DE102008055155A1 - Trennverfahren für ein Schichtsystem umfassend einen Wafer - Google Patents

Trennverfahren für ein Schichtsystem umfassend einen Wafer Download PDF

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Publication number
DE102008055155A1
DE102008055155A1 DE102008055155A DE102008055155A DE102008055155A1 DE 102008055155 A1 DE102008055155 A1 DE 102008055155A1 DE 102008055155 A DE102008055155 A DE 102008055155A DE 102008055155 A DE102008055155 A DE 102008055155A DE 102008055155 A1 DE102008055155 A1 DE 102008055155A1
Authority
DE
Germany
Prior art keywords
carrier
wafer
separation
layer
aid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE102008055155A
Other languages
German (de)
English (en)
Inventor
Franz Dr. Richter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissan Chemical Corp
Original Assignee
Thin Materials AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thin Materials AG filed Critical Thin Materials AG
Priority to DE102008055155A priority Critical patent/DE102008055155A1/de
Priority to EP09151661A priority patent/EP2202788A3/de
Priority to SG2011045168A priority patent/SG172283A1/en
Priority to JP2011542832A priority patent/JP5727382B2/ja
Priority to KR1020117017391A priority patent/KR101754327B1/ko
Priority to EP09795451.5A priority patent/EP2382656B1/de
Priority to PT09795451T priority patent/PT2382656T/pt
Priority to US13/141,470 priority patent/US8951886B2/en
Priority to CN200980157334.7A priority patent/CN102326245B/zh
Priority to PCT/EP2009/067893 priority patent/WO2010072826A2/de
Publication of DE102008055155A1 publication Critical patent/DE102008055155A1/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7402—Wafer tapes, e.g. grinding or dicing support tapes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7412—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support the auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/7416—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/744—Details of chemical or physical process used for separating the auxiliary support from a device or a wafer
    • H10P72/7442—Separation by peeling
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/74—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using temporarily an auxiliary support
    • H10P72/744—Details of chemical or physical process used for separating the auxiliary support from a device or a wafer
    • H10P72/7442—Separation by peeling
    • H10P72/7444—Separation by peeling using a peeling wedge, a knife or a bar

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
DE102008055155A 2008-12-23 2008-12-23 Trennverfahren für ein Schichtsystem umfassend einen Wafer Granted DE102008055155A1 (de)

Priority Applications (10)

Application Number Priority Date Filing Date Title
DE102008055155A DE102008055155A1 (de) 2008-12-23 2008-12-23 Trennverfahren für ein Schichtsystem umfassend einen Wafer
EP09151661A EP2202788A3 (de) 2008-12-23 2009-01-29 Trennverfahren für ein Schichtsystem umfassend einen Wafer
SG2011045168A SG172283A1 (en) 2008-12-23 2009-12-23 Method for separating a layer system comprising a wafer
JP2011542832A JP5727382B2 (ja) 2008-12-23 2009-12-23 ウェーハを含む層システムを分離する方法
KR1020117017391A KR101754327B1 (ko) 2008-12-23 2009-12-23 웨이퍼를 포함하는 층 시스템을 분리하는 방법
EP09795451.5A EP2382656B1 (de) 2008-12-23 2009-12-23 Trennverfahren für ein schichtsystem umfassend einen wafer
PT09795451T PT2382656T (pt) 2008-12-23 2009-12-23 Processo de separação para um sistema de camadas que compreende um wafer
US13/141,470 US8951886B2 (en) 2008-12-23 2009-12-23 Method for separating a layer system comprising a wafer by precisely maintaining the position of the separating front
CN200980157334.7A CN102326245B (zh) 2008-12-23 2009-12-23 用于包括晶片的层系统的分离方法
PCT/EP2009/067893 WO2010072826A2 (de) 2008-12-23 2009-12-23 Trennverfahren für ein schichtsystem umfassend einen wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102008055155A DE102008055155A1 (de) 2008-12-23 2008-12-23 Trennverfahren für ein Schichtsystem umfassend einen Wafer

Publications (1)

Publication Number Publication Date
DE102008055155A1 true DE102008055155A1 (de) 2010-07-01

Family

ID=42097506

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102008055155A Granted DE102008055155A1 (de) 2008-12-23 2008-12-23 Trennverfahren für ein Schichtsystem umfassend einen Wafer

Country Status (9)

Country Link
US (1) US8951886B2 (https=)
EP (2) EP2202788A3 (https=)
JP (1) JP5727382B2 (https=)
KR (1) KR101754327B1 (https=)
CN (1) CN102326245B (https=)
DE (1) DE102008055155A1 (https=)
PT (1) PT2382656T (https=)
SG (1) SG172283A1 (https=)
WO (1) WO2010072826A2 (https=)

