DE10042947A1 - Strahlungsemittierendes Halbleiterbauelement auf GaN-Basis - Google Patents
Strahlungsemittierendes Halbleiterbauelement auf GaN-BasisInfo
- Publication number
- DE10042947A1 DE10042947A1 DE10042947A DE10042947A DE10042947A1 DE 10042947 A1 DE10042947 A1 DE 10042947A1 DE 10042947 A DE10042947 A DE 10042947A DE 10042947 A DE10042947 A DE 10042947A DE 10042947 A1 DE10042947 A1 DE 10042947A1
- Authority
- DE
- Germany
- Prior art keywords
- layer
- gan
- radiation
- layers
- epitaxial
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 83
- 239000010410 layer Substances 0.000 claims abstract description 170
- 239000000758 substrate Substances 0.000 claims abstract description 87
- 239000000463 material Substances 0.000 claims abstract description 31
- 238000000034 method Methods 0.000 claims abstract description 25
- 239000012790 adhesive layer Substances 0.000 claims abstract description 7
- 229910052594 sapphire Inorganic materials 0.000 claims abstract description 3
- 239000010980 sapphire Substances 0.000 claims abstract description 3
- 230000005855 radiation Effects 0.000 claims description 16
- 229910002704 AlGaN Inorganic materials 0.000 claims description 8
- 238000000407 epitaxy Methods 0.000 claims description 6
- 239000002356 single layer Substances 0.000 claims 1
- 230000029305 taxis Effects 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 27
- 150000004767 nitrides Chemical class 0.000 abstract 1
- 238000011161 development Methods 0.000 description 6
- 238000005530 etching Methods 0.000 description 6
- 239000000203 mixture Substances 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 238000010276 construction Methods 0.000 description 3
- 239000002096 quantum dot Substances 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- 230000006978 adaptation Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 230000006911 nucleation Effects 0.000 description 2
- 238000010899 nucleation Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- HSRJKNPTNIJEKV-UHFFFAOYSA-N Guaifenesin Chemical compound COC1=CC=CC=C1OCC(O)CO HSRJKNPTNIJEKV-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000012876 carrier material Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000012549 training Methods 0.000 description 1
- 238000003631 wet chemical etching Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0066—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound
- H01L33/007—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0075—Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0093—Wafer bonding; Removal of the growth substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Optics & Photonics (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Led Devices (AREA)
Priority Applications (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10042947A DE10042947A1 (de) | 2000-08-31 | 2000-08-31 | Strahlungsemittierendes Halbleiterbauelement auf GaN-Basis |
TW090121292A TW584971B (en) | 2000-08-31 | 2001-08-30 | Light-emitting semiconductor element on GaN basis and its epitaxial production method |
JP2002524235A JP4177097B2 (ja) | 2000-08-31 | 2001-08-31 | Iii−v窒化物半導体ベースの放射線を発する半導体チップを製造する方法および放射線を発する半導体チップ |
EP01967062A EP1314209B1 (de) | 2000-08-31 | 2001-08-31 | Verfahren zum herstellen eines strahlungsemittierenden halbleiterchips auf iii-v-nitridhalbleiter-basis und strahlungsemittierender halbleiterchip |
PCT/DE2001/003348 WO2002019439A1 (de) | 2000-08-31 | 2001-08-31 | Verfahren zum herstellen eines strahlungsemittierenden halbleiterchips auf iii-v-nitridhalbleiter-basis und strahlungsemittierender halbleiterchip |
CN018181406A CN1471735B (zh) | 2000-08-31 | 2001-08-31 | 一种led芯片及其制造方法 |
US10/377,363 US6849878B2 (en) | 2000-08-31 | 2003-02-28 | Method for fabricating a radiation-emitting semiconductor chip based on III-V nitride semiconductor, and radiation-emitting semiconductor chip |
US11/017,615 US7105370B2 (en) | 2000-08-31 | 2004-12-20 | Method for fabricating a radiation-emitting semiconductor chip based on III-V nitride semiconductor |
