EP1686384A4 - Jitter-messeinrichtungund jitter-messverfahren - Google Patents
Jitter-messeinrichtungund jitter-messverfahrenInfo
- Publication number
- EP1686384A4 EP1686384A4 EP04793237.1A EP04793237A EP1686384A4 EP 1686384 A4 EP1686384 A4 EP 1686384A4 EP 04793237 A EP04793237 A EP 04793237A EP 1686384 A4 EP1686384 A4 EP 1686384A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- jitter measurement
- measurement device
- measurement method
- jitter
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Dc Digital Transmission (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003390560 | 2003-11-20 | ||
PCT/JP2004/016136 WO2005050230A1 (ja) | 2003-11-20 | 2004-10-29 | ジッタ測定装置及びジッタ測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1686384A1 EP1686384A1 (de) | 2006-08-02 |
EP1686384A4 true EP1686384A4 (de) | 2014-12-31 |
Family
ID=34616344
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP04793237.1A Withdrawn EP1686384A4 (de) | 2003-11-20 | 2004-10-29 | Jitter-messeinrichtungund jitter-messverfahren |
Country Status (4)
Country | Link |
---|---|
US (1) | US7248981B2 (de) |
EP (1) | EP1686384A4 (de) |
JP (1) | JP4523917B2 (de) |
WO (1) | WO2005050230A1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3838654B1 (ja) * | 2005-06-17 | 2006-10-25 | アンリツ株式会社 | タイムインターバル測定装置およびジッタ測定装置 |
US7715512B2 (en) * | 2006-09-26 | 2010-05-11 | Advantest Corporation | Jitter measurement apparatus, jitter measurement method, and recording medium |
JP5003187B2 (ja) * | 2007-02-05 | 2012-08-15 | 横河電機株式会社 | ジッタ測定装置 |
US8923375B2 (en) * | 2012-06-29 | 2014-12-30 | Parade Technologies, Inc. | On die jitter tolerance test |
US11209499B2 (en) * | 2018-04-13 | 2021-12-28 | Nitto Kogyo Corporation | Distribution board |
US11709201B2 (en) * | 2020-09-01 | 2023-07-25 | Skyworks Solutions, Inc. | Instrument noise correction for jitter measurements |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0473282A2 (de) * | 1990-07-30 | 1992-03-04 | Hewlett-Packard Company | Verfahren zur Messung der Modulationsgenauigkeit |
US6621860B1 (en) * | 1999-02-08 | 2003-09-16 | Advantest Corp | Apparatus for and method of measuring a jitter |
US20030202573A1 (en) * | 2002-04-29 | 2003-10-30 | Takahiro Yamaguchi | Measuring apparatus and measuring method |
US20040062301A1 (en) * | 2002-09-30 | 2004-04-01 | Takahiro Yamaguchi | Jitter measurement apparatus and jitter measurement method |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW559668B (en) * | 1999-02-08 | 2003-11-01 | Advantest Corp | Apparatus for and method of measuring a jitter |
JP2001133492A (ja) | 1999-11-04 | 2001-05-18 | Anritsu Corp | ジッタ測定器 |
US6460001B1 (en) * | 2000-03-29 | 2002-10-01 | Advantest Corporation | Apparatus for and method of measuring a peak jitter |
-
2004
- 2004-10-29 WO PCT/JP2004/016136 patent/WO2005050230A1/ja not_active Application Discontinuation
- 2004-10-29 EP EP04793237.1A patent/EP1686384A4/de not_active Withdrawn
- 2004-10-29 JP JP2005515569A patent/JP4523917B2/ja not_active Expired - Fee Related
- 2004-10-29 US US10/538,520 patent/US7248981B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0473282A2 (de) * | 1990-07-30 | 1992-03-04 | Hewlett-Packard Company | Verfahren zur Messung der Modulationsgenauigkeit |
US6621860B1 (en) * | 1999-02-08 | 2003-09-16 | Advantest Corp | Apparatus for and method of measuring a jitter |
US20030202573A1 (en) * | 2002-04-29 | 2003-10-30 | Takahiro Yamaguchi | Measuring apparatus and measuring method |
US20040062301A1 (en) * | 2002-09-30 | 2004-04-01 | Takahiro Yamaguchi | Jitter measurement apparatus and jitter measurement method |
Non-Patent Citations (2)
Title |
---|
OKAWARA H ED - INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS: "Frequency/phase movement analysis by orthogonal demodulation", PROCEEDINGS INTERNATIONAL TEST CONFERENCE 2002. ITC 2002. BALTIMORE, MD, OCT. 7-10, 2002; [INTERNATIONAL TEST CONFERENCE], NEW YORK, NY : IEEE, US, 7 October 2002 (2002-10-07), pages 110 - 119, XP010609732, ISBN: 978-0-7803-7542-0, DOI: 10.1109/TEST.2002.1041751 * |
See also references of WO2005050230A1 * |
Also Published As
Publication number | Publication date |
---|---|
JP4523917B2 (ja) | 2010-08-11 |
US20060064258A1 (en) | 2006-03-23 |
US7248981B2 (en) | 2007-07-24 |
EP1686384A1 (de) | 2006-08-02 |
WO2005050230A1 (ja) | 2005-06-02 |
JPWO2005050230A1 (ja) | 2007-06-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20050622 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE GB |
|
DAX | Request for extension of the european patent (deleted) | ||
RBV | Designated contracting states (corrected) |
Designated state(s): DE GB |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20141201 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: G01R 29/26 20060101AFI20141125BHEP |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION HAS BEEN WITHDRAWN |
|
18W | Application withdrawn |
Effective date: 20160704 |