each wafer and electrically contact between the at least two contact devices during transport through the liquid, each holding device comprising:
- a main body (12; 112; 212) comprising a substantially wedge-shaped opening (14a, 14b; 114a, 114b; 214a, 214b) for receiving an end of each wafer;
- an electrical contact (40; 140; 240) for contacting the end of each wafer, the electrical contact being connected to a power supply;
A pressure member (20; 120; 220) movably connected to the main body for urging the electrical contact (40; 140; 240) to the end of each wafer.
Description
TECHNISCHES GEBIETTECHNICAL AREA
Die vorliegende Erfindung bezieht sich auf eine Vorrichtung zum Kontaktieren eines Solarzellenwafers.The The present invention relates to a device for contacting a solar cell wafer.
STAND DER TECHNIKSTATE OF THE ART
In
der
In
der
Diese Veröffentlichungen werden zum Beispiel im Galvanisierungsprozess verwendet, wo zum Beispiel Ni, Cu, Sn und/oder Ag auf den Wafer aufgebracht werden.These Publications are for example in the galvanization process where, for example, Ni, Cu, Sn and / or Ag on the wafer be applied.
Eine
Herausforderung in diesem Prozess ist es, einen elektrischen Kontakt
zu dem Wafer herzustellen, ohne starke mechanische Kräfte
auf den Wafer auszuüben, die Brüche des Wafers
verursachen können. Des Weiteren ist es notwendig, um die
Geschwindigkeit des Prozesses für die Großproduktion von
Solarzellen zu verbessern. In der Galvanik wird dies erreicht, indem
die Stromdichte, die auf den Wafer aufgebracht wird, erhöht
wird, weil die Anzahl der Metallatome, die auf der Oberfläche
angelagert werden, direkt proportional zu der auf dem Wafer aufgebrachten
Stromdichte ist. Aber es existiert eine obere Grenze für
die Stromdichte, welche als Grenzdiffusionsstromdichte, IL, bezeichnet wird (IL =
(nFDoxcb)/δ). (Ref.:
Aufgabe der vorliegenden Erfindung ist es, den elektrischen Kontakt zu dem Wafer zu verbessern, so dass die oben genannten Bedingungen erfüllt werden können. Die Vorrichtung ermöglicht insbesondere turbulente Agitation von derselben Seite, von der die Kontakte auf dem Wafer aufgebracht sind, während sich die Wafer zur gleichen Zeit kontinuierlich durch den Prozess vorwärts bewegen.task The present invention is to provide the electrical contact to the Wafer to improve, so that meets the above conditions can be. The device allows in particular turbulent agitation from the same side from which contacts on are applied to the wafer while the wafers for same time continuously through the process forward move.
DARSTELLUNG DER ERFINDUNGPRESENTATION OF THE INVENTION
Die vorliegende Erfindung bezieht sich auf eine Vorrichtung zum Kontaktieren eines Wafers, während dieser in eine Flüssigkeit eingetaucht ist, umfassend:
- – Einen Hauptkörper fixiert an einer Transporteinrichtung;
- – Einen elektrischen Kontakt zum Kontaktieren des Wafers;
- – Ein Druckelement, um den elektrischen Kontakt und den Wafer zum Wafer hin zu drücken.
- - A main body fixed to a transport device;
- An electrical contact for contacting the wafer;
- - A pressure element to push the electrical contact and the wafer towards the wafer.
In einer Ausführungsform der Erfindung ist der elektrische Kontakt auf dem Druckelement vorgesehen.In an embodiment of the invention is the electrical Contact on the pressure element provided.
In einer Ausführungsform der Erfindung ist das Druckelement beweglich mit dem Hauptkörper verbunden.In An embodiment of the invention is the pressure element movably connected to the main body.
In einer Ausführungsform der Erfindung umfasst das Druckelement ein schwebendes Element.In An embodiment of the invention comprises the pressure element a floating element.
In einer Ausführungsform der Erfindung umfasst der Hauptkörper eine Ausnehmung, die dazu dient ein Ende des Wafers aufzunehmen.In An embodiment of the invention comprises the main body a recess for receiving an end of the wafer.
In einer Ausführungsform der Erfindung umfasst der elektrische Kontakt einen nach oben hin hervorstehenden Kontakt.In an embodiment of the invention comprises the electrical Contact an upwardly protruding contact.
In einer Ausführungsform der Erfindung ist der nach oben hervorstehende Kontakt mit einem Schienenanschluss zur Verbindung mit einer Sammelschiene verbunden.In an embodiment of the invention is the upwardly projecting Contact with a rail connection for connection to a busbar connected.
In einer Ausführungsform der Erfindung ist der nach oben hervorstehende Kontakt durch einen elektrischen Draht mit dem Schienenanschluss verbunden.In an embodiment of the invention is the upwardly projecting Contact by an electrical wire with the rail connection connected.
In einer Ausführungsform der Erfindung umfasst die Vorrichtung verschiedene, unabhängig voneinander bewegliche Druckelemente mit unabhängigen Schwebeelementen.In An embodiment of the invention comprises the device different, independently movable printing elements with independent floating elements.
DETAILLIERTE BESCHREIBUNGDETAILED DESCRIPTION
Die Ausführungsformen der vorliegenden Erfindung werden nun im Detail mit Bezug auf die angehängten Zeichnungen beschrieben, wobei:The Embodiments of the present invention will now be described in detail with reference to the attached drawings, in which:
Es
wird nun auf
Es
ist anzumerken, dass die oben erwähnten Veröffentlichungen
beschreiben, dass die Haltevorrichtungen
Es
wird nun Bezug genommen auf
Die
Haltevorrichtung
Der
Hauptkörper
Druckelemente
Die
Druckelemente
Ein
nach oben stehender elektrischer Kontakt
Wenn das Druckelement somit in dieser oberen oder geschlossenen Position ist, hält die Haltevorrichtung den Wafer und stellt zur gleichen Zeit einen elektrischen Kontakt zum Wafer her. Wenn das Druckelement in seiner unteren oder offenen Position ist, kann der Wafer in die Haltevorrichtung aufgenommen werden oder von dieser freigegeben werden.If the pressure element thus in this upper or closed position The holder holds the wafer and sets to same time make an electrical contact to the wafer. When the pressure element in its lower or open position, the wafer may be in the Holding device to be included or released from this become.
Der
nach oben hervorstehende elektrische Kontakt
Ein
Schienenanschluss
In
Es
wäre natürlich auch möglich, den elektrischen
Kontakt durch Verwendung von mehr als drei Kontakten
Es
wäre auch möglich, die drei individuellen elektrischen
Kontakte
Zweites AusführungsbeispielSecond embodiment
In
Wie
schon im Zusammenhang mit der ersten Ausführungsform im
Detail beschrieben, umfasst die Vorrichtung
Der
Hauptkörper
Es
sei nun auf
Wie
in den
Nach
oben hervorstehende elektrische Kontakte
Wenn
das Druckelement
Wenn also das Druckelement in dieser oberen oder geschlossenen Position ist, dann hält die Haltevorrichtung den Wafer und stellt gleichzeitig einen elektrischen Kontakt zum Wafer her. Wenn das Druckelement in seiner unteren oder offenen Position ist, kann der Wafer in die Haltevorrichtung aufgenommen werden oder von dieser freigegeben werden.If So the pressure element in this upper or closed position is, then the holding device holds the wafer and sets at the same time an electrical contact to the wafer ago. When the pressure element in its lower or open position, the wafer may be in the Holding device to be included or released from this become.
Drittes AusführungsbeispielThird embodiment
In
Wie
schon im Detail im Zusammenhang mit dem ersten Ausführungsbeispiel
beschrieben, umfasst die Einrichtung
Eine
Aussparung oder Öffnung
Folglich
ist es dem Druckelement
Nach
oben hervorstehende elektrische Kontakte
In
diesem Ausführungsbeispiel kann das Druckelement auch als
im Wesentlichen T-förmig angesehen werden umfassend ein
im Wesentlichen vertikales, zentrales Bauteil
Das
im Wesentlichen horizontale Querbauteil
Wenn
somit das Druckelement in der oberen oder geschlossenen Position
ist, hält die Haltevorrichtung den Wafer und stellt zur
gleichen Zeit einen elektrischen Kontakt zum Wafer her. Wenn das Druckelement
in seiner unteren oder offenen Position ist, kann der Wafer in der
Haltevorrichtung aufgenommen werden oder von dieser freigegeben
werden. In der dritten Ausführungsform ist es nicht der Auftrieb,
der die Bewegung des Druckelementes
Das
Druckelement
Die oben erwähnte detaillierte Beschreibung ist insbesondere zur Illustration und Beschreibung bevorzugter Ausführungsformen der Erfindung dargelegt. Aber die Beschreibung schränkt die Erfindung keineswegs auf die speziellen Ausführungsformen ein.The The above-mentioned detailed description is particularly to illustrate and describe preferred embodiments set forth the invention. But the description limits the invention by no means to the specific embodiments.
