CN106970098B - 应力解析装置、方法以及程序 - Google Patents

应力解析装置、方法以及程序 Download PDF

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Publication number
CN106970098B
CN106970098B CN201610821660.5A CN201610821660A CN106970098B CN 106970098 B CN106970098 B CN 106970098B CN 201610821660 A CN201610821660 A CN 201610821660A CN 106970098 B CN106970098 B CN 106970098B
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stress
error
value
provisional value
equation
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Expired - Fee Related
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CN106970098A (zh
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安川昇一
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Rigaku Corp
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Rigaku Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/607—Specific applications or type of materials strain

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201610821660.5A 2015-09-18 2016-09-13 应力解析装置、方法以及程序 Expired - Fee Related CN106970098B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015-186004 2015-09-18
JP2015186004A JP6478189B2 (ja) 2015-09-18 2015-09-18 応力解析装置、方法およびプログラム

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CN106970098A CN106970098A (zh) 2017-07-21
CN106970098B true CN106970098B (zh) 2020-05-22

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US (1) US10401310B2 (enExample)
JP (1) JP6478189B2 (enExample)
CN (1) CN106970098B (enExample)
DE (1) DE102016217752A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10416102B2 (en) * 2017-06-23 2019-09-17 Bruker Axs, Inc. X-ray diffraction device and method to measure stress with 2D detector and single sample tilt
JP6775777B2 (ja) * 2017-08-29 2020-10-28 株式会社リガク Ｘ線回折測定における測定結果の表示方法
JP7101040B2 (ja) * 2018-05-09 2022-07-14 三菱製鋼株式会社 ばねの製造方法及びばね
US11519798B2 (en) * 2018-12-18 2022-12-06 Metal Industries Research & Development Centre Residual stress detection device and detection method thereof
JPWO2023181935A1 (enExample) * 2022-03-24 2023-09-28

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4489425A (en) * 1983-01-14 1984-12-18 Science Applications, Inc. Means and method for determining residual stress on a polycrystalline sample by X-ray diffraction
US4686631A (en) * 1985-02-08 1987-08-11 Ruud Clayton O Method for determining internal stresses in polycrystalline solids

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
JP3887588B2 (ja) * 2002-08-30 2007-02-28 株式会社リガク Ｘ線回折による応力測定法
JP5842242B2 (ja) * 2013-10-17 2016-01-13 国立大学法人金沢大学 回折環分析方法および回折環分析装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4489425A (en) * 1983-01-14 1984-12-18 Science Applications, Inc. Means and method for determining residual stress on a polycrystalline sample by X-ray diffraction
US4686631A (en) * 1985-02-08 1987-08-11 Ruud Clayton O Method for determining internal stresses in polycrystalline solids

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
基于d_0误差项直接精密解法DRS的X射线应力分析技术;郑轩等;《2018远东无损检测新技术论坛》;20181231;809-819 *

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JP2017058349A (ja) 2017-03-23
DE102016217752A1 (de) 2017-03-23
US20170082561A1 (en) 2017-03-23
JP6478189B2 (ja) 2019-03-06
US10401310B2 (en) 2019-09-03
CN106970098A (zh) 2017-07-21

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