JP2007072671A JP5183085B2 (ja) | 2000-08-31 | 2007-03-20 | 放射線を発する半導体チップ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10042947A DE10042947A1 (de) | 2000-08-31 | 2000-08-31 | Strahlungsemittierendes Halbleiterbauelement auf GaN-Basis |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10042947A1 true DE10042947A1 (de) | 2002-03-21 |
Family
ID=7654526
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10042947A Withdrawn DE10042947A1 (de) | 2000-08-31 | 2000-08-31 | Strahlungsemittierendes Halbleiterbauelement auf GaN-Basis |
Country Status (7)
Country | Link |
---|---|
US (2) | US6849878B2 (zh) |
EP (1) | EP1314209B1 (zh) |
JP (2) | JP4177097B2 (zh) |
CN (1) | CN1471735B (zh) |
DE (1) | DE10042947A1 (zh) |
TW (1) | TW584971B (zh) |
WO (1) | WO2002019439A1 (zh) |
Cited By (5)
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---|---|---|---|---|
US7049207B2 (en) * | 2002-05-20 | 2006-05-23 | Sony Corporation | Isolating method and transferring method for semiconductor devices |
DE102009060749A1 (de) * | 2009-12-30 | 2011-07-07 | OSRAM Opto Semiconductors GmbH, 93055 | Optoelektronischer Halbleiterchip und Verwendung einer auf AIGaN basierenden Zwischenschicht |
US8288787B2 (en) | 2002-06-26 | 2012-10-16 | Lg Electronics, Inc. | Thin film light emitting diode |
WO2019166194A1 (de) * | 2018-03-02 | 2019-09-06 | Osram Opto Semiconductors Gmbh | Verfahren zur herstellung einer mehrzahl von transferierbaren bauteilen und bauteilverbund aus bauteilen |
WO2019166195A1 (de) * | 2018-03-02 | 2019-09-06 | Osram Opto Semiconductors Gmbh | Bauteilverbund aus optischen bauteilen, verfahren zur herstellung eines bauteilverbunds und bauelement mit einem optischen bauteil |
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CN1252837C (zh) * | 2000-04-26 | 2006-04-19 | 奥斯兰姆奥普托半导体股份有限两合公司 | 在GaN基板上的发光二极管芯片和用GaN基板上的发光二极管芯片制造发光二极管元件的方法 |
EP1277240B1 (de) * | 2000-04-26 | 2015-05-20 | OSRAM Opto Semiconductors GmbH | Verfahren zur Herstellung eines lichtmittierenden Halbleiterbauelements |
DE10051465A1 (de) * | 2000-10-17 | 2002-05-02 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines Halbleiterbauelements auf GaN-Basis |
TWI292227B (en) * | 2000-05-26 | 2008-01-01 | Osram Opto Semiconductors Gmbh | Light-emitting-dioed-chip with a light-emitting-epitaxy-layer-series based on gan |
GB2388957A (en) * | 2002-05-24 | 2003-11-26 | Imp College Innovations Ltd | Quantum dots for extended wavelength operation |
DE10245631B4 (de) * | 2002-09-30 | 2022-01-20 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Halbleiterbauelement |
TWI243488B (en) | 2003-02-26 | 2005-11-11 | Osram Opto Semiconductors Gmbh | Electrical contact-area for optoelectronic semiconductor-chip and its production method |
DE10350707B4 (de) * | 2003-02-26 | 2014-02-13 | Osram Opto Semiconductors Gmbh | Elektrischer Kontakt für optoelektronischen Halbleiterchip und Verfahren zu dessen Herstellung |
EP1620903B1 (en) * | 2003-04-30 | 2017-08-16 | Cree, Inc. | High-power solid state light emitter package |
US7589003B2 (en) * | 2003-06-13 | 2009-09-15 | Arizona Board Of Regents, Acting For And On Behalf Of Arizona State University, A Corporate Body Organized Under Arizona Law | GeSn alloys and ordered phases with direct tunable bandgaps grown directly on silicon |
US7238596B2 (en) * | 2003-06-13 | 2007-07-03 | Arizona Board of Regenta, a body corporate of the State of Arizona acting for and on behalf of Arizona State University | Method for preparing Ge1-x-ySnxEy (E=P, As, Sb) semiconductors and related Si-Ge-Sn-E and Si-Ge-E analogs |
JP4218597B2 (ja) | 2003-08-08 | 2009-02-04 | 住友電気工業株式会社 | 半導体発光素子の製造方法 |
JP4110222B2 (ja) | 2003-08-20 | 2008-07-02 | 住友電気工業株式会社 | 発光ダイオード |
EP1569263B1 (de) * | 2004-02-27 | 2011-11-23 | OSRAM Opto Semiconductors GmbH | Verfahren zum Verbinden zweier Wafer |
US7332365B2 (en) * | 2004-05-18 | 2008-02-19 | Cree, Inc. | Method for fabricating group-III nitride devices and devices fabricated using method |
US7791061B2 (en) * | 2004-05-18 | 2010-09-07 | Cree, Inc. | External extraction light emitting diode based upon crystallographic faceted surfaces |
