DE10196047T1 - Zitterschätzvorrichtung und Schätzverfahren - Google Patents

Zitterschätzvorrichtung und Schätzverfahren

Info

Publication number
DE10196047T1
DE10196047T1 DE10196047T DE10196047T DE10196047T1 DE 10196047 T1 DE10196047 T1 DE 10196047T1 DE 10196047 T DE10196047 T DE 10196047T DE 10196047 T DE10196047 T DE 10196047T DE 10196047 T1 DE10196047 T1 DE 10196047T1
Authority
DE
Germany
Prior art keywords
estimation
shiver
estimation method
estimation device
shiver estimation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE10196047T
Other languages
English (en)
Other versions
DE10196047B4 (de
Inventor
Takahiro Yamaguchi
Masahiro Ishida
Mani Soma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE10196047T1 publication Critical patent/DE10196047T1/de
Application granted granted Critical
Publication of DE10196047B4 publication Critical patent/DE10196047B4/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Dc Digital Transmission (AREA)
DE10196047T 2000-03-29 2001-03-29 Zitterschätzvorrichtung Expired - Fee Related DE10196047B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/538,135 US6460001B1 (en) 2000-03-29 2000-03-29 Apparatus for and method of measuring a peak jitter
US09/538,135 2000-03-29
PCT/JP2001/002648 WO2001073455A1 (fr) 2000-03-29 2001-03-29 Dispositif et procede d'estimation de gigue

Publications (2)

Publication Number Publication Date
DE10196047T1 true DE10196047T1 (de) 2003-04-17
DE10196047B4 DE10196047B4 (de) 2011-04-21

Family

ID=24145650

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10196047T Expired - Fee Related DE10196047B4 (de) 2000-03-29 2001-03-29 Zitterschätzvorrichtung

Country Status (4)

Country Link
US (2) US6460001B1 (de)
JP (1) JP4774543B2 (de)
DE (1) DE10196047B4 (de)
WO (1) WO2001073455A1 (de)

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GB2368651B (en) * 2000-10-31 2006-05-31 Consultronics Europ Ltd Method and apparatus for measurement of jitter
US7203229B1 (en) * 2001-06-14 2007-04-10 Advantest Corporation Apparatus for and method of measuring jitter
KR100398879B1 (ko) * 2001-07-09 2003-09-19 삼성전자주식회사 입력신호의 영점교차 특성을 이용한 위상오차 검출장치
US6819192B2 (en) * 2002-02-14 2004-11-16 Sun Microsystems, Inc. Jitter estimation for a phase locked loop
US7054358B2 (en) * 2002-04-29 2006-05-30 Advantest Corporation Measuring apparatus and measuring method
JP2004093345A (ja) * 2002-08-30 2004-03-25 Renesas Technology Corp ジッタ測定回路
US6956422B2 (en) * 2003-03-17 2005-10-18 Indiana University Research And Technology Corporation Generation and measurement of timing delays by digital phase error compensation
US7636642B2 (en) * 2003-06-19 2009-12-22 Teradyne, Inc. Direct jitter analysis of binary sampled data
DE60311576T2 (de) * 2003-08-20 2007-08-16 Verigy (Singapore) Pte. Ltd. Spektrale Jitter-Analyse mit Jitter-Modulation-Wellenform-Analyse
US6988051B2 (en) * 2003-11-14 2006-01-17 The Boeing Company Window average statistics model for pointing stability jitter analysis
EP1686384A4 (de) * 2003-11-20 2014-12-31 Anritsu Corp Jitter-messeinrichtungund jitter-messverfahren
CA2453292A1 (en) * 2004-01-07 2005-07-07 John W. Bogdan Noise filtering edge detectors
US7522690B2 (en) * 2004-09-15 2009-04-21 Silicon Laboratories Inc. Jitter self test
WO2006063361A2 (en) * 2004-12-08 2006-06-15 Guide Technology Periodic jitter (pj) measurement methodology
JP4528659B2 (ja) * 2005-03-30 2010-08-18 パナソニック株式会社 クロックジッタ算出装置、クロックジッタ算出方法、およびクロックジッタ算出プログラム
US20060247906A1 (en) * 2005-04-27 2006-11-02 International Business Machines Corporation Method for estimating clock jitter for static timing measurements of modeled circuits
US7460592B2 (en) * 2005-05-04 2008-12-02 Advantest Corporation Apparatus for measuring jitter and method of measuring jitter
CN101300599A (zh) * 2005-08-29 2008-11-05 特克特朗尼克公司 具有期望概率的视频峰抖动的测量和显示
US7844022B2 (en) * 2005-10-31 2010-11-30 Guide Technology, Inc. Jitter spectrum analysis using random sampling (RS)
JP4351207B2 (ja) * 2005-11-16 2009-10-28 富士通マイクロエレクトロニクス株式会社 タイミング検証方法及びタイミング検証装置
US7912117B2 (en) * 2006-09-28 2011-03-22 Tektronix, Inc. Transport delay and jitter measurements
JP4554509B2 (ja) * 2005-12-27 2010-09-29 ルネサスエレクトロニクス株式会社 タイミング解析装置及びタイミング解析手法
US7856463B2 (en) * 2006-03-21 2010-12-21 Advantest Corporation Probability density function separating apparatus, probability density function separating method, testing apparatus, bit error rate measuring apparatus, electronic device, and program
WO2007113713A2 (en) * 2006-03-31 2007-10-11 Koninklijke Philips Electronics, N.V. Image guided surgery system
US7715512B2 (en) * 2006-09-26 2010-05-11 Advantest Corporation Jitter measurement apparatus, jitter measurement method, and recording medium
US7421354B2 (en) * 2006-10-13 2008-09-02 General Electric Company Systems and methods for reducing an effect of a disturbance
US7864834B1 (en) * 2006-10-27 2011-01-04 Xilinx, Inc. Estimating digital frequency synthesizer jitter
US7797121B2 (en) * 2007-06-07 2010-09-14 Advantest Corporation Test apparatus, and device for calibration
US8255188B2 (en) * 2007-11-07 2012-08-28 Guidetech, Inc. Fast low frequency jitter rejection methodology
US7843771B2 (en) * 2007-12-14 2010-11-30 Guide Technology, Inc. High resolution time interpolator
JP5228481B2 (ja) * 2007-12-28 2013-07-03 富士通株式会社 半導体装置に対する同時動作信号ノイズに基づいてジッタを見積る方法、その見積りに使用する同時動作信号ノイズ量対ジッタ量相関関係を算出する方法、それらを実現するプログラム、及び半導体装置及びそれが搭載されたプリント回路基板の設計方法
CA2657087A1 (en) * 2008-03-06 2009-09-06 David N. Fernandes Normative database system and method
CA2685779A1 (en) * 2008-11-19 2010-05-19 David N. Fernandes Automated sound segment selection method and system
US20100332186A1 (en) * 2009-06-30 2010-12-30 Wilson Kevin W Probabilistic Estimation of a Time Interval Between Periodic Events Disturbing a Signal
TWI410053B (zh) * 2009-10-15 2013-09-21 Chunghwa Picture Tubes Ltd 多段式轉換之數位-類比轉換器
JP5768983B2 (ja) * 2010-06-09 2015-08-26 日本電気株式会社 契約違反予測システム、契約違反予測方法および契約違反予測プログラム
US9760540B2 (en) 2012-11-21 2017-09-12 National Central University Methods for processing sequential data to identify possible peak points and to estimate peak to noise ratio of sequential data
KR101379371B1 (ko) 2013-02-27 2014-03-28 동국대학교 산학협력단 대역폭이 제한된 채널에서 데이터 의존성 지터 추정 방법
CN112485458A (zh) * 2020-12-11 2021-03-12 江苏新能源汽车研究院有限公司 一种新能源车辆动力源转速异常抖动的检测方法
DE102021119079B4 (de) 2021-07-22 2023-06-01 Not Just A Jewel GmbH Am Handgelenk tragbares und als Schmuckstück ausgebildetes Wearable
WO2024053724A1 (ja) * 2022-09-09 2024-03-14 国立大学法人東京大学 信号処理装置、信号処理方法及びプログラム