Viertes AusführungsbeispielFourth embodiment
In
Wie
schon im Zusammenhang mit der ersten Ausführungsform beschrieben,
umfasst die Vorrichtung
Zwei
Ausnehmungen oder Öffnungen
An
ihrem oberen Ende, die aus jedem Kanal
Fünftes AusführungsbeispielFifth embodiment
In
Wie
schon im Zusammenhang mit der ersten Ausführungsform detailliert
beschrieben, umfasst die Vorrichtung
In
dieser Ausführungsform sind die Druckelemente
In dem oben beschriebenen Ausführungsbeispiel ist das Druckelement beweglich im Bezug zu dem Hauptkörper. Das Druckelement ist insbesondere beweglich zwischen der offenen Position zum Aufnehmen/Freigeben des Wafers und einer geschlossenen Position zum Halten und Kontaktieren des Wafers. In der geschlossenen Position wird der Wafer zwischen dem Hauptkörper und dem Druckelement gehalten.In The embodiment described above is the pressure element movable with respect to the main body. The pressure element is in particular movable between the open position for recording / releasing of the wafer and a closed position for holding and contacting of the wafer. In the closed position, the wafer is between held the main body and the pressure element.
ZusammenfassungSummary
Die vorliegende Erfindung betrifft eine Vorrichtung zum Kontaktieren eines Wafers, während dieser in Flüssigkeit eingetaucht ist. Die Vorrichtung umfasst einen Hauptkörper befestigt an einer Transportvorrichtung; einen elektrischen Kontakt zum Kontaktieren des Wafers und ein Druckelement zum Drücken des elektrischen Kontakts zu dem Wafer.The The present invention relates to a device for contacting a wafer while immersed in liquid is. The device comprises a main body attached on a transport device; an electrical contact for contacting of the wafer and a pressure element for pressing the electrical Contact to the wafer.
ZITATE ENTHALTEN IN DER BESCHREIBUNGQUOTES INCLUDE IN THE DESCRIPTION
Diese Liste der vom Anmelder aufgeführten Dokumente wurde automatisiert erzeugt und ist ausschließlich zur besseren Information des Lesers aufgenommen. Die Liste ist nicht Bestandteil der deutschen Patent- bzw. Gebrauchsmusteranmeldung. Das DPMA übernimmt keinerlei Haftung für etwaige Fehler oder Auslassungen.This list The documents listed by the applicant have been automated generated and is solely for better information recorded by the reader. The list is not part of the German Patent or utility model application. The DPMA takes over no liability for any errors or omissions.