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US8834662B2 (en) 2012-03-22 2014-09-16 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus and method of separating wafer from carrier
US9269623B2 (en) 2012-10-25 2016-02-23 Rohm And Haas Electronic Materials Llc Ephemeral bonding
KR102075635B1 (ko) 2013-01-03 2020-03-02 삼성전자주식회사 웨이퍼 지지 구조물, 웨이퍼 지지 구조물을 포함하는 반도체 패키지의 중간 구조물, 및 중간 구조물을 이용한 반도체 패키지의 제조 방법
CN103972133B (zh) * 2013-01-25 2017-08-25 旭硝子株式会社 基板的剥离装置和剥离方法以及电子器件的制造方法
JP6180811B2 (ja) * 2013-06-19 2017-08-16 株式会社荏原製作所 基板処理装置
KR20150011072A (ko) 2013-07-22 2015-01-30 삼성전자주식회사 임시 접착제 조성물 및 이를 이용한 반도체 소자의 제조 방법
US10103048B2 (en) * 2013-08-28 2018-10-16 Brewer Science, Inc. Dual-layer bonding material process for temporary bonding of microelectronic substrates to carrier substrates
US9315696B2 (en) 2013-10-31 2016-04-19 Dow Global Technologies Llc Ephemeral bonding
US9761474B2 (en) 2013-12-19 2017-09-12 Micron Technology, Inc. Methods for processing semiconductor devices
US10903106B2 (en) 2014-06-10 2021-01-26 Nissan Chemical Industries, Ltd. Layered body of temporary adhesive
DE102014219095A1 (de) 2014-09-22 2016-03-24 Nissan Chemical Industries, Ltd. Wafer-Träger-Anordnung
US9644118B2 (en) 2015-03-03 2017-05-09 Dow Global Technologies Llc Method of releasably attaching a semiconductor substrate to a carrier
TW201705244A (zh) * 2015-03-04 2017-02-01 康寧公司 用於控制並啓動基材自載體脫結之方法與設備
CN105607311B (zh) * 2016-01-04 2020-06-02 京东方科技集团股份有限公司 起角装置及其使用方法
US10445253B2 (en) * 2016-04-20 2019-10-15 International Business Machines Corporation Cost effective service level agreement data management
US11183415B2 (en) 2016-06-22 2021-11-23 Nissan Chemical Corporation Adhesive containing polydimethyl siloxane
WO2018216732A1 (ja) 2017-05-24 2018-11-29 日産化学株式会社 エポキシ変性ポリシロキサンを含有する仮接着剤
CN110870049B (zh) 2017-07-06 2023-10-03 日产化学株式会社 包含含有苯基的聚硅氧烷的临时粘接剂
US10249567B2 (en) 2017-08-18 2019-04-02 Industrial Technology Research Institute Redistribution layer structure of semiconductor package
US10622326B2 (en) 2017-08-18 2020-04-14 Industrial Technology Research Institute Chip package structure
US10763135B2 (en) 2018-01-30 2020-09-01 Facebook Technologies, Llc Integrated elastomeric interface layer formation and singulation for light emitting diodes
US12559655B2 (en) 2018-05-01 2026-02-24 Nissan Chemical Corporation Polysiloxane-containing temporary adhesive comprising heat-resistant polymerization inhibitor
US10636829B1 (en) 2018-10-24 2020-04-28 Himax Technologies Limited Wafer-level optical structure
KR102869673B1 (ko) 2018-11-16 2025-10-13 닛산 가가쿠 가부시키가이샤 적외선 박리용 접착제 조성물, 적층체, 적층체의 제조 방법 및 박리 방법
EP3882954A4 (en) 2018-11-16 2022-07-27 Nissan Chemical Corporation LAMINATE PEELING METHOD, LAMINATE AND METHOD OF MAKING A LAMINATE
SG11202105574YA (en) 2018-11-28 2021-06-29 Nissan Chemical Corp Adhesive agent composition, layered product and production method for layered product, and method for reducing thickness of semiconductor forming substrate
JPWO2023182138A1 (https=) 2022-03-24 2023-09-28
CN115302938B (zh) * 2022-08-25 2023-12-08 中国科学院上海硅酸盐研究所 一种分离胶合组件的方法

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DE4407735C2 (de) * 1993-03-10 1996-06-27 Mitsubishi Electric Corp Gerät zum Ablösen eines Wafers von einer Trägerplatte
WO2004051708A2 (de) 2002-11-29 2004-06-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und vorrichtung zum bearbeiten eines wafers sowie wafer mit trennschicht und trägerschicht
WO2007099146A1 (de) 2006-03-01 2007-09-07 Jakob + Richter Ip-Verwertungsgesellschaft Mbh Verfahren zum bearbeiten insbesondere dünnen der rückseite eines wafers, wafer-träger-anordnung hierfür und verfahren zur herstellung einer solchen wafer-träger-anordnung

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DE4407735C2 (de) * 1993-03-10 1996-06-27 Mitsubishi Electric Corp Gerät zum Ablösen eines Wafers von einer Trägerplatte
WO2004051708A2 (de) 2002-11-29 2004-06-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und vorrichtung zum bearbeiten eines wafers sowie wafer mit trennschicht und trägerschicht
WO2007099146A1 (de) 2006-03-01 2007-09-07 Jakob + Richter Ip-Verwertungsgesellschaft Mbh Verfahren zum bearbeiten insbesondere dünnen der rückseite eines wafers, wafer-träger-anordnung hierfür und verfahren zur herstellung einer solchen wafer-träger-anordnung

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Also Published As

Publication number Publication date
US8951886B2 (en) 2015-02-10
EP2202788A2 (de) 2010-06-30
KR20110128174A (ko) 2011-11-28
WO2010072826A3 (de) 2010-10-14
JP2012513684A (ja) 2012-06-14
CN102326245B (zh) 2017-04-19
EP2382656A2 (de) 2011-11-02
EP2202788A3 (de) 2010-08-04
PT2382656T (pt) 2019-01-17
SG172283A1 (en) 2011-07-28
JP5727382B2 (ja) 2015-06-03
WO2010072826A2 (de) 2010-07-01
KR101754327B1 (ko) 2017-07-19
US20120028438A1 (en) 2012-02-02
CN102326245A (zh) 2012-01-18
EP2382656B1 (de) 2018-10-03

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R081 Change of applicant/patentee

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