US7534633B2 (en) * | 2004-07-02 | 2009-05-19 | Cree, Inc. | LED with substrate modifications for enhanced light extraction and method of making same |
US8513686B2 (en) * | 2004-09-22 | 2013-08-20 | Cree, Inc. | High output small area group III nitride LEDs |
US8174037B2 (en) | 2004-09-22 | 2012-05-08 | Cree, Inc. | High efficiency group III nitride LED with lenticular surface |
US7737459B2 (en) * | 2004-09-22 | 2010-06-15 | Cree, Inc. | High output group III nitride light emitting diodes |
US7259402B2 (en) * | 2004-09-22 | 2007-08-21 | Cree, Inc. | High efficiency group III nitride-silicon carbide light emitting diode |
US8288942B2 (en) | 2004-12-28 | 2012-10-16 | Cree, Inc. | High efficacy white LED |
US7932111B2 (en) * | 2005-02-23 | 2011-04-26 | Cree, Inc. | Substrate removal process for high light extraction LEDs |
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US8674375B2 (en) * | 2005-07-21 | 2014-03-18 | Cree, Inc. | Roughened high refractive index layer/LED for high light extraction |
CN1988109B (zh) * | 2005-12-21 | 2012-03-21 | 弗赖贝格化合物原料有限公司 | 生产自支撑iii-n层和自支撑iii-n基底的方法 |
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DE102006060410A1 (de) * | 2006-06-30 | 2008-01-03 | Osram Opto Semiconductors Gmbh | Kantenemittierender Halbleiterlaserchip |
US7885306B2 (en) * | 2006-06-30 | 2011-02-08 | Osram Opto Semiconductors Gmbh | Edge-emitting semiconductor laser chip |
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- 2001-08-31 JP JP2002524235A patent/JP4177097B2/ja not_active Expired - Lifetime
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Cited By (14)
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US7049207B2 (en) * | 2002-05-20 | 2006-05-23 | Sony Corporation | Isolating method and transferring method for semiconductor devices |
US9281454B2 (en) | 2002-06-26 | 2016-03-08 | Lg Innotek Co., Ltd. | Thin film light emitting diode |
US8288787B2 (en) | 2002-06-26 | 2012-10-16 | Lg Electronics, Inc. | Thin film light emitting diode |
US8384091B2 (en) | 2002-06-26 | 2013-02-26 | Lg Electronics Inc. | Thin film light emitting diode |
US8445921B2 (en) | 2002-06-26 | 2013-05-21 | Lg Electronics, Inc. | Thin film light emitting diode |
US9716213B2 (en) | 2002-06-26 | 2017-07-25 | Lg Innotek Co., Ltd. | Thin film light emitting diode |
US10326059B2 (en) | 2002-06-26 | 2019-06-18 | Lg Innotek Co., Ltd. | Thin film light emitting diode |
US10825962B2 (en) | 2002-06-26 | 2020-11-03 | Lg Innotek Co., Ltd. | Thin film light emitting diode |
US8592840B2 (en) | 2009-12-30 | 2013-11-26 | Osram Opto Semiconductors Gmbh | Optoelectronic semiconductor chip and use of an intermediate layer based on AlGaN |
DE102009060749A1 (de) * | 2009-12-30 | 2011-07-07 | OSRAM Opto Semiconductors GmbH, 93055 | Optoelektronischer Halbleiterchip und Verwendung einer auf AIGaN basierenden Zwischenschicht |
DE102009060749B4 (de) | 2009-12-30 | 2021-12-30 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronischer Halbleiterchip |
WO2019166194A1 (de) * | 2018-03-02 | 2019-09-06 | Osram Opto Semiconductors Gmbh | Verfahren zur herstellung einer mehrzahl von transferierbaren bauteilen und bauteilverbund aus bauteilen |
WO2019166195A1 (de) * | 2018-03-02 | 2019-09-06 | Osram Opto Semiconductors Gmbh | Bauteilverbund aus optischen bauteilen, verfahren zur herstellung eines bauteilverbunds und bauelement mit einem optischen bauteil |
US11509113B2 (en) | 2018-03-02 | 2022-11-22 | Osram Oled Gmbh | Method for producing a plurality of transferable components and composite component of components |
Also Published As
Publication number | Publication date |
---|---|
US20050104083A1 (en) | 2005-05-19 |
WO2002019439A1 (de) | 2002-03-07 |
EP1314209B1 (de) | 2012-10-03 |
JP4177097B2 (ja) | 2008-11-05 |
JP5183085B2 (ja) | 2013-04-17 |
EP1314209A1 (de) | 2003-05-28 |
CN1471735B (zh) | 2010-05-26 |
US7105370B2 (en) | 2006-09-12 |
US6849878B2 (en) | 2005-02-01 |
TW584971B (en) | 2004-04-21 |
JP2004508720A (ja) | 2004-03-18 |
US20030197170A1 (en) | 2003-10-23 |
CN1471735A (zh) | 2004-01-28 |
JP2007201493A (ja) | 2007-08-09 |
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