JP6478189B2 - 応力解析装置、方法およびプログラム - Google Patents

応力解析装置、方法およびプログラム Download PDF

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JP6478189B2
JP6478189B2 JP2015186004A JP2015186004A JP6478189B2 JP 6478189 B2 JP6478189 B2 JP 6478189B2 JP 2015186004 A JP2015186004 A JP 2015186004A JP 2015186004 A JP2015186004 A JP 2015186004A JP 6478189 B2 JP6478189 B2 JP 6478189B2
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stress
error
value
equation
provisional
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JP2015186004A
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Japanese (ja)
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JP2017058349A (ja
JP2017058349A5 (enExample
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昇一 安川
昇一 安川
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Rigaku Corp
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Rigaku Corp
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Priority to JP2015186004A priority Critical patent/JP6478189B2/ja
Priority to US15/232,936 priority patent/US10401310B2/en
Priority to CN201610821660.5A priority patent/CN106970098B/zh
Priority to DE102016217752.4A priority patent/DE102016217752A1/de
Publication of JP2017058349A publication Critical patent/JP2017058349A/ja
Publication of JP2017058349A5 publication Critical patent/JP2017058349A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/607—Specific applications or type of materials strain

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2015186004A 2015-09-18 2015-09-18 応力解析装置、方法およびプログラム Expired - Fee Related JP6478189B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015186004A JP6478189B2 (ja) 2015-09-18 2015-09-18 応力解析装置、方法およびプログラム
US15/232,936 US10401310B2 (en) 2015-09-18 2016-08-10 X-ray stress analysis apparatus, method, and program
CN201610821660.5A CN106970098B (zh) 2015-09-18 2016-09-13 应力解析装置、方法以及程序
DE102016217752.4A DE102016217752A1 (de) 2015-09-18 2016-09-16 Spannungsanalysevorrichtung, Verfahren und Programm

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015186004A JP6478189B2 (ja) 2015-09-18 2015-09-18 応力解析装置、方法およびプログラム

Publications (3)

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JP2017058349A JP2017058349A (ja) 2017-03-23
JP2017058349A5 JP2017058349A5 (enExample) 2017-11-30
JP6478189B2 true JP6478189B2 (ja) 2019-03-06

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US (1) US10401310B2 (enExample)
JP (1) JP6478189B2 (enExample)
CN (1) CN106970098B (enExample)
DE (1) DE102016217752A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10416102B2 (en) * 2017-06-23 2019-09-17 Bruker Axs, Inc. X-ray diffraction device and method to measure stress with 2D detector and single sample tilt
JP6775777B2 (ja) * 2017-08-29 2020-10-28 株式会社リガク Ｘ線回折測定における測定結果の表示方法
JP7101040B2 (ja) * 2018-05-09 2022-07-14 三菱製鋼株式会社 ばねの製造方法及びばね
US11519798B2 (en) * 2018-12-18 2022-12-06 Metal Industries Research & Development Centre Residual stress detection device and detection method thereof
WO2023181935A1 (ja) * 2022-03-24 2023-09-28 コニカミノルタ株式会社 予測装置、予測システムおよび予測プログラム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4489425A (en) * 1983-01-14 1984-12-18 Science Applications, Inc. Means and method for determining residual stress on a polycrystalline sample by X-ray diffraction
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US4686631A (en) * 1985-02-08 1987-08-11 Ruud Clayton O Method for determining internal stresses in polycrystalline solids
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
JP3887588B2 (ja) * 2002-08-30 2007-02-28 株式会社リガク Ｘ線回折による応力測定法
JP5842242B2 (ja) * 2013-10-17 2016-01-13 国立大学法人金沢大学 回折環分析方法および回折環分析装置

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Publication number Publication date
JP2017058349A (ja) 2017-03-23
CN106970098A (zh) 2017-07-21
CN106970098B (zh) 2020-05-22
DE102016217752A1 (de) 2017-03-23
US10401310B2 (en) 2019-09-03
US20170082561A1 (en) 2017-03-23

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