DE102016217752A1 - Spannungsanalysevorrichtung, Verfahren und Programm - Google Patents

Spannungsanalysevorrichtung, Verfahren und Programm Download PDF

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Publication number
DE102016217752A1
DE102016217752A1 DE102016217752.4A DE102016217752A DE102016217752A1 DE 102016217752 A1 DE102016217752 A1 DE 102016217752A1 DE 102016217752 A DE102016217752 A DE 102016217752A DE 102016217752 A1 DE102016217752 A1 DE 102016217752A1
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DE
Germany
Prior art keywords
error
stress
value
equation
provisional value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102016217752.4A
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German (de)
English (en)
Inventor
Shoichi Yasukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Publication of DE102016217752A1 publication Critical patent/DE102016217752A1/de
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/607—Specific applications or type of materials strain

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE102016217752.4A 2015-09-18 2016-09-16 Spannungsanalysevorrichtung, Verfahren und Programm Withdrawn DE102016217752A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015186004A JP6478189B2 (ja) 2015-09-18 2015-09-18 応力解析装置、方法およびプログラム
JP2015-186004 2015-09-18

Publications (1)

Publication Number Publication Date
DE102016217752A1 true DE102016217752A1 (de) 2017-03-23

Family

ID=58224981

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102016217752.4A Withdrawn DE102016217752A1 (de) 2015-09-18 2016-09-16 Spannungsanalysevorrichtung, Verfahren und Programm

Country Status (4)

Country Link
US (1) US10401310B2 (enExample)
JP (1) JP6478189B2 (enExample)
CN (1) CN106970098B (enExample)
DE (1) DE102016217752A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10416102B2 (en) * 2017-06-23 2019-09-17 Bruker Axs, Inc. X-ray diffraction device and method to measure stress with 2D detector and single sample tilt
JP6775777B2 (ja) * 2017-08-29 2020-10-28 株式会社リガク Ｘ線回折測定における測定結果の表示方法
JP7101040B2 (ja) * 2018-05-09 2022-07-14 三菱製鋼株式会社 ばねの製造方法及びばね
US11519798B2 (en) * 2018-12-18 2022-12-06 Metal Industries Research & Development Centre Residual stress detection device and detection method thereof
WO2023181935A1 (ja) * 2022-03-24 2023-09-28 コニカミノルタ株式会社 予測装置、予測システムおよび予測プログラム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4489425A (en) * 1983-01-14 1984-12-18 Science Applications, Inc. Means and method for determining residual stress on a polycrystalline sample by X-ray diffraction
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US4686631A (en) * 1985-02-08 1987-08-11 Ruud Clayton O Method for determining internal stresses in polycrystalline solids
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
JP3887588B2 (ja) * 2002-08-30 2007-02-28 株式会社リガク Ｘ線回折による応力測定法
JP5842242B2 (ja) * 2013-10-17 2016-01-13 国立大学法人金沢大学 回折環分析方法および回折環分析装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Baoping Bob He, Kingsley L. Smith, Strain and Spannung Measurements with a Two-Dimensional Detector, JCPDS-International Centre for Diffraction Data 1999, S.505
K. TANAKA, Y. AKINIWA, "Diffraction Measurements of Residual MacroSpannung and MicroSpannung Using X-Rays, Synchrotron and Neutrons", JSME International Journal. Series A, v. 47, n. 3, Jul, 2004, S. 252–263

Also Published As

Publication number Publication date
JP2017058349A (ja) 2017-03-23
CN106970098A (zh) 2017-07-21
CN106970098B (zh) 2020-05-22
US10401310B2 (en) 2019-09-03
US20170082561A1 (en) 2017-03-23
JP6478189B2 (ja) 2019-03-06

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R012 Request for examination validly filed
R079 Amendment of ipc main class

Free format text: PREVIOUS MAIN CLASS: G01B0015080000

Ipc: G01N0023207000

R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee