CN217182180U - 一种改善铜夹回流偏移的封装结构 - Google Patents

一种改善铜夹回流偏移的封装结构 Download PDF

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CN217182180U
CN217182180U CN202220752381.9U CN202220752381U CN217182180U CN 217182180 U CN217182180 U CN 217182180U CN 202220752381 U CN202220752381 U CN 202220752381U CN 217182180 U CN217182180 U CN 217182180U
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copper
base plate
clip
substrate
clamp
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张怡
陈勇
程浪
蔡择贤
黄乙为
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Guangdong Chippacking Technology Co ltd
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Guangdong Chippacking Technology Co ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/34Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
    • H01L2224/39Structure, shape, material or disposition of the strap connectors after the connecting process
    • H01L2224/40Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
    • H01L2224/401Disposition
    • H01L2224/40151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/40221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/40245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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Abstract

本实用新型涉及一种改善铜夹回流偏移的封装结构,包括基板、铜夹、芯片和塑封料,所述铜夹与基板的焊接端设有向下弯折的弯折部,所述弯折部的底面焊接在基板上,所述弯折部的底面还设有卡块,所述基板对应位置设有卡槽,所述卡块插入所述卡槽内。所述封装结构首先改变了铜夹的形状,使铜夹与基板的焊接端向下弯折形成弯折部,再把弯折部的底面焊接在基板上,这样就可以在弯折部的底面轻松制作出卡块,然后再在基板对应位置制作出卡槽,把卡块插入卡槽内,就实现了铜夹与基板的定位。由于在回流焊接之前,铜夹就被很好地定位在基板上,在回流焊过程中即使锡膏流动,铜夹也不会偏移或旋转,从而很好地保证了铜夹的焊接精度。

Description

一种改善铜夹回流偏移的封装结构
技术领域
本实用新型涉及集成电路封装技术领域,尤其涉及一种改善铜夹回流偏移的封装结构。
背景技术
申请号为201910757555.3、名称为“一种带有铜质台阶和开孔设计的铜夹键合封装结构”的发明专利申请,公开了一种铜夹键合封装结构,铜夹贴装后与塑封树脂之间的结合,可减少铜夹和芯片间热机械应力,还利于芯片和铜夹散热,有效提高整体产品可靠性。但由于铜夹是通过焊锡来固定在引线框架和芯片上,锡膏在回流焊过程中会熔化流动,有机会带动铜夹偏移和旋转,焊接精度远低于引线键合的点对点对准方式,尤其是在可焊接区域较小时,极易出现虚焊,甚至未焊接,使得产品功能失效。
实用新型内容
本实用新型的目的在于提供一种改善铜夹回流偏移的封装结构,提高铜夹焊接精度。
本实用新型是这样实现的:一种改善铜夹回流偏移的封装结构,包括基板、铜夹、芯片和塑封料,所述芯片固定在基板上,所述铜夹一端焊接在基板上,另一端焊接在芯片上,所述塑封料用于包裹基板、铜夹和芯片,所述铜夹与基板的焊接端设有向下弯折的弯折部,所述弯折部的底面焊接在基板上,所述弯折部的底面还设有卡块,所述基板对应位置设有卡槽,所述卡块插入所述卡槽内,以实现铜夹与基板的定位。
其中,所述弯折部底面的两端均设有卡块,所述基板对应位置设有二个卡槽。
其中,所述弯折部的侧面底部还设有半开放式的通孔,用于塑封料的流入,所述通孔避开铜夹与基板的焊接区。
其中,所述弯折部的侧面还设有通孔,用于塑封料的流入。
其中,所述铜夹上表面上设有通孔,用于塑封料的流入。
本实用新型的有益效果为:所述封装结构首先改变了铜夹的形状,使铜夹与基板的焊接端向下弯折形成弯折部,再把弯折部的底面焊接在基板上,这样就可以在弯折部的底面轻松制作出卡块,然后再在基板对应位置制作出卡槽,把卡块插入卡槽内,就实现了铜夹与基板的定位。由于在回流焊接之前,铜夹就被很好地定位在基板上,在回流焊过程中即使锡膏流动,铜夹也不会偏移或旋转,从而很好地保证了铜夹的焊接精度,焊接精度能与引线键合的加工精度相当;铜夹位置固定,不易出现虚焊、未焊、剪切力不足现象,焊接质量得到提高,在产品可焊接区域较小时,尤其能体现出优势。
附图说明
图1是本实用新型所述改善铜夹回流偏移的封装结构实施例一的半剖示意图;
图2是本实用新型所述改善铜夹回流偏移的封装结构实施例一的立体图;
图3是本实用新型所述改善铜夹回流偏移的封装结构实施例一的立体分解图;
图4是本实用新型所述改善铜夹回流偏移的封装结构实施例二的半剖示意图;
图5是本实用新型所述改善铜夹回流偏移的封装结构实施例三的半剖示意图;
图6是本实用新型所述改善铜夹回流偏移的封装结构实施例四的半剖示意图。
其中,1、基板;11、卡槽;2、铜夹;21、弯折部;22、卡块;23、通孔;24、通孔;25、通孔;3、芯片;4、塑封料;5、锡膏。
具体实施方式
为了使本实用新型的目的、技术方案及优点更加清楚明白,以下结合附图及实施例,对本实用新型进行进一步详细说明。应当理解,此处所描述的具体实施例仅仅用以解释本实用新型,并不用于限定本实用新型。
作为本实用新型所述改善铜夹回流偏移的封装结构的实施例一,如图1至图3所示,包括基板1、铜夹2、芯片3和塑封料4,所述芯片3固定在基板1上,所述铜夹2一端焊接在基板1上,另一端焊接在芯片3上,所述塑封料4用于包裹基板1、铜夹2和芯片3,所述铜夹2与基板1的焊接端设有向下弯折的弯折部21,所述弯折部21的底面焊接在基板1上,所述弯折部21的底面还设有卡块22,所述基板1对应位置设有卡槽11,所述卡块22插入所述卡槽11内,以实现铜夹2与基板1的定位。
所述封装结构首先改变了铜夹2的形状,使铜夹2与基板1的焊接端向下弯折形成弯折部21,再把弯折部21的底面焊接在基板1上,这样就可以在弯折部21的底面轻松制作出卡块22,然后再在基板1对应位置制作出卡槽11,把卡块22插入卡槽11内,就实现了铜夹2与基板1的定位。由于在回流焊接之前,铜夹2就被很好地定位在基板1上,在回流焊过程中即使锡膏5流动,铜夹2也不会偏移或旋转,从而很好地保证了铜夹2的焊接精度,焊接精度能与引线键合的加工精度相当;铜夹2位置固定,不易出现虚焊、未焊、剪切力不足现象,焊接质量得到提高,在产品可焊接区域较小时,尤其能体现出优势。
另外,在产品可焊接区域较小时,原本有一些产品因铜夹的定位位置精度问题导致无法使用铜夹封装,本申请的技术方案解决了铜夹的定位问题,使铜夹封装也可以适用于焊接区域小的产品,增加了铜夹封装的适用范围,能直接提高此类产品的散热性能和产品质量。
在本实施例中,所述弯折部21底面的两端均设有卡块22,所述基板1对应位置设有二个卡槽11。二个固定点可以更好地防止铜夹2旋转。
作为本实用新型所述改善铜夹回流偏移的封装结构的实施例二,如图4所示,与实施例一不同之处在于所述弯折部21的侧面底部还设有半开放式的通孔23,用于塑封料的流入,所述通孔23避开铜夹2与基板1的焊接区。在塑封时,塑封料流动进入通孔23,塑封料硬化后,与通孔23形成互相咬合的结构,提高封装产品的抗分层能力。
作为本实用新型所述改善铜夹回流偏移的封装结构的实施例三,如图5所示,与实施例二不同之处在于所述弯折部21的侧面还设有通孔24,用于塑封料的流入。属于实施例二中通孔23的变形,作用与效果均完全相同。
作为本实用新型所述改善铜夹回流偏移的封装结构的实施例四,如图6所示,与实施例二不同之处在于所述铜夹上表面上设有通孔25,用于塑封料的流入。在塑封时,塑封料流动进入通孔25,塑封料硬化后,与通孔25形成互相咬合的结构,提高封装产品的抗分层能力。
以上所述仅为本实用新型的较佳实施例而已,并不用以限制本实用新型,凡在本实用新型的精神和原则之内所作的任何修改、等同替换和改进等,均应包含在本实用新型的保护范围之内。

Claims (5)

1.一种改善铜夹回流偏移的封装结构,包括基板、铜夹、芯片和塑封料,所述芯片固定在基板上,所述铜夹一端焊接在基板上,另一端焊接在芯片上,所述塑封料用于包裹基板、铜夹和芯片,其特征在于,所述铜夹与基板的焊接端设有向下弯折的弯折部,所述弯折部的底面焊接在基板上,所述弯折部的底面还设有卡块,所述基板对应位置设有卡槽,所述卡块插入所述卡槽内,以实现铜夹与基板的定位。
2.根据权利要求1所述改善铜夹回流偏移的封装结构,其特征在于,所述弯折部底面的两端均设有卡块,所述基板对应位置设有二个卡槽。
3.根据权利要求1所述改善铜夹回流偏移的封装结构,其特征在于,所述弯折部的侧面底部还设有半开放式的通孔,用于塑封料的流入,所述通孔避开铜夹与基板的焊接区。
4.根据权利要求1所述改善铜夹回流偏移的封装结构,其特征在于,所述弯折部的侧面还设有通孔,用于塑封料的流入。
5.根据权利要求1所述改善铜夹回流偏移的封装结构,其特征在于,所述铜夹上表面上设有通孔,用于塑封料的流入。
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116072647A (zh) * 2023-03-28 2023-05-05 深圳市深鸿盛电子有限公司 一种mos芯片封装结构及其封装方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116072647A (zh) * 2023-03-28 2023-05-05 深圳市深鸿盛电子有限公司 一种mos芯片封装结构及其封装方法

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