Zitierte PatentliteraturCited patent literature
- - GB 0709619 [0002] GB 0709619 [0002]
- - GB 0719805 [0003] - GB 0719805 [0003]
Zitierte Nicht-PatentliteraturCited non-patent literature
- - M. Paunovic und M. Schlesinger, Fundamentals of Electrochemical Deposition, Second Ed., S. 97 ff, John Wiley and Sons, 2006 [0005] M. Paunovic and M. Schlesinger, Fundamentals of Electrochemical Deposition, Second Ed., P. 97 et seq., John Wiley and Sons, 2006 [0005]
Claims (15)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0806552.6 | 2008-04-10 | ||
GB0806552A GB2459124A (en) | 2008-04-10 | 2008-04-10 | Wafer holder for electroplating apparatus |
PCT/NO2009/000120 WO2009126043A2 (en) | 2008-04-10 | 2009-03-31 | Contacting device |
Publications (1)
Publication Number | Publication Date |
---|---|
DE112009000838T5 true DE112009000838T5 (en) | 2011-02-17 |
Family
ID=39433444
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE112009000838T Withdrawn DE112009000838T5 (en) | 2008-04-10 | 2009-03-31 | Contact unit |
Country Status (7)
Country | Link |
---|---|
US (1) | US20110186424A1 (en) |
JP (1) | JP2011516733A (en) |
KR (1) | KR20110036793A (en) |
CN (1) | CN102084477A (en) |
DE (1) | DE112009000838T5 (en) |
GB (1) | GB2459124A (en) |
WO (1) | WO2009126043A2 (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB709619A (en) | 1951-12-14 | 1954-05-26 | Metro Cutanit Ltd | Improvements in or relating to securing a steel or other metallic part to another part of hard and difficult to work material, such as a shaft to a turbine wheel |
GB719805A (en) | 1952-03-12 | 1954-12-08 | Babcock & Wilcox Ltd | Improvements in or relating to tubular heat exchanger walls |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0586498A (en) * | 1991-09-27 | 1993-04-06 | Olympic Co Ltd | Plating device |
JPH08236605A (en) * | 1995-02-28 | 1996-09-13 | Komatsu Electron Metals Co Ltd | Semiconductor wafer case |
US6251235B1 (en) * | 1999-03-30 | 2001-06-26 | Nutool, Inc. | Apparatus for forming an electrical contact with a semiconductor substrate |
JP3284496B2 (en) * | 2000-08-09 | 2002-05-20 | 株式会社荏原製作所 | Plating apparatus and plating solution removal method |
JP2002256498A (en) * | 2001-02-26 | 2002-09-11 | Tokyo Electron Ltd | Plating device and plating method |
US6558750B2 (en) * | 2001-07-16 | 2003-05-06 | Technic Inc. | Method of processing and plating planar articles |
US20040140217A1 (en) * | 2003-01-22 | 2004-07-22 | Applied Materials, Inc. | Noble metal contacts for plating applications |
DE102004025827B3 (en) * | 2004-05-24 | 2005-06-30 | Höllmüller Maschinenbau GmbH | Electrical contacting device for circuit board or conductor foil passed through electrolytic cell using contacts alternating with transport rollers along each side edge |
GB2449309A (en) * | 2007-05-18 | 2008-11-19 | Renewable Energy Corp Asa | A method for exposing a solar cell wafer to a liquid |
GB2453560A (en) * | 2007-10-10 | 2009-04-15 | Renewable Energy Corp Asa | Wafer electroplating apparatus |
-
2008
- 2008-04-10 GB GB0806552A patent/GB2459124A/en not_active Withdrawn
-
2009
- 2009-03-31 JP JP2011503929A patent/JP2011516733A/en active Pending
- 2009-03-31 DE DE112009000838T patent/DE112009000838T5/en not_active Withdrawn
- 2009-03-31 CN CN200980112800XA patent/CN102084477A/en active Pending
- 2009-03-31 KR KR1020107025169A patent/KR20110036793A/en not_active Application Discontinuation
- 2009-03-31 WO PCT/NO2009/000120 patent/WO2009126043A2/en active Application Filing
- 2009-03-31 US US12/937,209 patent/US20110186424A1/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB709619A (en) | 1951-12-14 | 1954-05-26 | Metro Cutanit Ltd | Improvements in or relating to securing a steel or other metallic part to another part of hard and difficult to work material, such as a shaft to a turbine wheel |
GB719805A (en) | 1952-03-12 | 1954-12-08 | Babcock & Wilcox Ltd | Improvements in or relating to tubular heat exchanger walls |
Non-Patent Citations (1)
Title |
---|
M. Paunovic und M. Schlesinger, Fundamentals of Electrochemical Deposition, Second Ed., S. 97 ff, John Wiley and Sons, 2006 |
Also Published As
Publication number | Publication date |
---|---|
JP2011516733A (en) | 2011-05-26 |
US20110186424A1 (en) | 2011-08-04 |
CN102084477A (en) | 2011-06-01 |
KR20110036793A (en) | 2011-04-11 |
GB2459124A (en) | 2009-10-14 |
WO2009126043A2 (en) | 2009-10-15 |
GB0806552D0 (en) | 2008-05-14 |
WO2009126043A3 (en) | 2009-12-23 |
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R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20131001 |