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US3737766A (en) * 1971-12-06 1973-06-05 Telecommunications Technology Testing technique for phase jitter in communication systems
JPS62284268A (ja) * 1986-06-02 1987-12-10 Advantest Corp 時間間隔分析装置
EP0262860A3 (de) * 1986-10-01 1991-03-20 AT&T Corp. Digitale Signalanalyse mittels Transformation in die Vektorebene
JPH073445B2 (ja) * 1986-11-04 1995-01-18 株式会社アドバンテスト 時間間隔分析装置
US4800571A (en) * 1988-01-11 1989-01-24 Tektronix, Inc. Timing jitter measurement display
DE69027292T2 (de) * 1990-01-16 1997-01-23 Hitachi Ltd Verfahren und System zur digitalen Signalverarbeitung.
JP3478300B2 (ja) * 1994-01-31 2003-12-15 株式会社アドバンテスト ジッタ周波数成分の検出方法
JPH08226946A (ja) * 1995-02-21 1996-09-03 Advantest Corp ジッタ・スペクトラム解析装置
JP2950370B2 (ja) * 1997-03-27 1999-09-20 日本電気株式会社 Ｐｌｌジッタ測定方法及び集積回路
JP3413342B2 (ja) * 1997-04-15 2003-06-03 株式会社アドバンテスト ジッタ測定方法及び半導体試験装置
US6298315B1 (en) * 1998-12-11 2001-10-02 Wavecrest Corporation Method and apparatus for analyzing measurements
TW569543B (en) * 2002-12-09 2004-01-01 Mediatek Inc Voltage controlled delay line with reduced timing errors and jitters
US6765519B2 (en) * 2002-12-23 2004-07-20 Agilent Technologies, Inc. System and method for designing and using analog circuits operating in the modulation domain

Also Published As

Publication number Publication date
DE10196047B4 (de) 2011-04-21
JP4774543B2 (ja) 2011-09-14
WO2001073455A1 (fr) 2001-10-04
US20030125888A1 (en) 2003-07-03
US6460001B1 (en) 2002-10-01
US6990417B2 (en) 2006-01-24

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
R020 Patent grant now final

Effective date: 20110722

R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee

Effective date: 20131001