CN207303433U - 接触装置、测定用插座及前端部适配器 - Google Patents

接触装置、测定用插座及前端部适配器 Download PDF

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Publication number
CN207303433U
CN207303433U CN201721182189.6U CN201721182189U CN207303433U CN 207303433 U CN207303433 U CN 207303433U CN 201721182189 U CN201721182189 U CN 201721182189U CN 207303433 U CN207303433 U CN 207303433U
Authority
CN
China
Prior art keywords
electrode terminal
contact device
elastic piece
recess
lid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201721182189.6U
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English (en)
Chinese (zh)
Inventor
扇浦彻哉
関瑜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kk Sdk
SDK Co Ltd
Original Assignee
Kk Sdk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kk Sdk filed Critical Kk Sdk
Application granted granted Critical
Publication of CN207303433U publication Critical patent/CN207303433U/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
CN201721182189.6U 2016-09-15 2017-09-14 接触装置、测定用插座及前端部适配器 Active CN207303433U (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2016-180567 2016-09-15
JP2016180567 2016-09-15
JP2017158118A JP6352510B2 (ja) 2016-09-15 2017-08-18 コンタクト装置および測定用ソケット
JP2017-158118 2017-08-18

Publications (1)

Publication Number Publication Date
CN207303433U true CN207303433U (zh) 2018-05-01

Family

ID=61766419

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201721182189.6U Active CN207303433U (zh) 2016-09-15 2017-09-14 接触装置、测定用插座及前端部适配器

Country Status (3)

Country Link
JP (1) JP6352510B2 (ja)
KR (1) KR101939655B1 (ja)
CN (1) CN207303433U (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102148438B1 (ko) * 2019-01-21 2020-08-27 주식회사 메카텍시스템즈 테스트 소켓
KR102377330B1 (ko) * 2020-07-22 2022-03-22 신동익 인쇄회로기판 검사기용 핀블록 장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06100635B2 (ja) * 1989-03-08 1994-12-12 理化電子株式会社 配線板の検査装置のテストヘッド
JP3352730B2 (ja) * 1992-09-18 2002-12-03 株式会社京都カリタス 中性糖含有光反応性組成物および光硬化成形物
JPH09152448A (ja) * 1995-12-01 1997-06-10 Yokowo Co Ltd 同軸コネクタを備えた同軸コンタクトプローブ
JP5985447B2 (ja) * 2013-08-21 2016-09-06 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP6269337B2 (ja) 2014-06-16 2018-01-31 オムロン株式会社 プローブピン、および、これを用いた電子デバイス
JP6337633B2 (ja) 2014-06-16 2018-06-06 オムロン株式会社 プローブピン
KR101492242B1 (ko) * 2014-07-17 2015-02-13 주식회사 아이에스시 검사용 접촉장치 및 전기적 검사소켓
KR101646544B1 (ko) * 2016-02-22 2016-08-08 주식회사 에스알테크 부품이 간소화된 테스트 소켓

Also Published As

Publication number Publication date
JP6352510B2 (ja) 2018-07-04
KR101939655B1 (ko) 2019-01-18
KR20180030439A (ko) 2018-03-23
JP2018049816A (ja) 2018-03-29

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